Analytical Methods
A variety of measurement methods are available for structural, optical, and electrical characterizations. These methods serve device analysis as well as basic materials research.
Structural (morphological) characterization methods
Atomic/chemical structure characterization methods
- Fourier transform infrared spectroscopy (FTIR)
- Raman spectroscopy
- Effusions mass spectroscopy
- Energy dispersive X-ray analysis (EDX)
- Auger electron spectroscopy (AES)
Optical characterization methods
- Optical spectroscopy (UV, VIS, NIR)
- Ellipsometry
- Constant photocurrent method (CPM)
- Photothermal deflection spectroscopy (PDS)
Electrical characterization methods
- Conductivity / Hall effect
- Photoconductivity
- Photo injection
- Surface photovoltage method (SPV)
- Current-voltage curves, solar simulator
- External/ internal quantum efficiency measurement
- Capacitance-voltage spectroscopy
- Photoluminescence
- Near Ultraviolet photoelectron Spectroscopy
Defect analysis methods
