PTB Laboratory at BESSY II

PTB Laboratory at BESSY II

Publications

2021

Li, J.; Dagar, J.; Shargaieva, O; Flatken, M.A.; Köbler, H.; Fenske, M.; Schultz, C.; Stegemann, B.; Just, J.; Többens, D.M.; Abate, A.; Munir, R.; Unger, E.: 20.8% Slot-Die Coated MAPbI(3) Perovskite Solar Cells by Optimal DMSO-Content and Age of 2-ME Based Precursor Inks. , Advanced Energy Materials 11 (2021), p. 2003460/1-8
doi: 10.1002/aenm.202003460

Seeger, S.; Osan, J.; Czömpöly, O.; Gross, A.; Stosnach, H.; Stabile, L.; Ochsenkuehn-Petropoulou, M.; Tsakanika, L.A.; Lymperopoulou, T.; Goddard, S.; Fiebig, M.; Gaie-Levrel, F.; Kayser, Y.; Beckhoff, B.: Quantification of Element Mass Concentrations in Ambient Aerosols by Combination of Cascade Impactor Sampling and Mobile Total Reflection X-ray Fluorescence Spectroscopy. , Atmosphere 12 (2021), p. 309/1-18
doi: 10.3390/atmos12030309

2020

Szwedowski-Rammert, V.; Hönicke, P.; Wu, M.; Waldschläger, U.; Gross, A.; Baumann, J.; Goetzke, G.; Delmotte, F.; Meltchakov, E.; Kanngießer, B.; Jonnard, P.; Mantouvalou, I.: Laboratory grazing-incidence X-ray fluorescence spectroscopy as an analytical tool for the investigation of sub-nanometer CrSc multilayer water window optics. , Spectrochimica Acta B 174 (2020), p. 105995/1-6
doi: 10.1016/j.sab.2020.105995

Al-Ashouri, A.; Köhnen, E.; Bor, L.; Magomedov, A.; Hempel, H.; Caprioglio, P.; Márquez, J.; Morales Vilches, A.B.; Kasparavicius, E.; Smith, J.A.; Phung, N.; Menzel, D.; Grischek, M.; Kegelmann, L.; Skroblin, D.; Gollwitzer, C.; Malinauskas, T.; Jošt, M.; Matic, G.; Rech, B.; Schlatmann, R.; Topic, M.; Korte, L.; Abate, A.; Stannowski, B.; Neher, D.; Stolterfoht, M.; Unold, T.; Getautis, V.; Albrecht, S.: Monolithic perovskite/silicon tandem solar cell with >29% efficiency by enhanced hole extraction. , Science 370 (2020), p. 1300-1309
doi: 10.1126/science.abd4016

Wansleben, M.; Vinson, J.; Wählisch, A.; Bzheumikhova, K.; Hönicke, P.; Beckhoff, B.; Kayser, Y.: Speciation of iron sulfide compounds by means of X-ray emission spectroscopy using a compact full-cylinder von Hamos spectrometer. , Journal of Analytical Atomic Spectrometry 35 (2020), p. 2679-2685
doi: 10.1039/D0JA00244E

2019

Mantouvalou, I.; Staeck, S.; Jonas, A.; Grötzsch, D.; Spanier, M.; Baumann, J.; Witte, K.; Unterumsberger, R.; Müller, M.; Kanngießer, B.: A compact and versatile grating spectrograph for soft X-ray emission analysis. , Review of Scientific Instruments 90 (2019), p. 106105/1-3
doi: 10.1063/1.5118216

Barrière, N.; Vacanti, G.; Verhoeckx, S.; Hauser, E.; Vervest, M.; Keek, L.; Okma, B.; Landgraf, B.; Günther, R.; Voruz, L.; Girou, D.; Babi¿, L.; Collon, M.; Beijersbergen, M.; Bavdaz, M.; Wille, E.; Fransen, S.; Haneveld, J.; Koelewijn, A.; Start, R.; Wijnperle, M; Lankwarden, J.; Van Baren, C.; Eigenraam, A.; Müller, P.; Handick, E.; Krumrey, M.; Valsecchi, G.: Assembly of confocal silicon pore optic mirror modules for Athena. , In: Stephen L. O'Dell, Giovanni Pareschi [Ed.] : Optics for EUV, X-Ray, and Gamma-Ray Astronomy IX : 13-15 August 2019, San Diego, California, United States. Bellingham, Wash.: SPIE, 2019 (Proceedings of SPIE ; 11119). - ISBN 978-1-5106-2931-8, p. 111190J/1-9
doi: 10.1117/12.2530706

Luong, V.; Philipsen, V.; Opsomer, K.; Rip, J.; Hendrickx, E.; Heyns, M.; Detavernier, C.; Laubis, C.; Scholze, F.: Assessing stability of metal tellurides as alternative photomask materials for extreme ultraviolet lithography. , Journal of Vacuum Science & Technology B 37 (2019), p. 061607/1-9
doi: 10.1116/1.5125662

Egger, L.; Kollmann, B.; Hurdax, P.; Lüftner, D.; Yang, X.; Weiss, S.; Gottwald, A.; Richter, M.; Koller, G.; Soubatch, S.; Tautz, F.; Puschnig, P.; Ramsey, M.: Can photoemission tomography be useful for small, strongly-interacting adsorbate systems? , New Journal of Physics 21 (2019), p. 043003/1-9
doi: 10.1088/1367-2630/ab0781

Schavkan, A.; Gollwitzer, C.; Garcia-Diez, R.; Krumrey, M.; Minelli, C.; Bartczak, D.; Cuello-Nunez, S.; Goenaga-Infante, H.; Rissler, J.; Sjostrom, E.; Baur, G.B.; Vasilatou, K.; Shard, A.G.: Correction: Number Concentration of Gold Nanoparticles in Suspension: SAXS and spICPMS as Traceable Methods Compared to Laboratory Methods. , Nanomaterials 9 (2019), p. 1060/1
doi: 10.3390/nano9081060

Kreft, S.; Radnik, J.; Rabeah, J.; Agostini, G.; Pohl, M.; Gericke, E.; Hoell, A.; Beller, M.; Junge, H.; Wohlrab, S.: Dye activation of heterogeneous Copper(II)-Species for visible light driven hydrogen generation. , International Journal of Hydrogen Energy 44 (2019), p. 28409-28420
doi: 10.1016/j.ijhydene.2019.04.006

Wansleben, M.; Kayser, Y.; Hönicke, P.; Holfelder, I.; Wählisch, A.; Unterumsberger, R.; Beckhoff, B.: Experimental determination of line energies, line widths and relative transition probabilities of the Gadolinium L x-ray emission spectrum. , Metrologia 56 (2019), p. 065007/1-11
doi: 10.1088/1681-7575/ab40d2

Sturm, J.M.; Liu, F.; Darlatt, E.; Kolbe, M.; Aarnink, A.A.I.; Lee, C.J.; Bijkerk, F.: Extreme UV secondary electron yield measurements of Ru, Sn, and Hf oxide thin films. , Journal of Micro/Nanolithography, MEMS and MOEMS 18 (2019), p. 033501/1-7
doi: 10.1117/1.JMM.18.3.033501

Wendt, Robert: Formation and Growth Studies of Microwave-assisted Nanoparticle Syntheses. , Humboldt-Universität zu Berlin, 2019

Andrle, A.; Hönicke, P.; Schneider, P.; Kayser, Y.; Hammerschmidt, M.; Burger, S.; Scholze, F.; Beckhoff, B.; Soltwisch, V.: Grazing incidence X-ray fluorescence based characterization of nanostructures for element sensitive profile reconstruction. , In: Bernd Bodermann, Karsten Frenner [Ed.] : Modeling Aspects in Optical Metrology VII : 24-26 June 2019, Munich, Germany. Bellingham, Wash.: SPIE, 2019 (Proceedings of SPIE - The International Society for Optical Engineering ; 11057). - ISBN 978-1-5106-2793-2 , p. 110570M/1-9
doi: 10.1117/12.2526082

Yang, X.; Egger, L.; Hurdax, P.; Kaser, H.; Lüftner, D.; Bocquet, F.C.; Koller, G.; Gottwald, A.; Tegeder, P.; Richter, M.; Ramsey, M.G.; Puschnig, P.; Soubatch, S.; Tautz, F.S.: Identifying surface reaction intermediates with photoemission tomography. , Nature Communications 10 (2019), p. 3189/1-6
doi: 10.1038/s41467-019-11133-9

Massahi, S.; Christensen, F.; Ferreira, D.; Jafari, A.; Svendsen, S.; Henriksen, P.; Shortt, B.; Ferreira, I.; Bavdaz, M.; Collon, M.; Landgraf, B.; Girou, D.; Langer, A.; Schönberger, W.; Wellner, T.; Krumrey, M.; Cibik, L.: Installation and commissioning of the silicon pore optics coating facility for the ATHENA mission. , In: Stephen L. O'Dell, Giovanni Pareschi [Ed.] : Optics for EUV, X-Ray, and Gamma-Ray Astronomy IX : 13-15 August 2019, San Diego, California, United States. Bellingham, Wash.: SPIE, 2019 (Proceedings of SPIE ; 11119). - ISBN 978-1-5106-2931-8, p. 111190F
doi: 10.1117/12.2528351

Nieminen, H.-E.; Miikkulainen, V.; Settipani, D.; Simonelli, L.; Hoenicke, P.; Zech, C.; Kayser, Y.; Beckhoff, B.; Honkanen, A.-P.; Heikkila, M.J.; Mizohata, K.; Meinander, K.; Ylivaara, O.M.E.; Huotari, S.; Ritala, M.: Intercalation of Lithium Ions from Gaseous Precursors into β-MnO2 Thin Films Deposited by Atomic Layer Deposition. , The Journal of Physical Chemistry C 123 (2019), p. 15802-15814
doi: 10.1021/acs.jpcc.9b03039

