Publications 2016


Bahrdt, J.; Bäcker, H.-J.; Bakos, J.; Bieder, H.-J.; Frentrup, W.; Gaupp, A.; Gottschlich, S.; Kuhn, C.; Rethfeldt, C.; Scheer, M.; Schulz, B.: First Results from Two Novel In-vacuum Magnetic Field Measurement Devices as Built at HZB. In: Christine Petit-Jean-Genaz ... [Ed.] : IPAC 2016, Proceedings of the 7th International Particle Accelerator Conference, Busan, Korea . JACoW, 2016. - ISBN 978-3-95450-147-2, p. THPOW038/1-3=4028-4030
http://accelconf.web.cern.ch/AccelConf/ipac2016/papers/thpow038.pdf
Open Access Version


Barth, C.; Probst, J.; Herrmann, S.; Hammerschmidt, M.; Becker, C.: Numerical characterization of symmetry properties for photonic crystals with hexagonal lattice. In: Dario Gerace ... [Ed.] : Photonic Crystal Materials and Devices XII. Bellingham, Washington: SPIE, 2016 (Proceedings of SPIE ; 9885), p. 988506/1-12
doi:10.1117/12.2227094
Open Access Version


Baumgärtel, P.; Packe, I.: The U125-2 NIM beamline at BESSY II. Journal of Large Scale Research Facilities JLSRF 2 (2016), p. A-53
doi:10.17815/jlsrf-2-76
Open Access Version


Baumgärtel, P.; Witt, M.; Baensch, J.; Fabarius, M.; Erko, A.; Schäfers, F.; Schirmacher, H.: RAY-UI: A Powerful and Extensible User Interface for RAY. AIP Conference Proceedings 1741 (2016), p. 040016/1-4
doi:10.1063/1.4952888


Braig, C.; Löchel, H.; Firsov, A.; Brzhezinskaya, M.; Hafner, A.; Rehanek, J.; Wojcik, M.; Macrander, A.; Assoufid, L.; Erko, A.: Hard x-ray spectroscopy and imaging by a reflection zone plate in the presence of astigmatism. Optics Letters 41 (2016), p. 29-32
doi:10.1364/OL.41.000029
Open Access Version


Eggenstein, F.; Bischoff, P.; Schäfers, F.; Schroeter, T.; Senf, F.; Sokolov, A.; Zeschke, T.; Erko, A.: Survey and adjustment methods applied on an 11 axes high performance reflectometer for synchrotron radiation. AIP Conference Proceedings 1741 (2016), p. 030025/1-4
doi:10.1063/1.4952848


Filatova, E.O.; Konashuk, A.S.; Petrov, Yu.; Ubyivovk, E.; Sokolov, A.A.; Selivanov, A.; Drozd, V.: NEXAFS study of electronic and atomic structure of active layer in Al/indium tin oxide/TiO2 stack during resistive switching. Science and Technology of Advanced Materials 17 (2016), p. 274-284
doi:10.1080/14686996.2016.1182851
Open Access Version


Filatova, E.O.; Konashuk, A.S.; Schäfers, F.; Afanasev, V.V.: Metallization-Induced Oxygen Deficiency of γ-Al2O3 Layers. The Journal of Physical Chemistry C 120 (2016), p. 8979-8985
doi:10.1021/acs.jpcc.6b01352


Gaikovich, P.K.; Polkovnikov, V.N.; Salashchenko, N.N.; Chkhalo, N.I.; Schäfers, F.; Sokolov, A.: Effect of roughness, deterministic and random errors in film thickness on the reflecting properties of aperiodic mirrors for the EUV range. Quantum Electronics 46 (2016), p. 406-413
doi:10.1070/QEL16037


Götze, L.C.; Milke, R.; Zizak, I.; Wirth, R.: In situ monitoring and ex situ TEM analyses of spinel (MgAl2O4) growth between (111)-oriented periclase (MgO) substrates and Al2O3 thin films. Journal of Materials Science 51 (2016), p. 8824-8844
doi:10.1007/s10853-016-0130-2


Hendel, S.; Schäfers, F.; Hävecker, M.; Reichardt, G.; Scheer, M.; Bahrdt, J.; Lips, K.: The EMIL project at BESSY II: Beamline design and performance. AIP Conference Proceedings 1741 (2016), p. 030038/1-4
doi:10.1063/1.4952861


