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Structure analysise of solar cell systems using TEM

Transmission electron microscopy (TEM) enables a wide range of high-resolution inspection methods, including scanning electron microscopy (STEM), electron energy loss spectroscopy (EELS), energy-filtered transmission electron microscopy (EFTEM), and energy dispersive X-ray spectroscopy (EDX) and tomography.

Microscopic ultrastructure investigation of solar cells by means of high-resolution TEM methods for the determination of defects that are directly related to the photovoltaic efficiency of solar cells.

high-resolution TEM image of Si/SiO2/Rh stack - enlarged view

HRTEM of a Si/SiO2/Rh stack

bright-field TEM images of an organic solar cell - enlarged view

BFTEM of an organic solar cell

Scanning TEM mit EDX mapping - enlarged view

STEM with EDX element distribution