Hackl, J.; Duchon, T.; Gottlob, D.M.; Cramm, S.; Veltruska, K.; Matolin, V.; Nemsak, S.; Schneider, C.M.: On the growth mechanisms of polar (100) surfaces of ceria on copper (100). , Surface Science 617 (2018), p. 1-5

Al Temimy, Ameer; Anasori, Babak; Mazzio, Katherine; Kronast, Florian; Choudhury, Sneha; Mawass, Mohamad; Raoux, Simone; Seredych, Mykola; Gogotsi, Yury: Oxidation of Ti3C2 MXene probed by soft X-ray absorption spectroscopy. , Graphene 2018 Dresden, 26.06.2018 - 29.06.2018 (2018)


Duchon, T.; Hackl, J.; Höcker, J.; Veltruska, K.; Matolin, V.; Falta, J.; Cramm, S.; Nemsak, S.; Schneider, C.M.; Flege, J.I.; Senanayake, S.D.: Exploiting micro-scale structural and chemical observations in real time for understanding chemical conversion: LEEM/PEEM studies over CeOx-Cu(111). , Ultramicroscopy 183 (2017), p. 84-88

Nemsak, S.; Strelcov, E.; Duchon, T.; Guo, H.; Hackl, J.; Yulaev, A.; Vlassiouk, I.; Mueller, D.N.; Schneider, C.M.; Kolmakov, A.: Interfacial Electrochemistry in Liquids Probed with Photoemission Electron Microscopy. , Journal of the American Chemical Society 139 (2017), p. 18138-18141

Baeumer, C.; Valenta, R.; Schmitz, C.; Locatelli, A.; Mentes, T.O.; Rogers, S.P.; Sala, A.; Raab, N.; Nemsak, S.; Shim, M.; Schneider, C.M.; Menzel, S.; Waser, R.; Dittmann, R.: Subfilamentary Networks Cause Cycle-to-Cycle Variability in Memristive Devices. , ACS Nano 11 (2017), p. 6921-6929


Schaab, J.; Krug, I.P.; Doganay, H.; Hackl, J.; Gottlob, D.M.; Khan, M.I.; Nemsak, S.; Maurel, L.; Langenberg, E.; Algarabel, P.A.; Pardo, J.A.; Schneider, C.M.; Meier, D.: Contact-Free Mapping of Electronic Transport Phenomena of Polar Domains in SrMnO3 Films. , Physical Review Applied 5 (2016), p. 054009/1-7

Baeumer, C.; Schmitz, C.; Marchewka, A.; Mueller, D.N.; Valenta, R.; Hackl, J.; Raab, N.; Rogers, S.P.; Khan, M.I.; Nemsak, S.; Shim, M.; Menzel, S.; Schneider, C.M.; Waser, R.; Dittmann, R.: Quantifying redox-induced Schottky barrier variations in memristive devices via in operando spectromicroscopy with graphene electrodes. , Nature Communications 7 (2016), p. 12398/1-7


Gottlob, D.M.; Doganay, H.; Nickel, F.; Cramm, S.; Krug, I.P.; Nemsak, S.; Schneider, C.M.: Microscopic analysis of the composition driven spin-reorientation transition in NixPd1-x/Cu(001). , Ultramicroscopy 159 (2015), p. 503-507

Ueltzhöffer, T.; Schmidt, C.; Krug, I.; Nickel, F.; Gottlob, D.; Ehresmann, A.: Néel walls between tailored parallel-stripe domains in IrMn/CoFe exchange bias layers. , Journal of Applied Physics 117 (2015), p. 123904

Becher, C.; Maurel, L.; Aschauer, U.; Lilienblum, M.; Magén, C.; Meier, D.; Langenberg, E.; Trassin, M.; Blasco, J.; Krug, I.P.; Algabarel, P.A.; Spaldin, N.A.; Pardo, J.A.; Fiebig, M.: Strain-induced electrical coupling of electrical polarization and structural defects in SrMnO3 films. , Nature Nanotechnology 10 (2015), p. 661-665

Doganay, H.; Krug, I.P.; Schubert, J.; Cramm, S.; Gottlob, D.M.; Nickel, F.; Schneider, C.M.: Tuning the orbital ordering in La0.7Sr0.3MnO3 thin films in all-oxide hybrids. , EPL 109 (2015), p. 67007/1-6


Schaab, J.; Krug, I.P.; Nickel, F.; Gottlob, D.M.; Doganay, H.; Cano, A.; Hentschel, M.; Yan, Z.; Bourret, E.; Schneider, C.M.; Ramesh, R.; Meier, D.: Imaging and characterization of conducting ferroelectric domain walls by photoemission electron microscopy. , Applied Physics Letters 104 (2014), p. 232904/1-4

Miyamachi, T.; Kawagoe, T.; Imada, S.; Tsunekawa, M.; Fujiwara, H.; Geshi, M.; Sekiyama, A.; Fukumoto, K.; Chang, F.H.; Lin, H.J.; Kronast, F.; Duerr, H.; Chen, C.T.; Suga, S.: Spin reorientation and large magnetic anisotropy of metastable bcc Co islands on Au(001). , Physical Review B 90 (2014), p. 174410/1-7


Nickel, F.; Gottlob, D.M.; Krug, I.P.; Doganay, H.; Cramm, S.; Kaiser, A.M.; Lin, G.; Makarov, D.; Schmidt, O.G.; Schneider, C.M.: Time-resolved magnetic imaging in an aberration-corrected, energy-filtered photoemission electron microscope. , Ultramicroscopy 130 (2013), p. 54-62