Spin resolved Photoemission Microscope

Magnetic nanostructures are at the heart of modern data storage technology. Typical dimensions of magnetic bits are in the sub-100nm region. In addition novel magnetoelectronics devices such as magnetic random access memory junctions are operated on the sub-100nm m scale. An understanding magnetic properties of such low-dimensional structures is only accessible to spectro-microscopy tools capable of appropriate lateral resolution. This goal is achieved by combining a novel spin-resolved photoemission microscope (SPEEM) with a dedicated microfocus PGM beamline with full x-ray polarization control (UE49-PGMa).

The synergy between the microscopy capabilities of the PEEM and the polarization control of synchrotron radiation makes of X-PEEM the ideal tool for space resolved and element selective investigation of nanostructures by means of chemical maps (XAS) and  magnetic imaging (XMCD and XLD).

For a detailed description of the experimental station as well as for an overview of the experimental possibilities of our microscope, please visit the following link XPEEM

List of publications
Station data
Temperature range 65 - 2000 K
Pressure Range
Sample holder compatibility


Sample size 2mmX2mm to 20mmX20mm
Magnetic field up to 75 mm depending on sample holder Oe
Beam focus size on sample 20(V)X30(H) micrometer
Sample storage in vacuum up to 6
in-situ evaporation Fe, Co, Ni, Al...
in-situ sputtering Ar and O
Energy resolution 10.000 at 700eV
Energy range 80 to 1800 eV
Phone +49 30 8062 14750


XMLD, Time-resolved studies, NEXAFS, XMCD, Photoelectron EM, X-ray Microscopy, Spin-resovled PES, XPS