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WEEK 1
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MONDAY, 04.05.
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GENERAL INTRODUCTION I (mandatory):
- Fundamentals of crystallography
- Fundamentals of X-ray diffraction
- Introduction into X-ray CoreLab
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TUESDAY, 05.05.
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GENERAL INTRODUCTION II (mandatory):
- Elements of X-ray powder pattern, peak shapes, measuring strategies
- Crystallographic databases: ICSD + ICDD-PDF
- Applying Powder Cell to X-ray powder patterns
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WEDNESDAY, 06.05.
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GENERAL INTRODUCTION III (mandatory):
- Indexing and extinction rules, indexing by hand
- Introduction into Fullprof Suite and WinPlotr
- Practicals: Acquisition of XRD powder and thin film data
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THURSDAY, 07.05
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- Introduction into Bruker EVA software
- Phase analysis of XRD powder pattern
- Lotgering factor of polycrystalline materials
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FRIDAY, 08.05
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Public holiday
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| WEEK 2 |
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MONDAY, 11.05.
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- Introduction into non-ambient X-ray diffraction
- Practicals with HTK-1200 N
- Analysis of microstructure
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| TUESDAY, 12.05. |
- Whole powder pattern fitting (Le Bail refinement)
- Analysis of solid solution series
- Modules: Texture/Reflectivity/XRF
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| WEDNESDAY, 13.05. |
- Analysis of high-temperature X-ray patterns
- Analysis GI-XRD data
- Modules: Texture/Reflectivity/XRF
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| THURSDAY, 14.05. |
- Introduction into Rietveld analysis of powder patterns
- Excercise of Rietveld analysis
- Modules: Texture/Reflectivity/XRF
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| FRIDAY, 15.05. |
- Summary
- Scientific talks
- Certificate & closing
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