Focused Ion Beams in Berlin 2017
FIBiB2017 is dedicated to focused ion beam based technologies for applications in sample preparation, sample investigation and nanopatterning. The workshop will gather scientists and technicians for mutual exchange of knowledge and will provide a platform for those interested in FIB technologies without previous expertise.
- Fundamentals of ion-matter interaction
- Nanopatterning – approaching the sub-10 nm scale
- Novel approaches in sample preparation and investigation (TEM lamellas, tomography, 3D EBSD, and others)
- Imaging with ions
Abstract Deadline -> 30th June
Abstract Notification -> 15th July
Registration Deadline -> 31st August
The number of oral contributions and posters is restricted each to 15 for an available number of around 45 places for all participants. Please register in time.