TEM - Transmission Electron Microscopy

The institute of materials utilizes a FEI CM 30 transmission electron microscope. It is operated at 300 kV accelerating voltage, has a LaB6 emitter and is equiped with means for energy dispersive X-ray spectroscopy (EDS). Images and diffraction patterns are recorded either on film, imaging plates or CCD camera. A set of special sample holders allows for in-situ cryo, heating and straining experiments.