Duchoň, T.; Hackl, J.; Mueller, D.N.; Kullgren, D.J.; Du, D.; Senanayake, S.D.; Mouls, C.; Gottlob, D.M.; Khan, M.I.; Cramm, S.; Veltruská, K.; Matolín, V.; Nemšák, S.; Schneider, C.M.: Establishing structure-sensitivity of ceria reducibility: real-time observations of surface-hydrogen interactions. , Journal of Materials Chemistry A 8 (2020), p. 5501–5507

Wilhelm, M.; Giesen, M.; Duchon, T.; Moors, M.; Mueller, D.N.; Hackl, J.; Baeumer, C.; Hamed, M.H.; Cao, L.; Zhang, H.; Petracic, O.; Glöß, M.; Cramm, S.; Nemšák, S.; Wiemann, C.; Dittmann, R.; Schneider, C.M.; Müller, M.: Photoemission electron microscopy of magneto-ionic effects in La0.7Sr0.3MnO3. , APL Materials 8 (2020), p. 111102/1-6


Khan, M.I.; Cramm, S.; Bürgler, D.E.; Parlak, U.; Nemsak, S.; Gottlob, D.M.; Hackl, J.; Doganay, H.; Schneider, C.M.: Current-induced domain wall oscillations in a nanowire imaged by time-resolved photoemission electron microscopy. , Journal of Magnetism and Magnetic Materials 476 (2019), p. 538-545

Stadler, D.; Mueller, D.N.; Brede, T.; Fischer, T.; Schneider, C.M.; Sarkar, A.; Volkert, C.A.; Giesen, M.; Mathur, S.: Magnetic Field-Assisted Chemical Vapor Deposition of Iron Oxide Thin Films: Influence of Field–Matter Interactions on Phase Composition and Morphology. , Journal of Physical Chemistry Letters 10 (2019), p. 6253-6259

Lefler, B.M.; Duchon, T.; Karapetrov, G.; Wang, Y.; Schneider, C.M.; May, S.J.: Reconfigurable lateral anionic heterostructures in oxide thin films via lithographically defined topochemistry. , Physical Review Materials 3 (2019), p. 073802/1-8


Nemšák, S.; Strelcov, E.; Guo, H.; Hoskins, B.D.; Mueller, D.N.; Yulaev, A.; Vlassiouk, I.; Tselev, A.; Schneider, C.M.; Kolmakov, A: In Aqua Electrochemistry Probed by XPEEM: Experimental Setup, Examples, and Challenges. , Topics in Catalysis 61 (2018), p. 2195-2206

Hackl, J.; Duchon, T.; Gottlob, D.M.; Cramm, S.; Veltruska, K.; Matolin, V.; Nemsak, S.; Schneider, C.M.: On the growth mechanisms of polar (100) surfaces of ceria on copper (100). , Surface Science 617 (2018), p. 1-5

Gaul, A.; Emmrich, D.; Ueltzhöffer, T.; Huckfeldt, H.; Doganay, H.; Hackl, J.; Khan, M.; Gottlob, D.; Hartmann, G.; Beyer, A.; Holzinger, D.; Nemsák, S.; Schneider, C.; Gölzhäuser, A.; Reiss, G.; Ehresmann, A.: Size limits of magnetic-domain engineering in continuous in-plane exchange-bias prototype films. , Beilstein Journal of Nanotechnology 9 (2018), p. 2968-2979


Duchon, T.; Hackl, J.; Höcker, J.; Veltruska, K.; Matolin, V.; Falta, J.; Cramm, S.; Nemsak, S.; Schneider, C.M.; Flege, J.I.; Senanayake, S.D.: Exploiting micro-scale structural and chemical observations in real time for understanding chemical conversion: LEEM/PEEM studies over CeOx-Cu(111). , Ultramicroscopy 183 (2017), p. 84-88

Nemsak, S.; Strelcov, E.; Duchon, T.; Guo, H.; Hackl, J.; Yulaev, A.; Vlassiouk, I.; Mueller, D.N.; Schneider, C.M.; Kolmakov, A.: Interfacial Electrochemistry in Liquids Probed with Photoemission Electron Microscopy. , Journal of the American Chemical Society 139 (2017), p. 18138-18141

