Standing Waves technique, nano-EXAFS

Contour plot of the x-ray intensity distribution inside the cavity as a function of the scattering vector q (Ǻ-1)

Average W-Si bond length respectively, as a function of q for samples with different irradiation fluences. (with A. Gupta (Indore), C. Meneghini (Uni Roma Tre), G. Principi (Uni Padova), N. Darowski, I. Zizak, (HMI, Berlin)