SPEEM

Spin resolved Photoemission Microscope

SPEEM is designed for studying sub-100nm scale magnetoelectronic devices by combining a spin-resolved photoemission microscope with a dedicated microfocus beamline offering full x-ray polarization control. The synergy between the microscopy capabilities of the PEEM and the polarization control of synchrotron radiation makes X-PEEM the ideal tool for spatially resolved and element selective investigation of nanostructures by means of chemical maps (XAS) and magnetic imaging (XMCD and XLD).

Methods

XMLD, XMCD, Time-resolved studies, NEXAFS, X-ray Microscopy, Photoelectron EM, XPS, Spin-resovled PES

Remote access

not possible

Beamline data
Energy range 100 - 1800 eV
Energy resolution 10000 at 700 eV
Flux 1e11 - 1e13
Polarisation variable
Focus size (hor. x vert.) 10 μm (vertical) X 20 μm (Horizontal) at sample position
Phone +49 30 8062 14750
Weitere Details UE49_PGM SPEEM
Station data
Temperature range 45 - 600 K
Pressure range --
Detector --
Manipulators --
Sample holder compatibility --
Additional equipment
Sample size 2mmX2mm to 20mmX20mm
Sample holders Simultaneous temperature, magnetic and electric field control
Magnetic field holders for in- and out of plane magnetic fields up to 100 Oe
Electric field Up to 200 V out of plane
Beam focus size on sample 20(V)X30(H) micrometer
Sample storage in vacuum up to 6
in-situ evaporation Fe, Co, Ni, Al...
in-situ sputtering Ar and O

Magnetic nanostructures are at the heart of modern data storage technology. Typical dimensions of magnetic bits are in the sub-100nm region. In addition novel magnetoelectronics devices such as magnetic random access memory junctions are operated on the sub-100nm m scale. An understanding magnetic properties of such low-dimensional structures is only accessible to spectro-microscopy tools capable of appropriate lateral resolution. This goal is achieved by combining a novel spin-resolved photoemission microscope (SPEEM) with a dedicated microfocus PGM beamline with full x-ray polarization control (UE49-PGMa).

The synergy between the microscopy capabilities of the PEEM and the polarization control of synchrotron radiation makes of X-PEEM the ideal tool for space resolved and element selective investigation of nanostructures by means of chemical maps (XAS) and  magnetic imaging (XMCD and XLD).

For a detailed description of the experimental station as well as for an overview of the experimental possibilities of our microscope, please visit the following link XPEEM to get more information about sample holders and sample environment, possibilities for in-situ sample preparation and time-resolved experiments.