Jansing, C.; Mertins, H.-Ch.; Gaupp, A.; Sokolov, A.; Gilbert, M.; Wahab, H.; Timmers, H.: X-ray natural linear dichroism of graphitic materials across the carbon K-edge: correction for perturbing high-order harmonics. Journal of Physics : Conference Series 712 (2016), p. 012031/1-4
doi:10.1088/1742-6596/712/1/012031
Open Access Version


Jansing, C.; Mertins, H.-Ch.; Gilbert, M.; Wahab, H.; Timmers, H.; Choi, S.-H.; Gaupp, A.; Krivenkov, M.; Varykhalov, A.; Rader, O.; Legut, D.: X-ray natural birefringence in reflection from graphene. Physical Review B 94 (2016), p. 045422/1-12
doi:10.1103/PhysRevB.94.045422


Kewes, G.; Schoengen, M.; Neitzke, O.; Lombardi, P.; Schönfeld, R.; Mazzamuto, G.; Schell, A.; Probst, J.; Wolters, J.; Löchel, B.; Toninelli, C.; Benson, O.: A realistic fabrication and design concept for quantum gates based on single emitters integrated in plasmonic-dielectric waveguide structures. Scientific Reports 6 (2016), p. 28877/1-10
doi:10.1038/srep28877
Open Access Version


Kroll, T.; Kern, J.; Kubin, M.; Ratner, D.; Gul, S.; Fuller, F.; Löchel, H.; Krzywinski, J.; Lutman, A.; Ding, Y.; Dakovski, G.; Moeller, S.; Turner, J.; Alonso-Mori, R.; Nordlund, D.; Rehanek, J.; Weniger, C.; Firsov, A.; Brzhezinskaya, M.; Chatterjee, R.; Lassalle-Kaiser, B.; Sierra, R.; Laksmono, H.; Hill, E.; Borovik, A.; Erko, A.; Föhlisch, A.; Mitzner, R.; Yachandra, V.; Yano, J.; Wernet, P.; Bergmann, U.: X-ray absorption spectroscopy using a self-seeded soft X-ray free-electron laser. Optics Express 24 (2016), p. 22469-22480
doi:10.1364/OE.24.022469
Open Access Version


Mantouvalou, I.; Witte, K.; Martyanov, W.; Jonas, A.; Groetzsch, D.; Streeck, C.; Löchel, H.; Rudolph, I.; Erko, A.; Stiel, H.; Kanngiesser, B.: Single shot near edge x-ray absorption fine structure spectroscopy in the laboratory. Applied Physics Letters 108 (2016), p. 201106/1-4
doi:10.1063/1.4951000


Nayak, M.; Pradhan, P.C.; Lodha, G.S.; Sokolov, A.; Schäfers, F.: Corrigendum: Determining Chemically and Spatially Resolved Atomic Profile of Low Contrast Interface Structure with High Resolution. Scientific Reports 6 (2016), p. 27322/1-7
doi:10.1038/srep27322
Open Access Version


Nayak, M.; Pradhan, P.C.; Lodha, G.S.; Sokolov, A.; Schäfers, F.: Erratum: Determining Chemically and Spatially resolved Atomic Profile of Low Contrast Interface Structure with High Resolution. Scientific Reports 6 (2016), p. 31016/1
doi:10.1038/srep31016
Open Access Version


Peredkov, S.; Peters, S.; Al-Hada, M.; Erko, A.; Neeb, M.; Eberhardt, W.: Structural investigation of supported Cu-n clusters under vacuum and ambient air conditions using EXAFS spectroscopy. Catalysis Science & Technology 6 (2016), p. 6942-6952
doi:10.1039/c6cy00436a


Pryadchenko, V.V.; Srabionyan, V.V.; Kurzin, A.A.; Bulat, N.V.; Shemet, D.B.; Avakyan, L.A.; Belenov, S.V.; Volochaev, V.A.; Zizak, I.; Guterman, V.E.; Bugaev, L.A.: Bimetallic PtCu core-shell nanoparticles in PtCu/C electrocatalysts: Structural and electrochemical characterization. Applied Catalysis A - General 525 (2016), p. 226-236
doi:10.1016/j.apcata.2016.08.008


Roshchupkin, D.; Ortega, L.; Plotitcyna, O.; Erko, A.; Zizak, I.; Vadilonga, S.; Irzhak, D.; Emelin, E.; Buzanov, O.; Leitenberger, W.: Piezoelectric Ca3NbGa3Si2O14 crystal: crystal growth, piezoelectric and acoustic properties. Applied Physics A - Materials Science and Processing 122 (2016), p. 753/1-10
doi:10.1007/s00339-016-0279-1