Wu, C.; Bender, M.; Jonckheere, R.; Scholze, F.; Bekman, H.; Van Putten, M.; De Zanger, R.; Ebeling, R.; Westerhout, J.; Nicolai, K.; Van Veldhoven, J.; De Rooij-Lohmann, V.; Kievit, O.; Deutz, A.: Lifetime test on EUV photomask with EBL2. , In: Akihiko Ando [Ed.] : Photomask Japan 2019: XXVI Symposium on Photomask and Next-Generation Lithography Mask Technology : 16-18 April 2019, Yokohama, Japan. Bellingham, Wash: SPIE, 2019 (Proceedings of SPIE ; 11178). - ISBN 978-1-5106-3073-4, p. 111780/1-6
doi: 10.1117/12.2537734

Schenk, T.; Anspoks, A.; Jonane, I.; Ignatans, R.; Johnson, B.S.; Jones, J. L.; Tallarida, M.; Marini, C.; Simonelli, L.; Hoenicke, P.; Richter, C.; Mikolajick, T.; Schroeder, U.: Local structural investigation of hafnia-zirconia polymorphs in powders and thin films by X-ray absorption spectroscopy. , Acta Materialia 180 (2019), p. 158-169
doi: 10.1016/j.actamat.2019.09.003

Philipsen, V.; Luong, K.V.; Opsomer, K.; Souriau, L.; Rip, J.; Detavernier, C.; Erdmann, A.; Evanschitzky, P.; Laubis, C.; Hoenicke, P.; Soltwisch, V.; Hendrickx, E.: Mask absorber development to enable next-generation EUVL. , In: Akihiko Ando ... [Ed.] : Photomask Japan 2019: XXVI Symposium on Photomask and Next-Generation Lithography Mask Technology, PHOTOMASK JAPAN 2019 | 16-18 APRIL 2019. Bellingham, WA: SPIE, 2019 (Proceedings of SPIE : 11178), p. 111780F/1-7
doi: 10.1117/12.2537967

Lin, H.-L.; Fu, W.-E.; Weng, H.-F.; Misumi, I.; Sugawara, K.; Gonda, S.; Takahashi, K.; Takahata, K.; Ehara, K.; Takatsuji, T.; Fujimoto, T.; Salas, J.; Dirscherl, K.; Garnas, J.; Damasceno, J.; de Oliveira, J.C.V.; Emanuele, E.; Picotto, G.B.; Kim, C.S.; Cho, S.J.; Motzkus, C.; Meli, F.; Gao, S.; Shi, Y.; Liu, J.; JAmting, A K.; Catchpoole, H.J.; Lawn, M.A.; Herrmann, J.; Coleman, V.A.; Adlem, L.; Kruger, O.A.; Buajarern, J.; Buhr, E.; Danzebrink, H.-U.; Krumrey, M.; Bosse, H.: Nanoparticle Characterization - Supplementary Comparison on Nanoparticle Size. , Metrologia 56 (2019), p. 04004/1-93
doi: 10.1088/0026-1394/56/1A/04004

Philipsen, V.; Vu Luong, K.; Opsomer, K.; Detavernier, C.; Hendrickx, E.; Erdmann, A.; Evanschitzky, P.; van de Kruijs, R.W.E.; Heidarnia-Fathabad, Z.; Scholze, F.; Laubis, C.: Novel EUV mask absorber evaluation in support of next-generation EUV imaging. , In: Emily E. Gallagher, Jed H. Rankin [Ed.] : Photomask Technology 2018 : 17-19 September 2018, Monterey, California, United States. Bellingham, Wash.: SPIE, 2019 (Proceedings of SPIE ; 10810). - ISBN 978-1-5106-2215-9, p. 108100C/1-13
doi: 10.1117/12.2501799

Schavkan, A.; Gollwitzer, C.; Garcia-Diez, R.; Krumrey, M.; Minelli, C.; Bartczak, D.; Cuello-Nuñez, S.; Goenaga-Infante, H.; Rissler, J.; Sjöström, E.; Baur, G.B.; Vasilatou, K.; Shard, A.G.: Number Concentration of Gold Nanoparticles in Suspension: SAXS and spICPMS as Traceable Methods Compared to Laboratory Methods. , Nanomaterials 9 (2019), p. 502/1-20
doi: 10.3390/nano9040502

Bavdaz, M.; Wille, E.; Ayre, M.; Ferreira, I.; Shortt, B.; Fransen, S.; Collon, M.; Vacanti, G.; Barrière, N.; Landgraf, B.; Start, R.; Van Baren, C.; Della Monica Ferreira, D.; Massahi, S.; Christensen, F.; Krumrey, M.; Burwitz, V.; Pareschi, G.; Valsecchi, G.; Oliver, P.; Seidel, A.; Korhonen, T.: Optics developments for ATHENA. , In: Stephen L. O'Dell, Giovanni Pareschi [Ed.] : Optics for EUV, X-Ray, and Gamma-Ray Astronomy IX : 13-15 August 2019, San Diego, California, United States. Bellingham, Wash.: SPIE, 2019 (Proceedings of SPIE ; 11119). - ISBN 978-1-5106-2931-8, p. 111190D/1-12
doi: 10.1117/12.2530912

Mohsin, G.F.; Schmitt, F.-J.; Kanzler, C.; Hoehl, A.; Hornemann, A.: PCA-based identification and differentiation of FTIR data from model melanoidins with specific molecular compositions. , Food Chemistry 281 (2019), p. 106-113
doi: 10.1016/j.foodchem.2018.12.054

Svendsen, S.; Massahi, S.; Ferreira, D.; Christensen, F.; Jafari, A.; Henriksen, P.; Collon, M.; Landgraf, B.; Girou, D.; Krumrey, M.; Cibik, L.; Schubert, A.; Handick, E.; Shortt, B.: Performance and time stability of Ir/SiC X-ray mirror coatings for ATHENA. , In: Stephen L. O'Dell, Giovanni Pareschi [Ed.] : Optics for EUV, X-Ray, and Gamma-Ray Astronomy IX : 13-15 August 2019, San Diego, California, United States. Bellingham, Wash.: SPIE, 2019 (Proceedings of SPIE ; 11119). - ISBN 978-1-5106-2931-8
doi: 10.1117/12.2528664

Hönicke, P.; Detlefs, B.; Nolot, E.; Kayser, Y.; Mühle, U.; Pollakowski, B.; Beckhoff, B.: Reference-free grazing incidence x-ray fluorescence and reflectometry as a methodology for independent validation of x-ray reflectometry on ultrathin layer stacks and a depth-dependent characterization. , Journal of Vacuum Science & Technology A 37 (2019), p. 041502/1-6
doi: 10.1116/1.5094891

Collon, M.J.; Vacanti, G.; Barrière, N.M.; Landgraf, B.; Günther, R.; Vervest, M.; Voruz, L.; Verhoex, S.; van der Hoeven, R.; van Straeten, K.; Chatbi, A.; Girou, D.; Beijersbergen, M.W.; Bavdaz, M.; Wille, E.; Fransen, S.; Shortt, B.; Ferreira, I.; Haneveld, J.; Koelewijn, A.; Booysen, K.; Wijnperle, M.; Lankwarden, J.-J.; van Baren, C.; Eigenraam, A.; den Herder, J.W.; Müller, P.; Krumrey, M.; Burwitz, V.; Pareschi, G.; Massahi, S.; Della Monica Ferreira, D.; Christensen, F.E.; Valsecchi, G.; Oliver, P.; Chequer, I.; Ball, K.; Zuknik, K.-H.; Vernani, D.: Silicon pore optics mirror module production and testing. , In: Zoran Sodnik ... [Ed.] : International Conference on Space Optics — ICSO 2018 : Chania, Greece, 9-12 October 2018. Bellingham, WA, USA: SPIE, 2019 (Proceedings of SPIE ; 11180), p. 1118023/1-11
doi: 10.1117/12.2535994

Collon, M.; Vacanti, G.; Barrière, N.; Landgraf, B.; Günther, R.; Vervest, M.; Voruz, L.; Verhoeckx, S.; Babi¿, L.; Keek, L.; Girou, D.; Okma, B.; Hauser, E.; Beijersbergen, M.; Bavdaz, M.; Wille, E.; Fransen, S.; Shortt, B.; Ferreira, I.; Haneveld, J.; Koelewijn, A.; Start, R..; Wijnperle, M.; Lankwarden, J.; Van Baren, C.; Hieltjes, P.; Den Herder, J.; Müller, P.; Handick, E.; Krumrey, M.; Bradshaw, M.; Burwitz, V.; Pareschi, G.; Massahi, S.; Svendsen, S.; Della Monica Ferreira, D.; Christensen, F.; Valsecchi, G.; Oliver, P.; Chequer, I.; Ball, K.: Status of the silicon pore optics technology. , In: Stephen L. O'Dell, Giovanni Pareschi [Ed.] : Optics for EUV, X-Ray, and Gamma-Ray Astronomy IX : 13-15 August 2019, San Diego, California, United States . Bellingham, Wash.: SPIE, 2019 (Proceedings of SPIE ; 11119). - ISBN 978-1-5106-2931-8, p. 111190L/1-8
doi: 10.1117/12.2530696

Greco, G.; Mazzio, K.A.; Dou, X.; Gericke, E.; Wendt, R.; Krumrey, M.; Passerini, S.: Structural Study of Carbon-Coated TiO2 Anatase Nanoparticles as High-Performance Anode Materials for Na-Ion Batteries. , ACS Applied Energy Materials 2 (2019), p. 7142-7151
doi: 10.1021/acsaem.9b01101

