Conferences

LEEM-PEEM is a biennial meeting reviewing the status of LEEM, PEEM, SPLEEM, XPEEM and related techniques. The meeting promotes and disseminates applications of cathode lens microscopy to a broad audience of interested scientists.

The workshop highlights the most recent scientific advances as well as instrumental developments. Topics will cover surfaces, thin films, organic films, surface more


The 4th International Soft Matter Conference (ISMC 2016) will be held at the Alpexpo Alpes Congrès in Grenoble, France  from 12-16th  September 2016. Three previous conferences were held in Aachen (2007), Granada (2010) and Rome (2013), and brought together up to 800 experimentalists and theorists working in the Soft Matter field. The conference covers both the fundamental and applied more


Sample environment support is a vital element in the success of scattering experiments. The 9th International Workshop on Sample Environment will bring together scientists, engineers and technicians, as well as leading suppliers, to exchange experience, form collaborations and discuss new ideas.