Baeumer, C.; Valenta, R.; Schmitz, C.; Locatelli, A.; Mentes, T.O.; Rogers, S.P.; Sala, A.; Raab, N.; Nemsak, S.; Shim, M.; Schneider, C.M.; Menzel, S.; Waser, R.; Dittmann, R.: Subfilamentary Networks Cause Cycle-to-Cycle Variability in Memristive Devices. , ACS Nano 11 (2017), p. 6921-6929


Schaab, J.; Krug, I.P.; Doganay, H.; Hackl, J.; Gottlob, D.M.; Khan, M.I.; Nemsak, S.; Maurel, L.; Langenberg, E.; Algarabel, P.A.; Pardo, J.A.; Schneider, C.M.; Meier, D.: Contact-Free Mapping of Electronic Transport Phenomena of Polar Domains in SrMnO3 Films. , Physical Review Applied 5 (2016), p. 054009/1-7

Baeumer, C.; Schmitz, C.; Marchewka, A.; Mueller, D.N.; Valenta, R.; Hackl, J.; Raab, N.; Rogers, S.P.; Khan, M.I.; Nemsak, S.; Shim, M.; Menzel, S.; Schneider, C.M.; Waser, R.; Dittmann, R.: Quantifying redox-induced Schottky barrier variations in memristive devices via in operando spectromicroscopy with graphene electrodes. , Nature Communications 7 (2016), p. 12398/1-7


Gottlob, D.M.; Doganay, H.; Nickel, F.; Cramm, S.; Krug, I.P.; Nemsak, S.; Schneider, C.M.: Microscopic analysis of the composition driven spin-reorientation transition in NixPd1-x/Cu(001). , Ultramicroscopy 159 (2015), p. 503-507

Ueltzhöffer, T.; Schmidt, C.; Krug, I.; Nickel, F.; Gottlob, D.; Ehresmann, A.: Néel walls between tailored parallel-stripe domains in IrMn/CoFe exchange bias layers. , Journal of Applied Physics 117 (2015), p. 123904

Becher, C.; Maurel, L.; Aschauer, U.; Lilienblum, M.; Magén, C.; Meier, D.; Langenberg, E.; Trassin, M.; Blasco, J.; Krug, I.P.; Algabarel, P.A.; Spaldin, N.A.; Pardo, J.A.; Fiebig, M.: Strain-induced electrical coupling of electrical polarization and structural defects in SrMnO3 films. , Nature Nanotechnology 10 (2015), p. 661-665

Doganay, H.; Krug, I.P.; Schubert, J.; Cramm, S.; Gottlob, D.M.; Nickel, F.; Schneider, C.M.: Tuning the orbital ordering in La0.7Sr0.3MnO3 thin films in all-oxide hybrids. , EPL 109 (2015), p. 67007/1-6


Schaab, J.; Krug, I.P.; Nickel, F.; Gottlob, D.M.; Doganay, H.; Cano, A.; Hentschel, M.; Yan, Z.; Bourret, E.; Schneider, C.M.; Ramesh, R.; Meier, D.: Imaging and characterization of conducting ferroelectric domain walls by photoemission electron microscopy. , Applied Physics Letters 104 (2014), p. 232904/1-4

Miyamachi, T.; Kawagoe, T.; Imada, S.; Tsunekawa, M.; Fujiwara, H.; Geshi, M.; Sekiyama, A.; Fukumoto, K.; Chang, F.H.; Lin, H.J.; Kronast, F.; Duerr, H.; Chen, C.T.; Suga, S.: Spin reorientation and large magnetic anisotropy of metastable bcc Co islands on Au(001). , Physical Review B 90 (2014), p. 174410/1-7


Nickel, F.; Gottlob, D.M.; Krug, I.P.; Doganay, H.; Cramm, S.; Kaiser, A.M.; Lin, G.; Makarov, D.; Schmidt, O.G.; Schneider, C.M.: Time-resolved magnetic imaging in an aberration-corrected, energy-filtered photoemission electron microscope. , Ultramicroscopy 130 (2013), p. 54-62