Gottwald, A.; Kaser, H.; Kolbe, M.: The U125 insertion device beamline at the Metrology Light Source. , Journal of Synchrotron Radiation 26 (2019), p. 535-542
doi: 10.1107/S1600577518018428

Gottwald, A.; Wiese, K.; Siefke, T.; Richter, M.: Validation of thin film TiO2 optical constants by reflectometry and ellipsometry in the VUV spectral range. , Measurement Science & Technology 30 (2019), p. 045201/1-6
doi: 10.1088/1361-6501/ab0359

Jafari, A.; Christensen, F.E.; Massahi, S.; Svendsen, S.; Vu, L.M.; Henriksen, P.L.; Shortt, B.; Krumrey, M.; Cibik, L.; Handick, E.; Ferreira, D.D.M.: X-ray reflectometry of a platinum coating as reference sample for the ATHENA coating development. , In: Stephen L. O'Dell, Giovanni Pareschi [Ed.] : Optics for EUV, X-Ray, and Gamma-Ray Astronomy IX : 13-15 August 2019, San Diego, California, United States. Bellingham, Wash.: SPIE, 2019 (Proceedings of SPIE ; 11119). - ISBN 978-1-5106-2931-8, p. 111191K/1-7
doi: 10.1117/12.2527557

Vacanti, G.; Barrière, N.; Collon, M.; Hauser, E.; Babic, L.; Bayerle, A.; Girou, D.; Günther, R.; Keek, L.; Landgraf, B.; Okma, B.; Verhoeckx, S.; Vervest, M.; Voruz, L.; Bavdaz, M.; Wille, E.; Krumrey, M.; Müller, P.; Handick, E.: X-ray testing of silicon pore optics. , In: Stephen L. O'Dell, Giovanni Pareschi [Ed.] : Optics for EUV, X-Ray, and Gamma-Ray Astronomy IX : 13-15 August 2019, San Diego, California, United States. Bellingham, Wash.: SPIE, 2019 (Proceedings of SPIE ; 11119). - ISBN 978-1-5106-2931-8, p. 111190I/1-9
doi: 10.1117/12.2530977

2018

Menesguen, Y.; Lepy, M.-C.; Sampaio, J.M.; Marques, J.P.; Parente, F.; Guerra, M.; Indelicato, P.; Santos, J.P.; Hoenicke, P.; Beckhoff, B.: A combined experimental and theoretical approach to determine X-ray atomic fundamental quantities of tin. , X-ray Spectrometry 47 (2018)
doi: 10.1002/xrs.2948

Unterumsberger, R.; Hoenicke, P.; Colaux, J.L.; Jeynes, C.; Wansleben, M.; Mueller, M.; Beckhoff, B.: Accurate experimental determination of gallium K- and L3-shell XRF fundamental parameters. , Journal of Analytical Atomic Spectrometry 33 (2018), p. 1003–1013
doi: 10.1039/c8ja00046h

Bartczak, D.; Davies, J.; Gollwitzer, C.; Krumrey, M.; Goenaga-Infante, H.: Changes in silica nanoparticles upon internalisation by cells: size, aggregation/agglomeration state, mass- and number-based concentrations. , Toxicology Research 7 (2018), p. 172-181
doi: 10.1039/c7tx00323d

Keister, J.; Cibik, L.; Schreiber, S.; Krumrey, M.: Characterization of a quadrant diamond transmission X-ray detector including a precise determination of the mean electron-hole pair creation energy. , Journal of Synchrotron Radiation 25 (2018), p. 407-412
doi: 10.1107/S1600577517017659

Dialameh, M.; Lupi, F.F.; Hoenicke, P.; Kayser, Y.; Beckhoff, B.; Weimann, T.; Fleischmann, C.; Vandervorst, W.; Dubcek, P.; Pivac, B.; Perego, M.; Seguini, G.; De Leo, N.; Boarino, L.: Development and Synchrotron-Based Characterization of Al and Cr Nanostructures as Potential Calibration Samples for 3D Analytical Techniques. , Physica Status Solidi A 215 (2018), p. 1700866/1-8
doi: 10.1002/pssa.201700866

Bavdaz, M.; Wille, E.; Ayre, M.; Ferreira, I.; Shortt, B.; Fransen, S.; Collon, M.; Vacanti, G.; Barrière, N.; Landgraf, B.; Sforzini, J.; Booysen, K.; Van Baren, C.; Zuknik, K.; Della Monica Ferreira, D.; Massahi, S.; Christensen, F.; Krumrey, M.; Müller, P.; Burwitz, V.; Pareschi, G.; Spiga, D.; Valsecchi, G.; Vernani, D.; Oliver, P.; Seidel, A.: Development of the ATHENA Mirror. , In: Jan-Willem A. den Herder ... [Ed.] : Space Telescopes and Instrumentation 2018: Ultraviolet to Gamma Ray. Bellingham, WA USA: SPIE, 2018 Proceedings of SPIE ; 10699, p. 106990X/1-16
doi: 10.1117/12.2313296

Soltwisch, V.; Hoenicke, P.; Kayser, Y.; Eilbracht, J.; Probst, J.; Scholze, F.; Beckhoff, B.: Element sensitive reconstruction of nanostructured surfaces with finite elements and grazing incidence soft X-ray fluorescence. , Nanoscale 10 (2018), p. 6177-6185
doi: 10.1039/c8nr00328a

Radunz, S.; Schavkan, A.; Wahl, S.; Würth, C.; Tschiche, H.; Krumrey, M.; Resch-Genger, U.: Evolution of Size and Optical Properties of Upconverting Nanoparticles during High-Temperature Synthesis. , The Journal of Physical Chemistry C 122 (2018), p. 28958-28967
doi: 10.1021/acs.jpcc.8b09819

Menesguen, Y.; Lepy, M.-C.; Hoenicke, P.; Mueller, M.; Unterumsberger, R.; Beckhoff, B.; Hoszowska, J.; Dousse, J.-Cl.; Blachucki, W.; Ito, Y.; Yamashita, M.; Fukushima, S.: Experimental determination of the x-ray atomic fundamental parameters of nickel. , Metrologia 55 (2018), p. 56-66
doi: 10.1088/1681-7575/aa9b12

Vernani, D.; Blum, S.; Seure, T.; Bavdaz, M.; Wille, E.; Barriere, N.; Collon, M.; Vacanti, G.; Cibik, L.; Krumrey, M.; Mueller, P.; Burwitz, V.: Integration of the Athena mirror modules: development status of the indirect and direct X-ray methods. , In: Makenzie Lystrup ... [Ed.] : Space Telescopes and Instrumentation 2018: Optical, Infrared, and Millimeter Wave : 10-15 June 2018, Austin, Texas, United States. Bellingham, Washington, USA: SPIE, 2018 (Proceedings of SPIE ; 10698). - ISBN 978-1-5106-1949-4, p. 1069910
doi: 10.1117/12.2312583

Minelli, C.; Sikora, A.; Garcia-Diez, R.; Sparnacci, K.; Gollwitzer, C.; Krumrey, M.; Shard, A.: Measuring the size and density of nanoparticles by centrifugal sedimentation and flotation. , Analytical Methods 10 (2018), p. 1725-1732
doi: 10.1039/c8ay00237a

Della Monica Ferreira, D.; Svendsen, S.; Massahi, S.; Jafari, A.; Vu, L.M.; Korman, J.; Gellert, N.; Christensen, F.E.; Kadkhodazadeh, S.; Kasama, T.; Shortt, B.; Bavdaz, M.; Collon, M.J.; Landgraf, B.; Krumrey, M.; Cibik, L.; Schreiber, S.; Schubert, A.: Performance and Stability of Mirror Coatings for the ATHENA Mission. , In: Jan-Willem A. den Herder ... [Ed.] : Space Telescopes and Instrumentation 2018: Ultraviolet to Gamma Ray. Bellingham, WA USA: SPIE, 2018 Proceedings of SPIE ; 10699, p. 106993K/1-12
doi: 10.1117/12.2313275

Unterumsberger, R.; Hoenicke, P.; Pollakowski-Herrmann, B.; Mueller, M.; Beckhoff, B.: Relative L3 transition probabilities of titanium compounds as a function of the oxidation state using high-resolution X-ray emission spectrometry. , Spectrochimica Acta B 145 (2018), p. 71-78
doi: 10.1016/j.sab.2018.04.008

Coric, M.; Saxena, N.; Pflüger, M.; Müller-Buschbaum, P.; Krumrey, M.; Herzig, E.M.: Resonant Grazing-Incidence Small-Angle X-ray Scattering at the Sulfur K-Edge for Material-Specific Investigation of Thin-Film Nanostructures. , Journal of Physical Chemistry Letters 9 (2018), p. 3081-3086
doi: 10.1021/acs.jpclett.8b01111

Collon, M.J.; Vacanti, G.; Barriere, N.; Landgraf, B.; Guenther, R.; Vervest, M.; Van Der Hoeven, R.; Chatbi, A.; Girou, D.; Sforzini, J.; Beijersbergen, M.W.; Bavdaz, M.; Wille, E.; Fransen, S.; Shortt, B.; Haneveld, J.; Booysen, K.; Koelewijn, A.; Wijnperle, M.; Lankwarden, J.; Van Baren, C.; Eigenraam, A.; Müller, P.; Krumrey, M.; Burwitz, V.; Spiga, D.; Pareschi, G.; Massahi, S.; Christensen, F.; Della Monica Ferreira, D.; Valsecchi, G.; Oliver, P.; Chequer, I.; Ball, K.; Zuknik, K.-H.: Silicon Pore Optics Mirror Module Production and Testing. , In: Jan-Willem A. den Herder ... [Ed.] : Space Telescopes and Instrumentation 2018: Ultraviolet to Gamma Ray. Bellingham, WA USA: SPIE, 2018 Proceedings of SPIE ; 10699, p. 106990Y/1-11
doi: 10.1117/12.2314479

