Structure-property relationships in thin-film solar cells

The structural and compositional properties of extended structural defects in thin-film solar cells are investigated by means of imaging, diffraction, EDX, EBIC, CL, and electron holography in scanning and transmission electron microscopes. The aim is to correlate the corresponding properties of dislocations, stacking faults, microtwins, grain boundaries and strain within individual grain s with the photovoltaic performance of the solar cells.

Secondary electron (SE) image, electron backscatter diffraction (EBSD) map, and electron-beam-induced current (EBIC) image, acquired on a cross-section specimen of a ZnO/CdS/Cu(IN,Ga)Se2/Mo solar-cell stack on glass.