Method: Reflectometry

Reflectometry

Station Energy Range Polarisation Beamline Contact
FemtoSpex-DynaMax 410 - 1333 eV variable Soft X-ray fs-to-ps pulsed undulator radiation variable polarization with Zone Plate Mono for FEMTOS Christian Schüßler-Langeheine
Niko Pontius
Karsten Holldack
Torsten Kachel

IR-Spectroscopy and Microscopy .0006 - 1 eV linearly horizontal/vertical IRIS THz/Infrared Dipole Beamline Ulrich Schade
Ljiljana Puskar
KMC-2 Diffraction 4000 - 15000 eV linear horizontal KMC-2 Daniel Többens
Reflectometer 20 - 2000 eV horizontal Optics Beamline Franz Schäfers
Andrey Sokolov
Resonant Scattering 2000 - 12000 eV horizontal KMC-1 Christian Schüßler-Langeheine
20 - 1900 eV • horizontal
• circular
Soft X-ray dipole variable polarisation with PGM open port + scattering chamber
85 - 1600 eV horizontal U49-2_PGM-1 Undulator PGM horizontal polarisation
100 - 1500 eV variable Soft X-ray undulator radiation variable polarization with SGM and resonant bunch excitation for open
20 - 690 eV variable XUV undulator radiation variable polarization with PGM for meV RIXS + open port
Small Reflectometer 2000 - 12000 eV horizontal KMC-1 Andrey Sokolov
Franz Schäfers
6 - 40 eV horizontal U125-2_NIM
60 - 1300 eV • horizontal
• vertical
• circular
UE56-2_PGM-1
60 - 1300 eV • horizontal
• vertical
• circular
UE56-2_PGM-2
eV search a beamline for me
XUV Diffractometer 120 - 2000 eV • linear any angle (with restrictions)
• circular
UE46_PGM-1 Eugen Weschke
Enrico Schierle