Dr. Sascha Sadewasser
Institut Heterogene Materialsysteme
(030) 8062 - 43199
sadewasser@helmholtz-berlin.de
- Studies of Physics at the RWTH-Aachen, Germany
- PhD from the Washington University St. Louis, USA
- since October 1999 at the Hahn-Meitner Institut
- since fall 2000 group leader of the Kelvin-microscopy group
Research Activities:
- Kelvin probe force microscopy in ultra high vacuum
- atomic force microscopy
- molecular beam epitaxial growth
- chalcopyrite solar cell materials
- III-V and Si materials and devices
- Nano-scale oxidation of surfaces
Ausgewählte relevante Veröffentlichungen
2007
Sadewasser, S.:
Microscopic characterization of individual grain boundaries in Cu-III-VI2 chalcopyrites. Thin Solid Films 515 (2007), p. 6136-6141
2006
Leendertz, C. ; Streicher, F. ; Lux-Steiner, M.Ch. ; Sadewasser, S.:
Evaluation of Kelvin probe force microscopy for imaging grain boundaries in chalcopyrite thin films. Applied Physics Letters 89 (2006), p. 113120/1-3
Sadewasser, S.:
Electronic properties of surfaces and interfaces in widegap chalcopyrites. In: Siebentritt, S. ; Rau, U. [Eds.] : Wide-gap chalcopyrites. Berlin: Springer, 2006 (Springer series in materials science ; 86). - ISBN 3-540-24497-2, p. 193-212
Sadewasser, S.:
Surface potential of chalcopyrite films measured by KPFM. Physica Status Solidi A 203 (2006), p. 2571-2580
Siebentritt, S. ; Sadewasser, S. ; Wimmer, M. ; Leendertz, C. ; Eisenbarth, T. ; Lux-Steiner, M.Ch.:
Evidence for a neutral grain-boundary barrier in chalcopyrites. Physical Review Letters 97 (2006), p. 146601/1-4
2005
Fuertes Marrón D. ; Sadewasser S. ; Meeder A. ; Glatzel Th. ; Lux-Steiner M.Ch.:
Electrical activity at grain boundaries of Cu(In,Ga)Se2 thin films. Physical Review B 71 (2005), p. 033306/1-4
2004
Douhéret O. ; Anand S. ; Glatzel Th. ; Maknys K. ; Sadewasser S.:
Characterization of quantum wells by cross-sectional Kelvin probe force microscopy. Applied Physics Letters 85 (2004), p. 5245-5247
Fuertes Marrón D. ; Glatzel Th. ; Meeder A. ; Schedel-Niedrig Th. ; Sadewasser S. ; Lux-Steiner M.Ch.:
Electronic structure of secondary phases in Cu-rich CuGaSe2 solar cell devices. Applied Physics Letters 85 (2004), p. 3755-3757
Rosenwaks Y. ; Shikler R. ; Glatzel Th. ; Sadewasser S.:
Kelvin probe force microscopy of semiconductor surface defects. Physical Review B 70 (2004), p. 085320/1-7
2003
Sadewasser S. ; Glatzel Th. ; Schuler S. ; Nishiwaki S. ; Kaigawa R. ; Lux-Steiner M.Ch.:
Kelvin probe force microscopy for the nano scale characterization of chalcopyrite solar cell materials and devices. Thin Solid Films 431-432 (2003), p. 257-261
Sadewasser S. ; Lux-Steiner M.Ch.:
Correct height measurement in noncontact atomic force microscopy. Physical Review Letters 91 (2003), p. 266101/1-4
2002
Glatzel Th. ; Fuertes Marrón D. ; Schedel-Niedrig Th. ; Sadewasser S. ; Lux-Steiner M.Ch.:
CuGaSe2 solar cell cross section studied by Kelvin probe force microscopy in ultrahigh vacuum. Applied Physics Letters 81 (2002), p. 2017-2019
Sadewasser S. ; Glatzel Th. ; Rusu M. ; Jäger-Waldau A. ; Lux-Steiner M.Ch.:
High-resolution work function imaging of single grains of semiconductor surfaces. Applied Physics Letters 80 (2002), p. 2979-2981
