LEEM-PEEM

LEEM-PEEM

please contact Stefan Cramm "s.cramm (at) fz-juelich.de" 

Combined Low-Energy- / Photoemission-Electron-Microscope with aberration correction.

Electron-optical layout of the SPECS P90 AC LEEMPEEM

Electron-optical layout of the SPECS P90 AC LEEMPEEM

Station data
Monochromator Spherical grating
Experiment in vacuum yes
Temperature range 300-1600 K
Detector two-stage MCP (Hamamatsu)
Manipulators 5-Axis Piezo-contolled
Spatial resolution LEEM-mode 2 nm
Spatial resolution PEEM-mode 20 nm
base pressure 4E-10 mbar
Preparation chamber * Sputtering up to 1.5kV * Sample temp. range 300 - 1200 K * pyrometric temp. measurement * LEED * Auger * gas inlets: Ar, O2, user specific * base pressure 1E-10 mbar

Methods


This microscope is equipped with a new state-of-the-art aberration corrector minimizing electron-optical imperfections, allowing for higher instrument transmission and simultaneously better spatial resolution. In LEEM-Mode, 2 nm have been demonstrated recently. In combination with soft x-rays (XPEEM), spatially-resolved spectroscopic investigations can be carried  out (NEXAFS, XPS) as well as magnetic spectroscopies (XMCD,XMLD). A recently installed extension allows to perform stroboscopic XPEEM experiments for magnetization dynamics.