Schick, D.; Le Guyader, L.; Pontius, N.; Radu, I.; Kachel, T.; Mitzner, R.; Zeschke, T.; Schüssler-Langeheine, C.; Föhlisch, A.; Holldack, K.: Analysis of the halo background in femtosecond slicing experiments. Journal of Synchrotron Radiation 23 (2016), p. 700-711
doi:10.1107/S160057751600401X
Open Access Version (external provider)


Schäfers, F.; Bischoff, P.; Eggenstein, F.; Erko, A.; Gaupp, A.; Künstner, S.; Mast, M.; Schmidt, J.-S.; Senf, F.; Siewert, F.; Sokolov, A.; Zeschke, T.: The at-wavelength metrology facility for UV- and XUV-reflection and diffraction optics at BESSY-II. Journal of Synchrotron Radiation 23 (2016), p. 66-77
https://www.elettra.trieste.it/Conferences/2015/PhotonDiag/
doi:10.1107/S1600577515020615
Open Access Version


Schäfers, F.; Sokolov, A.: The At-Wavelength Metrology Facility at BESSY-II. Journal of Large Scale Research Facilities JLSRF 2 (2016), p. A-50
doi:10.17815/jlsrf-2-72
Open Access Version


Senf, F.; Bijkerk, F.; Eggenstein, F.; Gwalt, G.; Huang, Q.; Kruijs, R.; Kutz, O.; Lemke, S.; Louis, E.; Mertin, M.; Packe, I.; Rudolph, I.; Schäfers, F.; Siewert, F.; Sokolov, A.; Sturm, J.M.; Waberski, C.; Wang, Z.; Wolf, J.; Zeschke, T.; Erko, A.: Highly efficient blazed grating with multilayer coating for tender X-ray energies. Optics Express 24 (2016), p. 13220-13230
doi:10.1364/OE.24.013220
Open Access Version


Siewert, F.; Zeschke, T.; Arnold, T.; Paetzelt, H.; Yashchuk, V.V.: Linear chirped slope profile for spatial calibration in slope measuring deflectometry. Review of Scientific Instruments 80 (2016), p. 051907/1-8
doi:10.1063/1.4950737
Open Access Version


Sokolov, A.; Bischoff, P.; Eggenstein, F.; Erko, A.; Gaupp, A.; Künstner, S.; Mast, M.; Schmidt, J.-S.; Senf, F.; Siewert, F.; Zeschke, T.; Schäfers, F.: At-wavelength metrology facility for soft X-ray reflection optics. Review of Scientific Instruments 87 (2016), p. 052005/1-7
doi:10.1063/1.4950731


Sokolov, A.; Schäfers, F.: POLARIMETER: A Soft X-Ray 8-Axis UHV-Diffractometer at BESSY II. Journal of Large Scale Research Facilities JLSRF 2 (2016), p. A-92
doi:10.17815/jlsrf-2-90
Open Access Version


Soltwisch, V.; Haase, A.; Wernecke, J.; Probst, J.; Schoengen, M.; Burger, S.; Krumrey, M.; Scholze, F.: Correlated diffuse x-ray scattering from periodically nanostructured surfaces. Physical Review B 94 (2016), p. 035419/1-5
doi:10.1103/PhysRevB.94.035419
Open Access Version


Xavier, J.; Probst, J.; Becker, C.: Deterministic composite nanophotonic lattices in large area for broadband applications. Scientific Reports 6 (2016), p. 38744/1-12
doi:10.1038/srep38744
Open Access Version


Yashchuk, V.V.; Artemiev, A.; Centers, G.; Chaubard, A.; Geckeler, R.; Lacey, I.; Marth, H.; McKinney, W.R.; Noll, T.; Siewert, F.; Winter, M.; Zeschke, T.: High precision tilt stage as a key element to a universal test mirror for characterization and calibration of slope measuring instruments. Review of Scientific Instruments 87 (2016), p. 051904/1-12
doi:10.1063/1.4950729
Open Access Version (external provider)


Zaharieva, I.; González-Flores, D.; Asfari, B.; Pasquini, C.; Mohammadi, M.R.; Klingan, K.; Zizak, I.; Loos, S.; Chernev, P.; Dau, H.: Water oxidation catalysis – role of redox and structural dynamics in biological photosynthesis and inorganic manganese oxides. Energy & Environmental Science 9 (2016), p. 2433-2443
doi:10.1039/C6EE01222A
Open Access Version (external provider)