PhD-2: Microstrain and structural defects in polycrystalline Si and CIGSe thin films investigated by means of electron backscatter diffraction

  • microstrain calculation in poly-Si and CIGSe thin films from electron backscatter diffraction measurements
  • development of microstrain during the growth process
  • correlation with distributions of planar structural defects
  • correlation with elemental distributions and with electrical/optoelectronic properties

PhD-4: Atomistic microstructure modeling of CIGSe (TUD-MM)

  • molecular dynamics microstructure simulations of silicon and analysis of strain effects on resulting XRD patterns
  • development of analytical interatomic potentials for the systems CISe and CGSe
  • Generating reference data and calculation of free energies from density functional theory (DFT)
  • DFT calculations of proposed and simulated dislocations and grain-boundary structures
  • microstructure simulations of CISe and CGSe using molecular dynamics

PhD-6: Numerical methods for multi-phase systems applied to the growth of Cu(In,Ga)Se2 thin films (Matheon)

  • adaptive finite element discretizations and numerical solvers for discretized phase field models for growing poly-Si film from PhD-5 in 2D. Numerical simulations in cooperation with PhD-5
  • extension of these numerical solvers to more complex phase fields in cooperation with PhD-4
  • Fast and robust numerical solution of phase field models for grain growth in ternary and quaternary thin films from PhD-5 in 2D and 3D. Numerical simulations and comparisons with experiments in cooperation with PhD-5 and PhD-1 to PhD-4.