Method: Reflection

Reflection of light at a surface is influenced by the surface properties of a sample. Hence, analyzing angular dependent intensity or polarization of reflected x-rays or IR light contributes to understanding the detailed surface properties of materials or thin films.

Please find below a list of reflection techniques used at BESSY II. Select one technique to get to a list of BESSY II instruments that employ it.
Acronnym Long name
Ellipsometry Ellipsometry
Polarimetry Polarimetry
Reflectometry Reflectometry
XRF X-ray Fluorescence
XRF Mapping X-ray Fluorescence Mapping
XEOL X-ray excited optical luminescence
Time-resolved reflection Time-resolved reflection