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Thin films and gas separation membranes

Microstructure and residual stress analysis: Methods and concepts for material development

In-situ stress analysis on solar cell film structures @ EDDI

In-situ analysis of thin film growth and structure evolution

The department “Microstructure and residual stress analysis” contributes with various activities to the POF program topic “Methods and Concepts for Material Development”. Current and future key activities focus on the in-situ characterization of chalcopyrite thin films for solar cells within the framework of the EMIL-project (Energy Materials In-Situ Laboratory). Taking advantage of the features provided by energy-dispersive diffraction, chemical reaction pathways, growth mechanisms and the evolution of stress, texture and microstructure are monitored in real-time during film deposition. For further information see the links below.

- Real-time Growth Analysis of Thin Film Semiconductors

- Experimental setup for in situ EDXRD/XRF at BESSY II


Gas separation membranes for energy efficient processes

In the department "Microstructure and residual stress analysis" the average and local crystal structures of proton conducting and oxygen conducting membranes are analyzed using diffraction of neutrons and x-rays as well as x-ray absorption spectroscopy. These activities are part of the POF program topic "Methods and Concepts for Material Development" which focuses on the development of membranes for energy efficient processes like gas separation membranes in advanced fossil power plants. The energy efficiency loss through membrane technologies is much lower compared to the conventional separation routes like cryogenic air separation and physical or chemical washing processes. Further information may be obtained on the link below.

Helmholtz portfolio project MEM-BRAIN