Publikationen 2015

Abou-Ras, D.; Schäfer, N.; Baldaz, N.; Brunken, S.; Boit, C.: Electron-beam-induced current measurements with applied bias provide insight tolocally resolved acceptor concentrations at p-n junctions. AIP Advances 5 (2015), p. 077191/1-7
Open Access Version

Brokmeier, H.-G.; Carradó, A.; Al-hamdany, N.; Pirling, T.; Wimpory, R.; Schell, N.; Palkowski, H.: Texture gradient in a copper tube at maximum and minimum wall thickness. IOP Conference Series : Materials Science and Engineering 82 (2015), p. 012102/1-4
Open Access Version

Carter, N.J.; Mainz, R.; Walker, B.C.; Hages, C.J.; Just, J.; Klaus, M.; Schmidt, S.S.; Weber, A.; Yang, W.-C.D.; Zander, O.; Stach, E.A.; Unold, T.; Agrawal, R.: The role of interparticle heterogeneities in the selenization pathway of Cu-Zn-Sn-S nanoparticle thin films: a real-time study. Journal of Materials Chemistry C 3 (2015), p. 7128-7134
Open Access Version

Coppola, R.; Ohms, C.; Reiser, J.; Rieth, M.; Wimpory, R.C.: Neutron diffraction stress determination in W-laminates for structural divertor applications. Nuclear Materials and Energy 3-4 (2015), p. 37-42
Open Access Version

Egorova, Y.; Scherb, T.; Schumacher, G.; Bouwmeester, H.; Filatova, E.: Soft X-ray absorption spectroscopy study of (Ba0.5Sr0.5)(Co0.8Fe0.2)1-xNbxO3-δ with different content of Nb (5%-20%). Journal of Alloys and Compounds 650 (2015), p. 848-852
Open Access Version

Gibson, J.L.; Jimenez, C.; Garcia De Andres, C.; Danon, C.A.; Luppo, M.I.: Evaluation of the Abnormal Grain Growth in an ASTM 213 Grade T91 Steel. Procedia Materials Science 8 (2015), p. 1118-1126
Open Access Version

Ivanovski, V.N.; Cekic, B.; Umicevic, A.; Barudzija, T.; Schumacher, G.; Madarevic, I.; Koteski, V.: Site preference of Hf dopant in Ni3Al alloys: A perturbed angular correlation study. Journal of Alloys and Compounds 622 (2015), p. 541-544

Kittelmann, T.; Boin, M.: Polycrystalline neutron scattering for Geant4: NXSG4. Computer Physics Communications 189 (2015), p. 114-118
Open Access Version

Kühnapfel, S.; Nickel, N.H.; Gall, S.; Klaus, M.; Genzel, C.; Rech, B.; Amkreutz, D.: Preferential {100} grain orientation in 10 micrometer-thick laser crystallized multicrystalline silicon on glass. Thin Solid Films 576 (2015), p. 68-74

Lentz, M.; Klaus, M.; Beyerlein, I.J.; Zecevic, M.; Reimers, W.; Knecevic, M.: In Situ X-Ray Diffraction and Crystal Plasticity Modeling of the Deformation Behavior of Extruded Mg-Li-(Al) Alloys: An Uncommon Tension-Compression Asymmetry. Acta Materialia 86 (2015), p. 254-268

Lentz, M.; Klaus, M.; Wagner, M.; Fahrenson, Ch.; Beyerlein, I. J.; Zecevic, M.; Reimers, W.; Knezevic, M.: Effect of age hardening on the deformation behavior of an Mg-Y-Nd alloy: In-situ X-ray diffraction and crystal plasticity modeling. Materials Science and Engineering A 628 (2015), p. 396-409

Liu, Y.; Schumacher, G.; Bian, X.F.; Banhart, J.: Local constriction around minor elements in Al86Ni7X1Y6 metallic glass (X: Ag, Au, Pt). Journal of Non-Crystalline Solids 422 (2015), p. 26-31

Mainz, R.; Rodriguez Alvarez, H.; Klaus, M.; Thomas, D.; Lauche, J.; Weber, A.; Heinemann, M.D.; Brunken, S.; Greiner, D.; Kaufmann, C.A.; Unold, T.; Schock, H.-W.; Genzel, C.: Sudden stress relaxation in compound semiconductor thin films triggered by secondary phase segregation. Physical Review B 92 (2015), p. 155310/1-8
Open Access Version

Mainz, R.; Weber, A.; Rodriguez-Alvarez, H.; Levcenko, S.; Klaus, M.; Pistor, P.; Klenk, R.; Schock, H.-W.: Time-resolved investigation of Cu(In,Ga)Se2 growth and Ga gradient formation during fast selenization of metallic precursors. Progress in Photovoltaics 23 (2015), p. 1131–1143
Open Access Version

Meixner, M.; Fuss, T.; Klaus, M.; Genzel, C.: Diffraction analysis of strongly inhomogeneous residual stress depth distributions by modification of the stress scanning method - I. Theoretical concept. Journal of Applied Crystallography 48 (2015), p. 1451-1461

