PVcomB
Surface analysis
At PVcomB, an optical microscope is available for the visual evaluation of sample surfaces. Additionally, a mechanical surface profiler, a confocal laser scanning microscope and an atomic force microscope are used to gain topographical information at the appropriate length scale.
Optical microscope: Zeiss Axio Scope.A1
- bright / dark field
- 5x, 10x, 50x, and 100x objectives
- high resolution AxioCam camera
Confocal 3D Laser scanning microscope: Keyence VK-X260
- 10x , 20x , 50x , 150x objectives
- image sizes: 10x: 1350 x 1012 µm², 150x: 90 x 76 µm²
- max. height of sample: 28 mm / heigth range to measure: 7 mm
- camera resolution: up to 3072 × 2304
confocal laser scanning:
- Laser: 408 nm, 0,95 mW
- Scan resolution: up to 2048 x 1536
- repeatability heigth measurements: 20×: 40 nm, 50×: 12 nm, 150×: 12 nm
- repeatability lateral measurements: 20×: 100 nm, 50×: 40 nm, 150×: 20 nm
Stitching of 100 images via automated sample chuck (range: 10 x 10 cm²).
Superposition of laser scan image and microscopy image.
Surface Profiler: Bruker Dektak XT
- 5Å repeatability
- max. scan length 55mm
- active isolation table
- optional vaccum chuck
- Alpha-Step D-120 APEX 3D Software
Atomic force microscope: Park Systems XE70
- max. sample size 10 × 10 cm²
- max. scan area 50 × 50 µm²
- max. resolution bis 4096 × 4096 pixel
- max. z-scan range 12 µm
- integrated optical microscope
- contact / non-contact, and electrical modi