SISSY I

SISSY I@EMIL

Methods

XRF, XPS, HAXPES

Remote access

depends on experiment - please discuss with Instrument Scientist

Station data
Temperature range -200 - 1000 °C
Pressure range
Detector
  • Scienta EW4000 electron analyzer
  • Bruker Si-drift detector
Manipulators automated 5-axis manipulator
Sample holder compatibility
Additional equipment
  • application of electronic bias to samples
  • deposition chambers
  • UHV sample storage chambers
  • three load locks
Assigned to beamline(s)
UE48_EMIL 80 eV to 2300 eV
CPMU17_EMIL 2000 eV to 10000 eV