Method: PEEM
Photoemission Electron Microscopy
| Station | Energy Range | Polarisation | Beamline | Contact |
|---|---|---|---|---|
| LEEM-PEEM | 55 - 1500 eV | • horizontal • vertical • circular | UE56-1_SGM | Stefan Cramm |
| RGBL-PEEM | 20 - 1900 eV | • horizontal • circular | PM3 | Dmitry Marchenko |
| 85 - 1600 eV | horizontal | U49-2_PGM-1 | ||
| SMART | 100 - 1800 eV | variable (linear and circular) | UE49_PGM SMART | Thomas Schmidt
Marcel Springer Stephan Pohl |
| SPEEM | 100 - 1800 eV | variable | UE49_PGM SPEEM | Florian Kronast
Sergio Valencia Molina Mohamad-Assaad Mawass |