Guerra, M.; Sampaio, J.M.; Parente, F.; Indelicato, P.; Hoenicke, P.; Mueller, M.; Beckhoff, B.; Marques, J.P.; Santos, J.P.: Theoretical and experimental determination of K- and L-shell x-ray relaxation parameters in Ni. , Physical Review A 97 (2018), p. 042501/1-10
doi: 10.1103/PhysRevA.97.042501

Noll, D.; Hoenicke, P.; Kayser, Y.; Wagner, S.; Beckhoff, B.; Schwalke, U.: Transfer-Free In Situ CCVD Grown Nanocrystalline Graphene for Sub-PPMV Ammonia Detection. , ECS Journal of Solid State Science and Technology 7 (2018), p. Q3108-Q3113
doi: 10.1149/2.0171807jss

Do, A.; Briat, M.; Baton, S.; Krumrey, M.; Lecherbourg, L.; Loupias, B.; Pérez, F.; Renaudin, P.; Rubbelynck, C.; Troussel, P.: Two-channel high-resolution quasi-monochromatic X-ray imager for Al and Ti plasma. , Review of Scientific Instruments 89 (2018), p. 113702/1-6
doi: 10.1063/1.5042069

2017

Bartl, G.; Becker, P.; Beckhoff, B.; Bettin, H.; Beyer, E.; Borys, M.; Busch, I.; Cibik, L.; D'Agostino, G.; Darlatt, E.; Di Luzio, M.; Fujii, K.; Fujimoto, H.; Fujita, K.; Kolbe, M.; Krumrey, M.; Kuramoto, N.; Massa, E.; Mecke, M.; Mizushima, S.; Mueller, M.; Narukawa, T.; Nicolaus, A.; Pramann, A.; Rauch, D.; Rienitz, O.; Sasso, C.P.; Stopic, A.; Stosch, R.; Waseda, A.; Wundrack, S.; Zhang, L.; Zhang, X.W.: A new 28Si single crystal: counting the atoms for the new kilogram definition. , Metrologia 54 (2017), p. 693-715
doi: 10.1088/1681-7575/aa7820

Puszkiel, J.A.; Castro Riglos, M.V.; Ramallo-Lopez, J.M.; Mizrahi, M.; Karimi, F.; Santoru, A.; Hoell, A.; Gennari, F.C.; Arneodo Larochette, P.; Pistidda, C.; Klassen, T.; Bellosta von Colbe, J.M.; Dornheim, M.: A novel catalytic route for hydrogenation-dehydrogenation of 2LiH+MgB2 via in situ formed core-shell LixTiO2 nanoparticles. , Journal of Materials Chemistry A 5 (2017), p. 12922-12933
doi: 10.1039/c7ta03117c

Grötzsch, D.; Streeck, C.; Nietzold, C.; Malzer, W.; Mantouvalou, I.; Nutsch, A.; Dietrich, P.; Unger, W.; Beckhoff, B.; Kanngießer, B.: A sealable ultrathin window sample cell for the study of liquids by means of soft X-ray spectroscopy. , Review of Scientific Instruments 88 (2017), p. 123112/1-7
doi: 10.1063/1.5006122

Della Monica Ferreira, D.; Massahi, S.; Christensen, F.E.; Shortt, B.; Bavdaz, M.; Collon, M.J.; Landgraf, B.; Gellert, N.C.; Korman, J.; Dalampiras, P.; Rasmussen, I.F.; Kamenidis, I.; Krumrey, M.; Schreiber, S.: Design, development, and performance of X-ray mirror coatings for the ATHENA mission. , In: Stephen L. O'Dell ... [Ed.] : Optics for EUV, X-Ray, and Gamma-Ray Astronomy VIII : 8-10 August 2017, San Diego, California, United States. Bellingham, Washington: SPIE, 2017 (Proceedings of SPIE ; 10399). - ISBN 978-1-5106-1255-6, p. 1039918/1-10

Hönicke, P.; Holfelder, I.; Kolbe, M.; Lubeck, J.; Pollakowski-Herrmann, B.; Unterumsberger, R.; Weser, J.; Beckhoff, B.: Determination of SiO2 and C layers on a monocrystalline silicon sphere by reference-free x-ray fluorescence analysis. , Metrologia 54 (2017), p. 481-486
doi: 10.1088/1681-7575/aa765f

Scholze, F.; Laubis, C.; Krumrey, M.; Timmermans, M.Y.; Pollentier, I.; Gallagher, E.E.: EUV optical characterization of alternative membrane materials for EUV pellicles. , In: Peter D. Buck ... [Ed.] : Photomask Technology 2017 : 11-14 September 2017, Monterey, California, United States. Bellingham, Washington, USA: SPIE, 2017 (Proceedings of SPIE ; 10451). - ISBN 978-1-5106-1376-8, p. 10451 0R/1-8
doi: 10.1117/12.2280553

Dietrich, P.M.; Treu, D.; Kalbe, H.; Krumrey, M.; Gross, T.; Marti, K.; Unger, W.E.S.: Experimental determination of the effective attenuation length of palladium 3d 5/2 photoelectrons in a magnetron sputtered Pd nanolayer. , Surface and Interface Analysis 49 (2017), p. 464-468
doi: 10.1002/sia.6141

Pflueger, M.; Soltwisch, V.; Probst, J.; Scholze, F.; Krumrey, M.: Grazing-incidence small-angle X-ray scattering (GISAXS) on small periodic targets using large beams. , IUCrJ 4 (2017), p. 431-438
doi: 10.1107/S2052252517006297

Elia, G.A.; Hasa, I.; Greco, G.; Diemant, T.; Marquardt, K.; Hoeppner, K.; Behm, R.J.; Hoell, A.; Passerini, S.; Hahn, R.: Insights into the reversibility of aluminum graphite batteries. , Journal of Materials Chemistry A 5 (2017), p. 9682-9690
doi: 10.1039/c7ta01018d

Vernani, D.; Blum, S.; Seure, T.; Bavdaz, M.; Wille, E.; Schaeffer, U.; Lievre, N.; Nazeeruddin, A.; Barriere, N.M.; Collon, M.J.; Cibik, L.; Krumrey, M.; Mueller, P.; Burwitz, V.: Integration of the Athena mirror modules: development of indirect and X-ray direct AIT methods. , In: O'Dell, Stephen L. ... [Ed.] : Optics for EUV, X-Ray, and Gamma-Ray Astronomy VIII : 8-10 August 2017, San Diego, California, United States. SPIE, 2017 Proceedings of SPIE ; 10399. - ISBN 978-1-5106-1255-6, p. 103990F
doi: 10.1117/12.2273829

Vacanti, G.; Barrierre, N.; Bavdaz, M.; Chatbi, A.; Collon, M.; Dekker, D.; Girou, D.; Gunther, R.; van der Hoeven, R.; Krumrey, M.; Landgraf, B.; Mueller, P.; Schreiber, S.; Vervest, M.; Wille, E.: Measuring Silicon Pore Optics. , In: Optics for EUV, X-Ray, and Gamma-Ray Astronomy VIII. SPIE, 2017 Proceedings of SPIE ; 10399. - ISBN 978-1-51-061255-6, p. 103990N
doi: 10.1117/12.2274357

Saxena, N.; Coric, M.; Greppmair, A.; Wernecke, J.; Pflueger, M.; Krumrey, M.; Brandt, M.S.; Herzig, E.M.; Mueller-Buschbaum, P.: Morphology-Function Relationship of Thermoelectric Nanocomposite Films from PEDOT:PSS with Silicon Nanoparticles. , Advanced Electronic Materials 3 (2017), p. 1700181/1-14
doi: 10.1002/aelm.201700181

Soltwisch, V.; Herrero, A.F.; Pflueger, M.; Haase, A.; Probst, J.; Laubis, C.; Krumrey, M.; Scholze, F.: Reconstructing detailed line profiles of lamellar gratings from GISAXS patterns with a Maxwell solver. , Journal of Applied Crystallography 50 (2017), p. 1524-1532
doi: 10.1107/S1600576717012742

Pflueger, M.; Soltwisch, V.; Scholze, F.; Krumrey, M.: Selective measurement of small metrology targets using CD-GISAXS. , In: Peter D. Buck ... [Ed.] : Photomask Technology 2017 : 11-14 September 2017, Monterey, California, United States. Bellingham, Washington, USA: SPIE, 2017 Proceedings SPIE ; 10451. - ISBN 978-1-5106-1376-8, p. 10451 10 /1-9
doi: 10.1117/12.2280455

Wille, E.; Bavdaz, M.; Wallace, K.; Shortt, B.; Collon, M.; Ackermann, M.; Guenther, R.; Riekerink, M.; Koelewijn, A.; Haneveld, J.; Van Baren, C.; Erhard, M.; Kampf, D.; Christensen, F.; Krumrey, M.; Freyberg, M.; Burwitz, V.: Silicon pore optics for future X-ray telescopes. , Proceedings of SPIE 10564 (2017), p. 105640H
doi: 10.1117/12.2309138

Bavdaz, M.; Wille, E.; Ayre, M.; Ferreira, I.; Shortt, B.; Fransen, S.; Collon, M.; Vacanti, G.; Barriere, N.; Landgraf, B.; Haneveld, J.; van Baren, C.; Zuknik, K.-H.; Della Monica Ferreira, D.; Massahi, S.; Christensen, F.; Krumrey, M.; Burwitz, V.; Pareschi, G.; Spiga, D.; Valsecchi, G.; Vernani, D.; Oliver, P.; Seidel, A.: The ATHENA Telescope and Optics Status. , In: Stephen L. O'Dell, Giovanni Pareschi [Ed.] : Optics for EUV, X-Ray, and Gamma-Ray Astronomy VIII. SPIE, 2017 Proceedings of SPIE ;10399. - ISBN 978-1-5106-1255-6, p. 103990B/1-12
doi: 10.1117/12.2274776