Meixner, M.; Fuss, T.; Klaus, M.; Genzel, M.; Genzel, C.: Diffraction analysis of strongly inhomogeneous residual stress depth distributions by modification of the stress scanning method - II. Experimental implementation. Journal of Applied Crystallography 48 (2015), p. 1462 - 1475

Miglierini, M.; Pavlovic, M.; Prochazka, V.; Hatala, T.; Schumacher, G.; Rüffer, R.: Evolution of structure and local magnetic fields during crystallization of HITPERM glassy alloys studied by in situ diffraction and nuclear forward scattering of synchrotron radiation. Physical Chemistry Chemical Physics 17 (2015), p. 28239-28249
Open Access Version

Muydinov, R.; Ruske, F.; Neubert, S.; Steigert, A.; Klaus, M.; Selve, S.; Köppel, G.; Szyszka, B.: Combination of nitrogen mediated crystallisation with post-deposition annealing - Towards ultra-thin ZnO:Al contacts. Thin Solid Films 589 (2015), p. 750-754

Platt, P.; Polatidis, E.; Frankel, P.; Klaus, M.; Gass, M.; Howells, R.; Preuss, M.: A Study into Stress Relaxation in Oxides Formed on Zirconium Alloys. Journal of Nuclear Materials 456 (2015), p. 415-425
Open Access Version

Scherg-Kurmes, H.; Körner, S.; Ring, S.; Klaus, M.; Korte, L.; Ruske, F.; Schlatmann, R.; Rech, B.; Szyszka, B.: High mobility In2O3:H as contact layer for a-Si:H/c-Si heterojunction and muc-Si:H thin film solar cells. Thin Solid Films 594 (2015), p. 316-322

Smith, M.C.; Smith, A.; Ohms, C.; Wimpory, R.: A Review of the NeT TG4 International Weld Residual Stress Benchmark. In: ASME 2015 Pressure Vessels and Piping Conference. Volume 6B: Materials and Fabrication, Boston, Massachusetts, USA, July 19–23, 2015. ASME, 2015. - ISBN 978-0-7918-5700-7, p. PVP2015-45801/1-16

Stange, H.; Brunken, S.; Hempel, H.; Rodriguez Alvarez, H.; Schäfer, N.; Greiner, D.; Scheu, A.; Lauche, J.; Kaufmann, C.A.; Unold, T.; Abou-Ras, D.; Mainz, R.: Effect of Na presence during CuInSe2 growth on stacking fault annihilation and electronic properties. Applied Physics Letters 107 (2015), p. 152103/1-5

Sticchi, M.; Staron, P.; Meixner, M.; Klaus, M.; Rebelo-Kornmeier, J.; Huber, N.; Kashaev, N.: A parametric study of laser spot size and coverage on the laser shock peening induced residual stress in thin aluminium samples. The Journal of Engineering (2015), p. 1-9
Open Access Version

Van Duren, S.; Ren, Y.; Scragg, J.; Just, J.; Unold, T.: Raman spectroscopy study on in-situ monitoring of Cu2ZnSnS4 synthesis. In: 2015 IEEE 42nd Photovoltaic Specialist Conference (PVSC 2015) : New Orleans, Louisiana, USA, 14 - 19 June 2015 . Piscataway, NJ: IEEE, 2015. - ISBN 978-1-4799-7945-5, p. 208-210

Witte, W.; Abou-Ras, D.; Albe, K.; Bauer, G.H.; Bertram, F.; Boit, C.; Brueggemann, R.; Christen, J.; Dietrich, J.; Eicke, A.; Hariskos, D.; Maiberg, M.; Mainz, R.; Meessen, M.; Mueller, M.; Neumann, O.; Orgis, T.; Paetel, S.; Pohl, J.; Rodriguez Alvarez, H.; Scheer, R.; Schock, H.-W.; Unold, T.; Weber, A.; Powalla, M.: Gallium gradients in Cu(In,Ga)Se2 thin-film solar cells. Progress in Photovoltaics 23 (2015), p. 717–733

Woracek, R.; Penumadu, D.; Kardjilov, N.; Hilger, A.; Boin, M.; Banhart, J.; Manke, I.: Neutron Bragg edge tomography for phase mapping. Physics Procedia 69 (2015), p. 227-236
Open Access Version

Zellmeier, M.; Rappich, J.; Klaus, M.; Genzel, C.; Janietz, S.; Frisch, J.; Koch, N.; Nickel, N.: Side chain engineering of poly-thiophene and its impact on crystalline silicon based hybrid solar cells. Applied Physics Letters 107 (2015), p. 203301/1-4

de Biasi, L.; Lieser, G.; Rana, J.; Indris, S.; Dräger, C.; Glatthaar, S.; Mönig, R.; Ehrenberg, H.; Schumacher, G.; Binder, J.; Geßwein, H.: In situ X-ray diffraction and absorption spectroscopy of triru-tile type LiNiFeF6 cathode material for Li-ion batteries. CrystEngComm 17 (2015), p. 6163-6171