Publications 2015


Abou-Ras, D.; Schäfer, N.; Baldaz, N.; Brunken, S.; Boit, C.: Electron-beam-induced current measurements with applied bias provide insight tolocally resolved acceptor concentrations at p-n junctions. AIP Advances 5 (2015), p. 077191/1-7
doi:10.1063/1.4928097
Open Access Version


Brokmeier, H.-G.; Carradó, A.; Al-hamdany, N.; Pirling, T.; Wimpory, R.; Schell, N.; Palkowski, H.: Texture gradient in a copper tube at maximum and minimum wall thickness. IOP Conference Series : Materials Science and Engineering 82 (2015), p. 012102/1-4
doi:10.1088/1757-899X/82/1/012102
Open Access Version


Carter, N.J.; Mainz, R.; Walker, B.C.; Hages, C.J.; Just, J.; Klaus, M.; Schmidt, S.S.; Weber, A.; Yang, W.-C.D.; Zander, O.; Stach, E.A.; Unold, T.; Agrawal, R.: The role of interparticle heterogeneities in the selenization pathway of Cu-Zn-Sn-S nanoparticle thin films: a real-time study. Journal of Materials Chemistry C 3 (2015), p. 7128-7134
doi:10.1039/c5tc01139f
Open Access Version


Coppola, R.; Ohms, C.; Reiser, J.; Rieth, M.; Wimpory, R.C.: Neutron diffraction stress determination in W-laminates for structural divertor applications. Nuclear Materials and Energy 3-4 (2015), p. 37-42
doi:10.1016/j.nme.2015.07.001
Open Access Version


Egorova, Y.; Scherb, T.; Schumacher, G.; Bouwmeester, H.; Filatova, E.: Soft X-ray absorption spectroscopy study of (Ba0.5Sr0.5)(Co0.8Fe0.2)1-xNbxO3-δ with different content of Nb (5%-20%). Journal of Alloys and Compounds 650 (2015), p. 848-852
doi:10.1016/j.jallcom.2015.08.073
Open Access Version


Gibson, J.L.; Jimenez, C.; Garcia De Andres, C.; Danon, C.A.; Luppo, M.I.: Evaluation of the Abnormal Grain Growth in an ASTM 213 Grade T91 Steel. Procedia Materials Science 8 (2015), p. 1118-1126
doi:10.1016/j.mspro.2015.04.175
Open Access Version


Ivanovski, V.N.; Cekic, B.; Umicevic, A.; Barudzija, T.; Schumacher, G.; Madarevic, I.; Koteski, V.: Site preference of Hf dopant in Ni3Al alloys: A perturbed angular correlation study. Journal of Alloys and Compounds 622 (2015), p. 541-544
doi:10.1016/j.jallcom.2014.10.132


Kittelmann, T.; Boin, M.: Polycrystalline neutron scattering for Geant4: NXSG4. Computer Physics Communications 189 (2015), p. 114-118
doi:10.1016/j.cpc.2014.11.009
Open Access Version


Kühnapfel, S.; Nickel, N.H.; Gall, S.; Klaus, M.; Genzel, C.; Rech, B.; Amkreutz, D.: Preferential {100} grain orientation in 10 micrometer-thick laser crystallized multicrystalline silicon on glass. Thin Solid Films 576 (2015), p. 68-74
doi:10.1016/j.tsf.2015.01.006


Lentz, M.; Klaus, M.; Beyerlein, I.J.; Zecevic, M.; Reimers, W.; Knecevic, M.: In Situ X-Ray Diffraction and Crystal Plasticity Modeling of the Deformation Behavior of Extruded Mg-Li-(Al) Alloys: An Uncommon Tension-Compression Asymmetry. Acta Materialia 86 (2015), p. 254-268
doi:10.1016/j.actamat.2014.12.003


Lentz, M.; Klaus, M.; Wagner, M.; Fahrenson, Ch.; Beyerlein, I. J.; Zecevic, M.; Reimers, W.; Knezevic, M.: Effect of age hardening on the deformation behavior of an Mg-Y-Nd alloy: In-situ X-ray diffraction and crystal plasticity modeling. Materials Science and Engineering A 628 (2015), p. 396-409
doi:10.1016/j.msea.2015.01.069


Liu, Y.; Schumacher, G.; Bian, X.F.; Banhart, J.: Local constriction around minor elements in Al86Ni7X1Y6 metallic glass (X: Ag, Au, Pt). Journal of Non-Crystalline Solids 422 (2015), p. 26-31
doi:10.1016/j.jnoncrysol.2015.05.001


Mainz, R.; Rodriguez Alvarez, H.; Klaus, M.; Thomas, D.; Lauche, J.; Weber, A.; Heinemann, M.D.; Brunken, S.; Greiner, D.; Kaufmann, C.A.; Unold, T.; Schock, H.-W.; Genzel, C.: Sudden stress relaxation in compound semiconductor thin films triggered by secondary phase segregation. Physical Review B 92 (2015), p. 155310/1-8
doi:10.1103/PhysRevB.92.155310
Open Access Version


Mainz, R.; Weber, A.; Rodriguez-Alvarez, H.; Levcenko, S.; Klaus, M.; Pistor, P.; Klenk, R.; Schock, H.-W.: Time-resolved investigation of Cu(In,Ga)Se2 growth and Ga gradient formation during fast selenization of metallic precursors. Progress in Photovoltaics 23 (2015), p. 1131–1143
doi:10.1002/pip.2531
Open Access Version


Meixner, M.; Fuss, T.; Klaus, M.; Genzel, C.: Diffraction analysis of strongly inhomogeneous residual stress depth distributions by modification of the stress scanning method - I. Theoretical concept. Journal of Applied Crystallography 48 (2015), p. 1451-1461
doi:10.1107/S160057671501448X