Buhr, E.; Dziomba, T.; Frase, C.G.; Krumrey, M.; Bosse, H.: Traceable Size and Size Distribution Calibrations of Nanoparticles. , Chemie, Ingenieur, Technik 89 (2017), p. 239-243
doi: 10.1002/cite.201600075

2016

Gollwitzer, C.; Bartczak, D.; Goenaga-Infante, H.; Kestens, V.; Krumrey, M.; Minelli, C.; Palmai, M.; Ramaye, Y.; Roebben, G.; Sikora, A.; Varga, Z.: A comparison of techniques for size measurement of nanoparticles in cell culture medium. , Analytical Methods 8 (2016), p. 5272-5282
doi: 10.1039/c6ay00419a

Lubeck, J.; Bogovac, M.; Boyer, B.; Detlefs, B.; Eichert, D.; Fliegauf, R.; Groetzsch, D.; Holfelder, I.; Hoenicke, P.; Jark, W.; Kaiser, R.B.; Kanngiesser, B.; Karydas, A.G.; Leani, J.J.; Lepy, M.C.; Luehl, L.; Menesguen, Y.; Migliori, A.; Mueller, M.; Pollakowski, B.; Spanier, M.; Sghaier, H.; Ulm, G.; Weser, J.; Beckhoff, B.: A New Generation of X-ray Spectrometry UHV Instruments at the SR Facilities BESSY II, ELETTRA and SOLEIL. , AIP Conference Proceedings 1741 (2016), p. 030011/1-4
doi: 10.1063/1.4952834

Soltwisch, V.; Haase, A.; Wernecke, J.; Probst, J.; Schoengen, M.; Burger, S.; Krumrey, M.; Scholze, F.: Correlated diffuse x-ray scattering from periodically nanostructured surfaces. , Physical Review B 94 (2016), p. 035419/1-5
doi: 10.1103/PhysRevB.94.035419

Massahi, S.; Ferreira, D.D.M.; Christensen, F.E.; Shortt, B.; Girou, D.A.; Collon, M.; Landgraf, B.; Barriere, N.; Krumrey, M.; Cibik, L.; Schreiber, S.: Development and production of a multilayer-coated X-ray reflecting stack for the Athena mission. , In: Jan-Willem A. den Herder ... [Ed.] : Space Telescopes and Instrumentation 2016: Ultraviolet to Gamma Ray. SPIE, 2016 (Proceedings of SPIE ; 9905). - ISBN 978-1-5106-0189-5, p. 99055P/1-10
doi: 10.1117/12.2233519

Hönicke, P.; Kolbe, M.; Krumrey, M.; Unterumsberger, R.; Beckhoff, B.: Experimental determination of the oxygen K-shell fluorescence yield using thin SiO2 and Al2O3 foils. , Spectrochimica Acta B 124 (2016), p. 94-98
doi: 10.1016/j.sab.2016.08.024

Nicolet, A.; Meli, F.; van der Pol, E.; Yuana, Y.; Gollwitzer, C.; Krumrey, M.; Cizmar, P.; Buhr, E.; Petry, J.; Sebaihi, N.; de Boeck, B.; Fokkema, V.; Bergmans, R.; Nieuwland, R.: Inter-laboratory comparison on the size and stability of monodisperse and bimodal synthetic reference particles for standardization of extracellular vesicle measurements. , Measurement Science & Technology 27 (2016), p. ARTN 035701
doi: 10.1088/0957-0233/27/3/035701

Witte, K.; Streeck, C.; Mantouvalou, J.; Suchkova, S.A.; Lokstein, H.; Groetzsch, D.; Martyanov, W.; Weser, J.; Kanngiesser, B.; Beckhoff, B.; Stiel, H.: Magnesium K-Edge NEXAFS Spectroscopy of Chlorophyll alpha in Solution. , The Journal of Physical Chemistry B 120 (2016), p. 11619-11627
doi: 10.1021/acs.jpcb.6b05791

Haase, A.; Bajt, S.; Hoenicke, P.; Soltwisch, V.; Scholze, F.: Multiparameter characterization of subnanometre Cr/Sc multilayers based on complementary measurements. , Journal of Applied Crystallography 49 (2016), p. 2161-2171
doi: 10.1107/S1600576716015776

Krumrey, M.; Mueller, P.; Cibik, L.; Collon, M.; Barriere, N.; Vacanti, G.; Bavdaz, M.; Wille, E.: New X-ray parallel beam facility XPBF 2.0 for the characterization of silicon pore optics. , In: Jan-Willem A. den Herder ... [Ed.] : Space Telescopes and Instrumentation 2016: Ultraviolet to Gamma Ray : 26 June-1 July 2016, Edinburgh, United Kingdom. SPIE, 2016 (Proceedings of SPIE ; 9905) . - ISBN 978-1-5106-0189-5, p. UNSP 99055N/1-8
doi: 10.1117/12.2231687

Prigozhin, G.; Gendreau, K.; Doty, J.P.; Foster, R.; Remillard, R.; Malonis, A.; LaMarr, B.; Vezie, M.; Egan, M.; Villasenor, J.; Arzoumanian, Z.; Baumgartner, W.; Scholze, F.; Laubis, C.; Krumrey, M.; Huber, A.: NICER Instrument Detector Subsystem: Description and Performance. , In: Jan-Willem A. den Herder, Tadayuki Takahashi, Marshall Bautz [Ed.] : Space Telescopes and Instrumentation 2016: Ultraviolet to Gamma Ray : 26 June-1 July 2016, Edinburgh, United Kingdom. SPIE, 2016 (Proceedings of SPIE ; 9905). - ISBN 978-1-5106-0189-5, p. 990511
doi: 10.1117/12.2231718

Baumgärtel, P.; Witt, M.; Baensch, J.; Fabarius, M.; Erko, A.; Schäfers, F.; Schirmacher, H.: RAY-UI: A Powerful and Extensible User Interface for RAY. , AIP Conference Proceedings 1741 (2016), p. 040016/1-4
doi: 10.1063/1.4952888

Cuypers, D.; Fleischmann, C.; van Dorp, D.H.; Brizzi, S.; Tallarida, M.; Mueller, M.; Hoenicke, P.; Billen, A.; Chintala, R.; Conard, T.; Schmeisser, D.; Vandervorst, W.; Van Elshocht, S.; Armini, S.; De Gendt, S.; Adelmann, C.: Sacrificial Self-Assembled Monolayers for the Passivation of GaAs (100) Surfaces and Interfaces. , Chemistry of Materials 28 (2016), p. 5689-5701
doi: 10.1021/acs.chemmater.6b01732

Collon, M.J.; Vacanti, G.; Gunther, R.; Yanson, A.; Barriere, N.; Landgraf, B.; Vervest, M.; Chatbi, A.; van der Hoeven, R.; Beijersbergen, M.W.; Bavdaz, M.; Wille, E.; Shortt, B.; Haneveld, J.; Koelewijn, A.; van Bared, C.; Eigenraam, A.; Mueller, P.; Krumrey, M.; Burwitz, V.; Pareschi, G.; Conconi, P.; Massahi, S.; Christensen, F.E.; Valsecchi, G.: Silicon Pore Optics for the ATHENA telescope. , In: Jan-Willem A. den Herder ... [Ed.] : Space Telescopes and Instrumentation 2016: Ultraviolet to Gamma Ray : 26 June-1 July 2016, Edinburgh, United Kingdom. SPIE, 2016 (Proceedings of SPIE ; 9905) . - ISBN 978-1-5106-0189-5, p. UNSP 990528/1-8
doi: 10.1117/12.2234427

Garcia-Diez, R.; Sikora, A.; Gollwitzer, C.; Minelli, C.; Krumrey, M.: Simultaneous size and density determination of polymeric colloids by continuous contrast variation in small angle X-ray scattering. , European Polymer Journal 81 (2016), p. 641-649
doi: 10.1016/j.eurpolymj.2016.01.012

Garcia-Diez, R.; Gollwitzer, C.; Krumrey, M.; Varga, Z.: Size Determination of a Liposomal Drug by Small-Angle X-ray Scattering Using Continuous Contrast Variation. , Langmuir 32 (2016), p. 772-778
doi: 10.1021/acs.langmuir.5b02261

Bavdaz, M.; Wille, E.; Shortt, B.; Fransen, S.; Collon, M.; Barriere, N.; Yanson, A.; Vacanti, G.; Haneveld, J.; van Baren, C.; Zuknik, K.-H.; Christensen, F.; Ferreira, D.D.M.; Krumrey, M.; Burwitz, V.; Pareschi, G.; Spiga, D.; Valsecchi, G.; Vernani, D.: The ATHENA Optics Development. , In: Jan-Willem A. den Herder ... [Ed.] : Space Telescopes and Instrumentation 2016: Ultraviolet to Gamma Ray : 26 June-1 July 2016, Edinburgh, United Kingdom. SPIE, 2016 (Proceedings of SPIE ; 9905) . - ISBN 978-1-5106-0189-5, p. UNSP 990527/1-9
doi: 10.1117/12.2233037

Fleischmann, C.; Lieten, R.R.; Hermann, P.; Hönicke, P.; Beckhoff, B.; Seidel, F.; Richard, O.; Bender, H.; Shimura, Y.; Zaima, S.; Uchida, N.; Temst, K.; Vandervorst, W.; Vantomme, A.: Thermal stability and relaxation mechanisms in compressively strained Ge0.94Sn0.06thin films grown by molecular beam epitaxy. , Journal of Applied Physics 120 (2016)
doi: 10.1063/1.4961396

