SAMIC-ASAM
Spectroscopy And Microscopy Integrating Chamber / Analytical Spectroscopy And Microscopy
Publikationen
2015Nourbakhsh, A.; Adelmann, C.; Song, Y.; Lee, C.S.; Asselberghs, I.; Huyghebaert, C.; Brizzi, S.; Tallarida, M.; Schmeißer, D.; Van Elshocht, S.; Heyns, M.; Kong, J.; Palacios, T.; De Gendt, S.: Graphene oxide monolayers as atomically thin seeding layers for atomic layer deposition of metal oxides. , Nanoscale 7 (2015), p. 10781-10789
doi: 10.1039/c5nr01128k
2014
Adelmann, C.; Schram, T.; Chew, S.; Woicik, J.; Brizzi, S.; Tallarida, M.; Schmeisser, D.; Horiguchi, N.; Van Elshocht, S.; Ragnarsson, L.: On the scalability of doped hafnia thin films. , Applied Physics Letters 104 (2014), p. 122906/1-4
doi: 10.1063/1.4870075
Cuypers, D.; van Dorp, D.H.; Tallarida, M.; Brizzi, S.; Conard, T.; Rodriguez, L.N.J.; Mees, M.; Arnauts, S.; Schmeisser, D.; Adelmann, C.; De Gendt, S.: Study of InP Surfaces after Wet Chemical Treatments. , ECS Journal of Solid State Science and Technology 3 (2014), p. N3016-N3022
doi: 10.1149/2.005401jss
2013
Cuypers, D.; van Dorp, D.H.; Tallarida, M.; Brizzi, S.; Rodriguez, L.; Conard, T.; Arnauts, S.; Schmeisser, D.; Adelmann, C.: Study of InP Surfaces after Wet Chemical Treatments. , ECS Transactions 58 (2013), p. 297-303
doi: 10.1149/05806.0297ecst
SAMIC-ASAM