Instrument Control & Data Acquisition



For instrument control and data acquisition we use spec, which is a UNIX-based software package widely used for X-ray diffraction at synchrotrons (for details see http://www.certif.com).

The ASCII data file usually contains beamline data (beam current), all diffractometer data (motor positions) as well as various detector data (counts per channel, calibration data, acquisition time). For individual applications additional data, such as temperature and pressure, may be collected by means of the Keithley digital multimeter 2700. For detailed information about the Keithley see http://www.keithley.de.

A handout containing all basic spec commands for our application is available for download (108 kB).


Support


Infrastructure at Experimental Station

electrical power supplies:220 V, 16 A

400 V, 16 A

cooling water:available
pressurized air:8 bar

Available Software (Linux)

Xplot 2.1

Xplot is for creating X-Y graphics which also allows sophisticated data visualization, processing, manipulation and analysis.

for more information see
http://www.esrf.fr/computing/scientific/xop

Available Software (Windows)

mathematica 4.0various mathematica notebooks already exist, which allow the preparation of the measurement (basic calculations), the compilation of the experiment command files and the conversion and analysis of data, i.e. standard residual stress analysis procedures
origin 6.1graphic and data analysis software
corel 10versatile graphics program
Xplot 2.1Xplot is for creating X-Y graphics which also allows sophisticated data visualization, processing, manipulation and analysis.
JCPDSDiffraction data
office 2000 prostandard microsoft office programs