Hoenicke, P.; Kolbe, M.; Beckhoff, B.: What are the correct L-subshell photoionization cross sections for quantitative X-ray spectroscopy? , X-ray Spectrometry 45 (2016), p. 207-211
doi: 10.1002/xrs.2691

Ferreira, D.D.M.; Jakobsen, A.C.; Massahi, S.; Christensen, F.E.; Shortt, B.; Garnaes, J.; Torras-Rosell, A.; Krumrey, M.; Cibik, L.; Marggraf, S.: X-ray mirror development and testing for the ATHENA mission. , In: Jan-Willem A. den Herder ... [Ed.] : Space Telescopes and Instrumentation 2016: Ultraviolet to Gamma Ray : 26 June-1 July 2016, Edinburgh, United Kingdom. Bellingham, Washington, USA: SPIE, 2016 (Proceedings of SPIE ; 9905). - ISBN 978-1-5106-0189-5, p. UNSP 99055K/1-13
doi: 10.1117/12.2232962

2015

Abou-Ras, D.; Caballero, R.; Streeck, C.; Beckhoff, B.; In, J.-H.; Jeong, S.: Comprehensive Comparison of Various Techniques for the Analysis of Elemental Distributions in Thin Films: Additional Techniques. , Microscopy and Microanalysis 21 (2015), p. 1644-1648
doi: 10.1017/S1431927615015093

Kayser, Y.; Hoenicke, P.; Banas, D.; Dousse, J.-C.; Hoszowska, J.; Jagodzinski, P.; Kubala-Kukus, A.; Nowak, S.H.; Pajek, M.: Depth profiling of low energy ion implantations in Si and Ge by means of micro-focused grazing emission X-ray fluorescence and grazing incidence X-ray fluorescence. , Journal of Analytical Atomic Spectrometry 30 (2015), p. 1086-1099
doi: 10.1039/c4ja00461b

Miles, D.M.; Tutt, J.H.; Marlow, H.; Peterson, T.J.; McEntaffer, R.L.; Menz, B.; Burwitz, V.; Hartner, G.; Laubis, C.; Scholze, F.: Diffraction Efficiency of Radially-Profiled Off-Plane Reflection Gratings. , In: Optics for EUV, X-Ray, and Gamma-Ray Astronomy VII. SPIE, 2015 (Proceedings of SPIE ; 9603). - ISBN 978-1-62841-769-2, p. 960306
doi: 10.1117/12.2186842

Geißler, D.; Gollwitzer, C.; Minelli, C.; Krumrey, M.; Resch-Genger, U.: Effect of fluorescent staining on size measurements of polymeric nanoparticles using DLS and SAXS. , Analytical Methods 7 (2015), p. 9785-9790
doi: 10.1039/c5ay02005k

Kolbe, M.; Hönicke, P.: Fundamental parameters of Zr and Ti for a reliable quantitative X-ray fluorescence analysis. , X-ray Spectrometry 44 (2015), p. 217-220
doi: 10.1002/xrs.2603

Eisenhauer, D.; Pollakowski, B.; Baumann, J.; Preidel, V.; Amkreutz, D.; Rech, B.; Back, F.; Rudigier-Voigt, E.; Beckhoff, B.; Kanngießer, B.; Becker, C.: Grazing incidence X-ray fluorescence analysis of buried interfaces in periodically structured crystalline silicon thin-film solar cells. , Physica Status Solidi A 212 (2015), p. 529-534
doi: 10.1002/pssa.201400112

Azuma, Y.; Barat, P.; Bartl, G.; Bettin, H.; Borys, M.; Busch, I.; Cibik, L.; D'Agostino, G.; Fujii, K.; Fujimoto, H.; Hioki, A.; Krumrey, M.; Kuetgens, U.; Kuramoto, N.; Mana, G.; Massa, E.; Meess, R.; Mizushima, S.; Narukawa, T.; Nicolaus, A.; Pramann, A.; Rabb, S.A.; Rienitz, O.; Sasso, C.; Stock, M.; Vocke, R.D.; Waseda, A.; Wundrack, S.; Zakel, S.: Improved measurement results for the Avogadro constant using a 28Si-enriched crystal. , Metrologia 52 (2015), p. 360-375
doi: 10.1088/0026-1394/52/2/360

Nass, K.; Foucar, L.; Barends, T.R.M.; Hartmann, E.; Botha, S.; Shoeman, R.L.; Doak, R.B.; Alonso-Mori, R.; Aquila, A.; Bajt, S.; Barty, A.; Bean, R.; Beyerlein, K.R.; Bublitz, M.; Drachmann, N.; Gregersen, J.; Joensson, H.O.; Kabsch, W.; Kassemeyer, S.; Koglin, J.E.; Krumrey, M.; Mattle, D.; Messerschmidt, M.; Nissen, P.; Reinhard, L.; Sitsel, O.; Sokaras, D.; Williams, G.J.; Hau-Riege, S.; Timneanu, N.; Caleman, C.; Chapman, H.N.; Boutet, S.; Schlichting, I.: Indications of radiation damage in ferredoxin microcrystals using high-intensity X-FEL beams. , Journal of Synchrotron Radiation 22 (2015), p. 225-238
doi: 10.1107/S1600577515002349

Karydas, A.G.; Streeck, C.; Bogdanovic Radovic, I.; Kaufmann, C.A.; Rissom, T.; Beckhoff, B.; Jaksic, M.; Barradas, N.P.: Ion beam analysis of Cu(In,Ga)Se2 thin film solar cells. , Applied Surface Science 356 (2015), p. 631-638
doi: 10.1016/j.apsusc.2015.08.133

Garcia-Diez, R.; Gollwitzer, C.; Krumrey, M.: Nanoparticle characterization by continuous contrast variation in small-angle X-ray scattering with a solvent density gradient. , Journal of Applied Crystallography 48 (2015), p. 20-28
doi: 10.1107/S1600576714024455

Rackwitz, Vanessa; Krumrey, Michael; Laubis, Christian; Scholze, Frank; Hodoroaba, Vasile-Dan: New reference and test materials for the characterization of energy dispersive X-ray spectrometers at scanning electron microscopes. , Analytical and Bioanalytical Chemistry 407 (2015), p. 3045-3053
doi: 10.1007/s00216-014-8242-5

Pollakowski, B.; Beckhoff, B.: Non-destructive speciation depth profiling of complex TiOx nanolayer structures by GIXRF-NEXAFS. , Analytical Chemistry 87 (2015), p. 7705-7711
doi: 10.1021/acs.analchem.5b01172

Fischer, T.; Dietrich, P.M.; Streeck, C.; Ray, S.; Nutsch, A.; Shard, A.; Beckhoff, B.; Unger, W.E.S.; Rurack, K.: Quantification of variable functional-group densities of mixed-silane monolayers on surfaces via a dual-mode fluorescence and XPS label. , Analytical Chemistry 87 (2015), p. 2685-2692
doi: 10.1021/ac503850f

Hönicke, P.; Detlefs, B.; Müller, M.; Darlatt, E.; Nolot, E.; Grampeix, H.; Beckhoff, B.: Reference-free, depth-dependent characterization of nanolayers and gradient systems with advanced grazing incidence X-ray fluorescence analysis. , Physica Status Solidi A 212 (2015), p. 523-528
doi: 10.1002/pssa.201400204

Agocs, E.; Bodermann, B.; Burger, S.; Dai, G.; Endres, J.; Hansen, P.-E.; Nielson, L.; Madsen, M.; Heidenreich, S.; Krumrey, M.; Löchel, B.; Probst, J.; Scholze, F.; Soltwisch, V.; Wurm, M.: Scatterometry reference standards to improve tool matching and traceability in lithographical nanomanufacturing. , In: Campo, E.M. ... [Ed.] : Nanoengineering: Fabrication, Properties, Optics, and Devices. SPIE, 2015 (Proceedings of SPIE ; 9556), p. 955610/1-12
doi: 10.1117/12.2190409

Collon, M.J.; Vacanti, G.; Yanson, A.; Barrière, N.; Landgraf, B.; Vervest, M.; Chatbi, A.; Beijersbergen, M.W.; Bavdaz, M.; Wille, E.; Haneveld, J.; Koelewijn, A.; Leenstra, A.; Wijnperle, M.; van Baren, C.; Müller, P.; Krumrey, M.; Burwitz, V.; Pareschi, G.; Conconi, P.; Christensen, F.E.: Silicon Pore Optics development for ATHENA. , In: Stephen L. O'Dell ... [Ed.] : Optics for EUV, X-Ray, and Gamma-Ray Astronomy VII. SPIE, 2015. - ISBN 978-1-62841-769-2, p. 9603K
doi: 10.1117/12.2188988

Mohammadi, V.; Shi, L.; Kroth, U.; LaubisC, C.: Stability Characterization of High-performance PureB Si-Photodiodes under Aggressive Cleaning Treatments in Industrial Applications. , In: Leopoldo G. Franquelo ... [Ed.] : 2015 IEEE International Conference on Industrial Technology (ICIT) : 17-19 March 2015. IEEE, 2015. - ISBN 978-1-4799-7800-7, p. 3370-3376
doi: 10.1109/ICIT.2015.7125599

Bavdaz, M.; Wille, E.; Fransen, S.; Collon, M.; Vacanti, G.; Guenther, R.; Yanson, A.; Vervest, M.; Haneveld, J.; van Baren, C.; Zuknik, K.-H.; Christensen, F.; Krumrey, M.; Burwitz, V.; Pareschi, G.; Valsecchi, G.: The Athena Optics. , In: Optics for EUV, X-Ray, and Gamma-Ray Astronomy VII. SPIE, 2015 (Proceedings of SPIE ; 9603). - ISBN 978-1-62841-769-2, p. 9603J
doi: 10.1117/12.2188074

