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Standing Waves technique, nano-EXAFS

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Contour plot of the x-ray intensity distribution inside the cavity as a function of the scattering vector q (Ǻ-1)

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Average W-Si bond length respectively, as a function of q for samples with different irradiation fluences. (with A. Gupta (Indore), C. Meneghini (Uni Roma Tre), G. Principi (Uni Padova), N. Darowski, I. Zizak, (HMI, Berlin)