Workshop on analytical tools for PV, June 25th - 27th, 2014

Within the Sophia project, the Helmholtz-Zentrum Berlin offers a hands-on workshop on the application of two different advanced analysis methods for the characterization of PV materials. These two methods are available within the transnational access program of the SOPHIA project (further information).

Participation will be free of charge but limited to a maximum of 20 participants. If you wish to participate, please send a short CV including your current field of work as well as a possible application and benefit of the presented method(s) to your work. Based on the number of applications, participants will be selected accordingly. 


Surface Sensitive Synchrotron Based Materials Analysis

The experimental set-up “CISSY” at the BESSY synchrotron combines X-ray emission spectroscopy (XES), X-ray absorption spectroscopy (XAS) and photoelectron spectroscopy (XPS, UPS, HIKE) with ex-situ, in-system and in-situ preparation of buffer and window layers for chalcopyrite solar cells.

Depending on the excitation energy used, the information depth provided by these methods ranges from a few monolayers up to microns. Any type of thin films can be analyzed with regards to chemical, electronic and partly structural properties. The unique features of this analysis tool are the combination of state of-the-art, synchrotron-based analytics with versatile layer preparation methods, a fast loadlock chamber with rapid sample turnover and large-area sample holders for sample sizes up to 25 x 25 mm2.

Multi Resonance EPR/EDMR

The Electron Paramagnetic Resonance Facility at HZB (EPR@HZB) allows for the characterization of paramagnetic states such as many known defects in materials implemented in solar cells. One of the most prominent defects characterized by this technique are broken silicon bonds, (dangling bonds) in thinfilm silicon, e.g a-Si and μc-Si:h. The unique feature of the EPR analysis is that defects and impurities in semiconductor materials can be quantified at levels as low as 1013/cm3 depending on the specific nature of the paramagnetic specimen involved. The EPR signature allows a microscopic identification of the involved specimen through their characteristic EPR fingerprint.

EPR@HZB has several spectrometers covering the microwave frequencies from 9 GHz up to 263 GHz with multi-frequency options such as ENDOR (Electron Nuclear Double Resonance). Typical samples sizes suitable for EPR measurements are 4 x 10 x 4 mm3.