Meixner, M.; Fuss, T.; Klaus, M.; Genzel, M.; Genzel, C.: Diffraction analysis of strongly inhomogeneous residual stress depth distributions by modification of the stress scanning method - II. Experimental implementation. Journal of Applied Crystallography 48 (2015), p. 1462 - 1475
doi:10.1107/S160057671501585X


Miglierini, M.; Pavlovic, M.; Prochazka, V.; Hatala, T.; Schumacher, G.; Rüffer, R.: Evolution of structure and local magnetic fields during crystallization of HITPERM glassy alloys studied by in situ diffraction and nuclear forward scattering of synchrotron radiation. Physical Chemistry Chemical Physics 17 (2015), p. 28239-28249
doi:10.1039/c5cp00245a
Open Access Version


Muydinov, R.; Ruske, F.; Neubert, S.; Steigert, A.; Klaus, M.; Selve, S.; Köppel, G.; Szyszka, B.: Combination of nitrogen mediated crystallisation with post-deposition annealing - Towards ultra-thin ZnO:Al contacts. Thin Solid Films 589 (2015), p. 750-754
doi:10.1016/j.tsf.2015.07.012


Platt, P.; Polatidis, E.; Frankel, P.; Klaus, M.; Gass, M.; Howells, R.; Preuss, M.: A Study into Stress Relaxation in Oxides Formed on Zirconium Alloys. Journal of Nuclear Materials 456 (2015), p. 415-425
doi:10.1016/j.jnucmat.2014.09.072
Open Access Version


Scherg-Kurmes, H.; Körner, S.; Ring, S.; Klaus, M.; Korte, L.; Ruske, F.; Schlatmann, R.; Rech, B.; Szyszka, B.: High mobility In2O3:H as contact layer for a-Si:H/c-Si heterojunction and muc-Si:H thin film solar cells. Thin Solid Films 594 (2015), p. 316-322
doi:10.1016/j.tsf.2015.03.022


Smith, M.C.; Smith, A.; Ohms, C.; Wimpory, R.: A Review of the NeT TG4 International Weld Residual Stress Benchmark. In: ASME 2015 Pressure Vessels and Piping Conference. Volume 6B: Materials and Fabrication, Boston, Massachusetts, USA, July 19–23, 2015. ASME, 2015. - ISBN 978-0-7918-5700-7, p. PVP2015-45801/1-16
doi:10.1115/PVP2015-45801


Stange, H.; Brunken, S.; Hempel, H.; Rodriguez Alvarez, H.; Schäfer, N.; Greiner, D.; Scheu, A.; Lauche, J.; Kaufmann, C.A.; Unold, T.; Abou-Ras, D.; Mainz, R.: Effect of Na presence during CuInSe2 growth on stacking fault annihilation and electronic properties. Applied Physics Letters 107 (2015), p. 152103/1-5
doi:10.1063/1.4933305


Sticchi, M.; Staron, P.; Meixner, M.; Klaus, M.; Rebelo-Kornmeier, J.; Huber, N.; Kashaev, N.: A parametric study of laser spot size and coverage on the laser shock peening induced residual stress in thin aluminium samples. The Journal of Engineering (2015), p. 1-9
doi:10.1049/joe.2015.0106
Open Access Version


Van Duren, S.; Ren, Y.; Scragg, J.; Just, J.; Unold, T.: Raman spectroscopy study on in-situ monitoring of Cu2ZnSnS4 synthesis. In: 2015 IEEE 42nd Photovoltaic Specialist Conference (PVSC 2015) : New Orleans, Louisiana, USA, 14 - 19 June 2015 . Piscataway, NJ: IEEE, 2015. - ISBN 978-1-4799-7945-5, p. 208-210
doi:10.1109/PVSC.2015.7355638


Witte, W.; Abou-Ras, D.; Albe, K.; Bauer, G.H.; Bertram, F.; Boit, C.; Brueggemann, R.; Christen, J.; Dietrich, J.; Eicke, A.; Hariskos, D.; Maiberg, M.; Mainz, R.; Meessen, M.; Mueller, M.; Neumann, O.; Orgis, T.; Paetel, S.; Pohl, J.; Rodriguez Alvarez, H.; Scheer, R.; Schock, H.-W.; Unold, T.; Weber, A.; Powalla, M.: Gallium gradients in Cu(In,Ga)Se2 thin-film solar cells. Progress in Photovoltaics 23 (2015), p. 717–733
doi:10.1002/pip.2485


Woracek, R.; Penumadu, D.; Kardjilov, N.; Hilger, A.; Boin, M.; Banhart, J.; Manke, I.: Neutron Bragg edge tomography for phase mapping. Physics Procedia 69 (2015), p. 227-236
doi:10.1016/j.phpro.2015.07.032
Open Access Version


Zellmeier, M.; Rappich, J.; Klaus, M.; Genzel, C.; Janietz, S.; Frisch, J.; Koch, N.; Nickel, N.: Side chain engineering of poly-thiophene and its impact on crystalline silicon based hybrid solar cells. Applied Physics Letters 107 (2015), p. 203301/1-4
doi:10.1063/1.4935751


de Biasi, L.; Lieser, G.; Rana, J.; Indris, S.; Dräger, C.; Glatthaar, S.; Mönig, R.; Ehrenberg, H.; Schumacher, G.; Binder, J.; Geßwein, H.: In situ X-ray diffraction and absorption spectroscopy of triru-tile type LiNiFeF6 cathode material for Li-ion batteries. CrystEngComm 17 (2015), p. 6163-6171
doi:10.1039/c5ce00989h