| Instrument ( on schedule / limited access ) | Ext. | Instrument Scientists | Ext. | |
|---|---|---|---|---|
| E1 | 3-Axis Spectrometer with Polarisation Analysis (limited access only in close co-operation with local staff members) | 3101 | M. Mihalik A. Hoser | 2793 2847 |
| E2 | Flat-Cone Single Crystal Diffractometer | 3102 | J. Hoffmann I. Glavatskyi | 2185 2673 |
| E2a | Crystal-Test Diffractometer | 3102 | J. Hoffmann | 2185 |
| E3 | Residual Stress Analysis and Texture Diffractometer | 3103 | R. Wimpory | 3097 |
| E4 | 2-Axis-Diffractometer | 3104 | K. Prokes S. Matas | 2804 2804 |
| E4b | Position for Single Crystal Orientation | 3104 | K. Prokes S. Matas | 2804 2804 |
| E5 | 4-Circle Diffractometer | 3104 | M. Reehuis | 2692 |
| E6 | Focusing Powder Diffractometer | 3105 | A. Hoser T. Hofmann | 2847 2793 |
| E7 | Residual Stress Analysis Diffractometer (limited access only in close co-operation with local staff members) | 3107 | R. Wimpory | 3097 |
| E9 | Fine Resolution Powder Diffractometer (FIREPOD) | 3106 | D. Argyriou M. Tovar F. Yokaichiya S. Kimber P. Henry | 3016 2768 3177 3079 2686 |
| E10 | HELINE, 3He-Diffractometer | 3106 | K. Siemensmeyer | 2757 |
| Instrument ( on schedule / limited access ) | Ext. | Instrument Scientists | Ext. | |
|---|---|---|---|---|
| V1 | Membrane Diffractometer | 3121 | T. Hauß A. Buchsteiner | 2071 2071 |
| V2 | I: 3-Axis Spectrometer (FLEX) II: FLEX with NRSE opt. | 3122 | K. Habicht K. Rule M. Skoulatos M. Le | 2807 3067 2171 2803 |
| V3 | Time-of-Flight Spectrometer (NEAT) | 3123 | M. Russina Z. Izaola | 3159 3179 |
| V4 | Small Angle Scattering Instrument (SANS) | 3124 | U. Keiderling S. Prévost V. Ryukhtin A. Brandt | 2339 2339 3099 2169 |
| V5 | Spin-Echo Spectrometer with ToF Option (SPAN) | 3125 | S. Wellert | 3174 |
| V6 | Reflectometer | 2806 | R. Steitz R. Köhler A. Teichert | 2149 3077 2044 |
| V7 | Cold Neutron Tomography and Radiography (CONRAD) | 3327 | N. Kardjilov A. Hilger M. Dawson | 2298 2298 |
| B8 | Neutron-Autoradiography (limited access only in close co-operation with local staff members) | 3121 | A. Denker | 3000 |
| V12a | Bent-crystal Diffractometer (USANS) / Tomography | 3131 | W. Treimer S. Seidel O. Ebrahimi | 2221 3298 3076 |
| V14 | Mirror Test Device | 2284 | T. Krist | 2045 |
| V15 | Extreme Environment Diffractometer (EXED) (commissioning, users please contact local scientist before application) | 3283 | O. Prokhnenko H. Bleif | 3068 2758 |
| V16 | Very Small Angle Neutron Scattering (VSANS) (commissioning, users please contact local scientist before application) | 3281 | D. Clemens K. Vogtt | 2280 3022 |
| V17 | Detector Test Station | 3284 | T. Wilpert C. Schulz S. Alimov | 2743 2675 2675 |
| V18 | Reflectometer for biological applications (BioRef) (commissioning) | **** | R. Steitz M. Strobl A. Paul | 2149 2490 2925 |
| V19 | Polarized Neutron Tomography (PONTO) | **** | W. Treimer O. Ebrahimi S. Seidel | 2221 3076 3298 |
| X2 | X-ray Reflectometer (Sample Preparation V6, only in close co-operation with local staff members) | 3112 | H. Bleif | 2758 |
| X3 | X-Ray CT (complementary to V7) | **** | N. Kardjilov | 2298 |