meV RIXS

High-resolution RIXS of solids in the XUV regime at UE112-PGM-1

Publikationen

2022

Liu, C.-Y.; Ruotsalainen, K.; Bauer, K.; Decker, R.; Pietzsch, A.; Föhlisch, A.: Excited-state exchange interaction in NiO determined by high-resolution resonant inelastic x-ray scattering at the Ni M2,3 edges. , Physical Review B 106 (2022), p. 035104/1-7
doi: 10.1103/PhysRevB.106.035104

Bauer, K.; Schmidt, J.-S.; Eggenstein, F.; Decker, R.; Ruotsalainen, K.; Pietzsch, A.; Blume, T.; Liu, C.-Y.; Weniger, C.; Siewert, F.; Buchheim, J.; Gwalt, G.; Senf, F.; Bischoff, P.; Schwarz, L.; Effland, K.; Mast, M.; Zeschke, T.; Ivo, R.; Meißner, A.; Föhlisch, A.: The meV XUV-RIXS facility at UE112-PGM1 of BESSY II. , Journal of Synchrotron Radiation 29 (2022), p. 908
doi: 10.1107/S1600577522003551

meV RIXS