Ausgewählte Publikationen
- M. Lublow, H.J. Lewerenz
Scaling Effects upon Fractal Etch Pattern Formation on Silicon Photoelectrodes Electrochimica Acta, to be published (2009).
(Link)
- M. Lublow, H.J. Lewerenz
Phase-relations between photocurrent and in situ reflectance during photoelectrochemical dissolution of silicon
ECS Trans. 19 (2009) 381.
- T. Stempel, A. Munoz, K. Skorupska, M. Lublow, M. Kanis, H. J. Lewerenz
Surface Chemistry and Nanotopography of Step-Bunched Silicon Surfaces: in-system SRPES and SPM Investigations
ECS Trans. 19 (2009) 403.
(Link)
- M. Lublow, H. J. Lewerenz
Silicon Nanostructures for Photocatalytic and Photovoltaic Application by Chronoamperometric Conditioning
ECS Trans. 16 (2009) 17.
(Link)
- M. Lublow , T. Stempel, K. Skorupska, A. G. Muñoz, M. Kanis, H.J. Lewerenz
Morphological and Chemical Optimization of ex-situ NH4F (40%) Conditioned Si(111)-(1x1):H
Appl. Phys. Lett. 93 (2008) 062112.
(Link)
- M. Lublow and H. J. Lewerenz
Real-time monitoring of SiO2/Si(111) interlayer etching by Brewster-angle reflectometry
Surf. Sci. 602 (2008) 1677.
(Link)
- M. Lublow and H. J. Lewerenz
Nanotopography Development on Silicon Electrodes by Analysis of Brewster Angle Real-Time Spectroscopy
ECS Trans. 6 (2008) 10.
(Link)
- M. Lublow and H. J. Lewerenz
Fractal Photocorrosion of Silicon Electrodes in Concentrated Ammonium Fluoride
Electrochem. And Solid-State Lett. 10 (2007) C51.
(Link)
- M. Lublow and H. J. Lewerenz
Combined AFM and Brewster-Angle Analysis of gradually etched ultrathin SiO2 - Comparison with SRPES results
Surf. Sci. 601 (2007) 1693.
(Link)
- M. Lublow and H. J. Lewerenz
Brewster-Angle Analysis of Native and Photoelectrochemically Grown Silicon Oxide Nanotopographies
Surf. Sci. 601 (2007) 4227.
(Link)