Guerra, M.; Sampaio, J.M.; Parente, F.; Indelicato, P.; Marques, J.P.; Santos, J.P.; Hoszowska, J.; Dousse, J.-Cl.; Loperetti, L.; Zeeshan, F.; Müller, M.; Unterumsberger, R.; Beckhoff, B.: Theoretical and experimental determination of L-shell decay rates, line widths, and fluorescence yields in Ge. , Physical Review A 92 (2015), p. 22507/1-9
doi: 10.1103/PhysRevA.92.022507

Palmai, M.; Szalay, R.; Bartczak, D.; Varga, Z.; Nagy, L.N.; Gollwitzer, C.; Krumrey, M.; Goenaga-Infante, H.: Total synthesis of isotopically enriched Si-29 silica NPs as potential spikes for isotope dilution quantification of natural silica NPs. , Journal of Colloid and Interface Science 445 (2015), p. 161-165
doi: 10.1016/j.jcis.2014.12.085

Schmidtke, G.; Avakyan, S.V.; Bothmer, V.; Cessateur, G.; Didkovsky, L.; Dudok de Witt, T.; Eparvier, F.G.; Gottwald, A.; Haberreiter, M.; Hammer, R.; Jacobi, Ch.; Jakowski, N.; Kretzschmar, M.; Lilensten, J.; Pfeifer, M.; Radicella, S.M.; Schäfer, R.; Schmidt, W.; Solomon, S.C.; Thuillier, G.; Tobiska, W.K.; Wieman, S.; Woods, T.N.: Where does the Thermospheric Ionospheric GEosphericResearch (TIGER) Program go? , Advances in Space Research 56 (2015), p. 1547–1577
doi: 10.1016/j.asr.2015.07.043

2014

Gollwitzer, C.; Krumrey, M.: A diffraction effect in X-ray area detectors. , Journal of Applied Crystallography 47 (2014), p. 378-383
doi: 10.1107/S1600576713031981

Troussel, P.; Villette, B.; Emprin, B.; Oudot, G.; Tassin, V.; Bridou, F.; Delmotte, F.; Krumrey, M.: Absolute radiant power measurement for the Au M lines of laser-plasma using a calibrated broadband soft X-ray spectrometer with flat-spectral response. , Review of Scientific Instruments 85 (2014), p. 013503/1-8
doi: 10.1063/1.4846915

Hoell, A.; Varga, Z.; Raghuwanshi, V.S.; Krumrey, M.; Bocker, C.; Rüssel, C.: ASAXS study of CaF2 nanoparticles embedded in a silicate glass matrix. , Journal of Applied Crystallography 47 (2014), p. 60 - 66
doi: 10.1107/S1600576713030100

Majewski, P.; Aschauer, F.; Aschauer, S.; Baehr, A.; Bergbauer, B.; Hilchenbach, M.; Krumrey, M.; Laubis, C.; Lauf, T.; Lechner, P.; Lutz, G.; Scholze, F.; Soltau, H.; Stefanescu, A.; Strueder, L.; Treis, J.: Calibration measurements on the DEPFET Detectors for the MIXS instrument on BepiColombo. , Experimental Astronomy 37 (2014), p. 525-538
doi: 10.1007/s10686-014-9374-5

Wernecke, J.; Gollwitzer, C.; Müller, P.; Krumrey, M.: Characterization of an in-vacuum PILATUS 1M detector. , Journal of Synchrotron Radiation 21 (2014), p. 529-536
doi: 10.1107/S160057751400294X

Müller, M.; Hönicke, P.; Detlefs, B.; Fleischmann, C.: Characterization of High-k Nanolayers by Grazing Incidence X-ray Spectrometry. , Materials 7 (2014), p. 3147-3159
doi: 10.3390/ma7043147

Minelli, C.; Garcia-Diez, R.; Sikora, A.E.; Gollwitzer, C.; Krumrey, M.; Shard, A.G.: Characterization of IgG-protein-coated polymeric nanoparticles using complementary particle sizing techniques. , Surface and Interface Analysis 46 (2014), p. 663-667
doi: 10.1002/sia.5381

Wernecke, J.; Okuda, H.; Ogawa, H.; Siewert, F.; Krumrey, M.: Depth-Dependent Structural Changes in PS-b-P2VP Thin Films Induced by Annealing. , Macromolecules 47 (2014), p. 5719-5727
doi: 10.1021/ma500642d

Bodermann, B.; Loechel, B.; Scholze, F.; Dai, G.; Wernecke, J.; Endres, J.; Probst, J.; Schoengen, M.; Krumrey, M.; Hansen, P.-E.; Soltwisch, V.: Development of a scatterometry reference standard. , In: Optical Micro- and Nanometrology V. SPIE, 2014 (Proceedings of SPIE ; 9132). - ISBN 978-1-62841-080-8, p. 91320A/1-12
doi: 10.1117/12.2052278

Hönicke, P.; Kolbe, M.; Müller, M.; Mantler, M.; Krämer, M.; Beckhoff, B.: Experimental Verification of the Individual Energy Dependencies of the Partial L-Shell Photoionization Cross Sections of Pd and Mo. , Physical Review Letters 113 (2014), p. 163001/1-5
doi: 10.1103/PhysRevLett.113.163001

Reinhardt, F.; Nowak, S.; Beckhoff, B.; Dousse, J.; Schoengen, M.: Grazing incidence X-ray fluorescence of periodic structures - a comparison between X-ray standing waves and geometrical optics calculations. , Journal of Analytical Atomic Spectrometry 29 (2014), p. 1778-1784
doi: 10.1039/c4ja00164h

Choueikani, F.; Lagarde, B.; Delmotte, F.; Krumrey, M.; Bridou, F.; Thomasset, M.; Meltchakov, E.; Polack, F.: High-efficiency B4C/Mo-2C alternate multilayer grating for monochromators in the photon energy range from 0.7 to 3.4 keV. , Optics Letters 39 (2014), p. 2141-2144
doi: 10.1364/OL.39.002141

Troussel, Ph.; Dennetiere, D.; Maroni, R.; Hoghoj, P.; Hedacq, S.; Cibik, L.; Krumrey, M.: Multilayer optics for monochromatic high-resolution X-ray imaging diagnostic in a broad photon energy range from 2 keV to 22 keV. , Nuclear Instruments & Methods in Physics Research A 767 (2014), p. 1-4
doi: 10.1016/j.nima.2014.07.048

Soltwisch, V.; Wernecke, J.; Haase, A.; Probst, J.; Schoengen, M.; Krumrey, M.; Scholze, F.: Nanometrology on gratings with GISAXS: FEM reconstruction and fourier analysis. , In: Jason P. Cain ... [Ed.] : Metrology, Inspection, and Process Control for Microlithography XXVIII ; San Jose, California, USA, February 23, 2014 (2 volumes). SPIE, 2014 (Proceedings of SPIE ; 9050). - ISBN 978-0-8194-9973-8, p. 905012/1-12
doi: 10.1117/12.2046212

Wernecke, J.; Krumrey, M.; Hoell, A.; Kline, R.J.; Liu, H.-K.; Wu, W.-L.: Traceable GISAXS measurements for pitch determination of a 25 nm self-assembled polymer grating. , Journal of Applied Crystallography 47 (2014), p. 1912-1920
doi: 10.1107/S1600576714021050

Wernecke, J.; Shard, A.G.; Krumrey, M.: Traceable thickness determination of organic nanolayers by X-ray reflectometry. , Surface and Interface Analysis 46 (2014), p. 911-914
doi: 10.1002/sia.5371

2013

Lubeck, J.; Beckhoff, B.; Fliegauf, R.; Holfelder, I.; Hönicke, P.; Müller, M.; Pollakowski, B.; Reinhardt, F.; Weser, J.: A novel instrument for quantitative nanoanalytics involving complementary X-ray methodologies. , Review of Scientific Instruments 84 (2013), p. 045106/1-7
doi: 10.1063/1.4798299

Collon, M.J.; Ackermann, M.; Guenther, R.; Vacanti, G.; Beijersbergen, M.W.; Bavdaz, M.; Wille, E.; Wallace, K.; Haneveld, J.; Riekerink, M.O.; Koelewijn, A.; van Baren, C.; Mueller, P.; Krumrey, M.; Burwitz, V.; Sironi, G.; Ghigo, M.: Aberration-free Silicon Pore X-ray Optics. , Proceedings of SPIE 8861 (2013), p. 88610M/1-10
doi: 10.1117/12.2024982

Meister, H.; Willmeroth, M.; Zhang, D.; Gottwald, A.; Krumrey, M.; Scholze, F.: Broad-band efficiency calibration of ITER bolometer prototypes using Pt absorbers on SiN membranes. , Review of Scientific Instruments 84 (2013), p. 123501/1-7
doi: 10.1063/1.4834755

BenMoussa, A.; Giordanengo, B.; Gissot, S.; Meynants, G.; Wang, X.; Wolfs, B.; Bogaerts, J.; Schühle, U.; Berger, G.; Gottwald, A.; Laubis, C.; Kroth, U.; Scholze, F.: Characterization of Backside-Illuminated CMOS APS Prototypes for the Extreme Ultraviolet Imager On-Board Solar Orbiter. , IEEE Transactions on Electron Devices 60 (2013), p. 1701-1708
doi: 10.1109/TED.2013.2255103

