Preliminary Programme: 3rd X-ray school from 04.-15.05.2020

MONDAY, 04.05.

GENERAL INTRODUCTION I (mandatory):

• Fundamentals of crystallography
• Fundamentals of X-ray diffraction
• Introduction into X-ray CoreLab

TUESDAY, 05.05.

GENERAL INTRODUCTION II (mandatory):

• Elements of X-ray powder pattern, peak shapes, measuring strategies
• Crystallographic databases: ICSD + ICDD-PDF
• Applying Powder Cell to X-ray powder patterns

WEDNESDAY, 06.05.

GENERAL INTRODUCTION III (mandatory):

• Indexing and extinction rules, indexing by hand
• Introduction into Fullprof Suite and WinPlotr
• Practicals: Acquisition of XRD powder and thin film data

THURSDAY, 07.05

• Introduction into Bruker EVA software
• Phase analysis of XRD powder pattern
• Lotgering factor of polycrystalline materials

FRIDAY, 08.05

                                      Public holiday

MONDAY, 11.05.

• Introduction into non-ambient X-ray diffraction
• Practicals with HTK-1200 N
• Analysis of microstructure

• Whole powder pattern fitting (Le Bail refinement)
• Analysis of solid solution series
• Modules: Texture/Reflectivity/XRF

• Analysis of high-temperature X-ray patterns
• Analysis GI-XRD data
• Modules: Texture/Reflectivity/XRF

• Introduction into Rietveld analysis of powder patterns
• Excercise of Rietveld analysis
• Modules: Texture/Reflectivity/XRF

• Summary
• Scientific talks
• Certificate & closing