LEEM-PEEM

LEEM-PEEM

This photoemission electron microscope is equipped with a new state-of-the-art aberration corrector minimizing electron-optical imperfections and thus, allowing for higher instrument transmission. Simultaneously, better spatial resolution down to 2 nm is achieved as demonstrated in the low-energy (LEEM) mode. In combination with soft x-rays (XPEEM), spatially resolved spectroscopic investigations (NEXAFS, XPS) can be carried out as well as magnetic spectroscopies (XMCD, XMLD). An extension allows performing stroboscopic XPEEM experiments for magnetization dynamics.

Electron-optical layout of the SPECS P90 AC LEEMPEEM

Electron-optical layout of the SPECS P90 AC LEEMPEEM


Methods

PEEM, X-ray Microscopy, NEXAFS, XMCD

Remote access

not possible

Station data
Temperature range 300 - 1600 K
Pressure range 4·10-10 - 1·10-7 mbar
Detector two-stage MCP (Hamamatsu)
Manipulators 5-Axis Piezo-contolled
Sample holder compatibility special SPECS
samples 9mm
Additional equipment
Spatial resolution LEEM-mode 2 nm
Spatial resolution PEEM-mode 20 nm
base pressure 4E-10 mbar
Preparation chamber * Sputtering up to 1.5kV * Sample temp. range 300 - 1200 K * pyrometric temp. measurement * LEED * Auger * gas inlets: Ar, O2, user specific * base pressure 1E-10 mbar

Combined Low-Energy- / Photoemission-Electron-Microscope with aberration correction.

For more details, please contact Stefan Cramm "s.cramm (at) fz-juelich.de".

This microscope is equipped with a new state-of-the-art aberration corrector minimizing electron-optical imperfections, allowing for higher instrument transmission and simultaneously better spatial resolution. In LEEM-Mode, 2 nm have been demonstrated recently. In combination with soft x-rays (XPEEM), spatially-resolved spectroscopic investigations can be carried  out (NEXAFS, XPS) as well as magnetic spectroscopies (XMCD,XMLD). A recently installed extension allows to perform stroboscopic XPEEM experiments for magnetization dynamics.