Granato, S.; Andritschke, R.; Elbs, J.; Meidinger, N.; Strueder, L.; Weidenspointner, G.; Krumrey, M.; Scholze, F.: Characterization of eROSITA PNCCDs. , IEEE Transactions on Nuclear Science 60 (2013), p. 3150-3157
doi: 10.1109/TNS.2013.2269907

Donath, T.; Brandstetter, S.; Cibik, L.; Commichau, S.; Hofer, P.; Krumrey, M.; Luethi, B.; Marggraf, S.; Mueller, P.; Schneebeli, M.; Schulze-Briese, C.; Wernecke, J.: Characterization of the PILATUS photon-counting pixel detector for X-ray energies from 1.75 keV to 60 keV. , Journal of Physics : Conference Series 425 (2013), p. 062001/1-7
doi: 10.1088/1742-6596/425/6/062001

Petrik, P.; Pollakowski, B.; Zakel, S.; Gumprecht, T.; Beckhoff, B.; Lemberger, M.; Labadi, Z.; Baji, Z.; Jank, M.; Nutsch, A.: Characterization of ZnO structures by optical and X-ray methods. , Applied Surface Science 281 (2013), p. 123-128
doi: 10.1016/j.apsusc.2012.12.035

Becker, C.; Pagels, M.; Zachäus, C.; Pollakowski, B.; Beckhoff, B.; Kanngießer, B.; Rech, B.: Chemical speciation at buried interfaces in high-temperature processed polycrystalline silicon thin-film solar cells on ZnO:Al. , Journal of Applied Physics 113 (2013), p. 044519/1-7
doi: 10.1063/1.4789599

Scholze, F.; Soltwisch, V.; Dai, G.; Henn, M.-A.; Gross, H.: Comparison of CD measurements of an EUV photomask by EUV scatterometry and CD-AFM. , Proceedings of SPIE 8880 (2013), p. 88800O/1-12
doi: 10.1117/12.2025827

Holfelder, I.; Beckhoff, B.; Fliegauf, R.; Hoenicke, P.; Nutsch, A.; Petrik, P.; Röder, G.; Weser, J.: Complementary methodologies for thin film characterization in one tool - a novel instrument for 450 mm wafers. , Journal of Analytical Atomic Spectrometry 28 (2013), p. 549-557
doi: 10.1039/c3ja30324a

Nicolaus, R.A.; Bartl, G.; Bettin, H.; Borys, M.; Firlus, M.; Busch, I.; Felgner, A.; Krüger-Sehm, R.; Krumrey, M.; Krystek, M.; Kuetgens, U.: Current State of Avogadro 28Si sphere S8. , IEEE Transactions on Instrumentation and Measurement 62 (2013), p. 1499-1505
doi: 10.1109/TIM.2013.2242633

Nowak, S.H.; Reinhardt, F.; Beckhoff, B.; Dousse, J.-C.; Szlachetko, J.: Geometrical optics modelling of grazing incidence X-ray fluorescence of nanoscaled objects. , Journal of Analytical Atomic Spectrometry 28 (2013), p. 689-696
doi: 10.1039/c3ja30338a

Streeck, C.; Brunken, S.; Gerlach, M.; Herzog, C.; Hönicke, P.; Kaufmann, C.A.; Lubeck, J.; Pollakowski, B.; Unterumsberger, R.; Weber, A.; Beckhoff, B.; Kanngießer, B.; Schock, H.-W.; Mainz, R.: Grazing-incidence x-ray fluorescence analysis for non-destructive determination of In and Ga depth profiles in Cu(In,Ga)Se2 absorber films. , Applied Physics Letters 103 (2013), p. 113904/1-5
doi: 10.1063/1.4821267

Lagarde, B.; Choueikani, F.; Capitanio, B.; Ohresser, P.; Meltchakov, E.; Delmotte, F.; Krumrey, M.; Polack, F.: High efficiency multilayer gratings for monochromators in the energy range from 500 eV to 2500 eV. , Journal of Physics : Conference Series 425 (2013), p. 152012/1-4
doi: 10.1088/1742-6596/425/15/152012

Fleischmann, C.; Schouteden, K.; Müller, M.; Hönicke, P.; Beckhoff, B.; Sioncke, S.; Boyen, H.-G.; Meuris, M.; Van Haesendonck, C.; Temst, K.; Vantomme, A.: Impact of ammonium sulfide solution on electronic properties and ambient stability of germanium surfaces: towards Ge-based microelectronic devices. , Journal of Materials Chemistry C 1 (2013), p. 4105-4113
doi: 10.1039/c3tc30424h

van der Pol, E.; Coumans, F.; Varga, Z.; Krumrey, M.; Nieuwland, R.: Innovation in detection of microparticles and exosomes. , Journal of Thrombosis and Haemostasis 11 (2013), p. 36-45
doi: 10.1111/jth.12254

BenMoussa, A.; Gissot, S.; Giordanengo, B.; Meynants, G.; Wang, X.; Wolfs, B.; Bogaerts, J.; Schühle, U.; Berger, G.; Gottwald, A.; Laubis, C.; Kroth, U.; Scholze, F.; Soltani, A.; Saito, T.: Irradiation Damage Tests on Backside-Illuminated CMOS APS Prototypes for the Extreme Ultraviolet Imager On-Board Solar Orbiter. , IEEE Transactions on Nuclear Science 60 (2013), p. 3907-3914
doi: 10.1109/TNS.2013.2279550

Fleischmann, C.; Houssa, M.; Müller, M.; Beckhoff, B.; Boyen, H.-G.; Meuris, M.; Temst, K.; Vantomme, A.: Liquid-Phase Adsorption of Sulfur on Germanium: Reaction Mechanism and Atomic Geometry. , The Journal of Physical Chemistry C 117 (2013), p. 7451-7458
doi: 10.1021/jp306536n

Longstaff, C.; Varju, I.; Sòtonyi, P.; Szabó, L.; Krumrey, M.; Hoell, A.; Bóta, A.; Varga, Z.; Komorowicz, E.; Kolev, K.: Mechanical Stability and Fibrinolytic Resistance of Clots Containing Fibrin, DNA, and Histones. , Journal of Biological Chemistry 288 (2013), p. 6946-6956
doi: 10.1074/jbc.M112.404301

Eisenhauer, David: Röntgenfluoreszenzanalyse der Grenzflächen von photovoltaischen und photonischen Silizium-Nanoarchitekturen. , Technische Universität Berlin, 2013

Soltwisch, V.; Burger, S.; Scholze, F.: Scatterometry sensitivity analysis for conical diffraction versus in-plane diffraction geometry with respect to the side wall angle. , Proceedings of SPIE 8789 (2013), p. 878905/1-10
doi: 10.1117/12.2020487

Shi, L.; Nihtianov, S.; Nanver, L.K.; Scholze, F.: Stability Characterization of High-Sensitivity Silicon-Based EUV Photodiodes in a Detrimental Environment. , IEEE Sensors Journal 13 (2013), p. 1699-1707
doi: 10.1109/JSEN.2012.2235142

Laubis, C.; Barboutis, A.; Biel, M.; Buchholz, C.; Dubrau, B.; Fischer, A.; Hesse, A.; Puls, J.; Stadelhoff, C.; Soltwisch, V.; Scholze, F.: Status of EUV Reflectometry at PTB. , Proceedings of SPIE 8679 (2013), p. 867921/1-12
doi: 10.1117/12.2011529

Hoenicke, P.; Mueller, M.; Beckhoff, B.: X-Ray induced depth profiling of ion implantations into various semiconductor materials. , Solid State Phenomena 195 (2013), p. 274-276
doi: 10.4028/www.scientific.net/SSP.195.274

Bavdaz, M.; Wille, E.; Wallace, K.; Shortt, B.; Fransen, S.; Rando, N.; Collon, M.; Ackermann, M.; Vacanti, G.; Guenther, R.; Haneveld, J.; Riekerink, M.O.; Koelewijn, A.; van Baren, C.; Kampf, D.; Zuknik, K.-H.; Reutlinger, A.; Christensen, F.; Ferreira, D.D.M.; Jakobsen, A.C.; Krumrey, M.; Mueller, P.; Burwitz, V.; Pareschi, G.; Ghigo, M.; Civitani, M.; Proserpio, L.; Spiga, D.; Basso, S.; Salmaso, B.; Gallieni, D.; Tintori, M.; Fumi, P.; Martelli, F.; Parodi, G.; Ferrario, I.; Povey, I.: X-ray optics developments at ESA. , Proceedings of SPIE 8861 (2013), p. 88610L/1-12
doi: 10.1117/12.2024989

Vacanti, G.; Ackermann, M.; Vervest, M.; Collon, M.; Gunther, R.; Kelly, C.; Wille, E.; Cibik, L.; Krumrey, M.; Müller, P.: X-ray pencil beam characterization of silicon pore optics. , Proceedings of SPIE 8861 (2013), p. 88611K/1-10
doi: 10.1117/12.2024837

2012

Hopman, T.L.; Heirwegh, C.M.; Campbell, J.L.; Krumrey, M.; Scholze, F.: An accurate determination of the K-shell X-ray fluorescence yield of silicon. , X-ray Spectrometry 41 (2012), p. 164-171
doi: 10.1002/xrs.2378

Braig, C.; Fritzsch, L.; Käsebier, T.; Kley, E.-B.; Laubis, C.; Liu, Y.; Scholze, F.; Tünnermann, A.: An EUV beamsplitter based on conical grazing incidence diffraction. , Optics Express 20 (2012), p. 1825 - 1837
doi: 10.1364/OE.20.001825

Troussel, Ph.; Dennetiere, D.; Rousseau, A.; Darbon, S.; Hoghoj, P.; Hedacq, S.; Krumrey, M.: Applications of non-periodic multilayer optics for high-resolution x-ray microscopes below 30 keV. , Review of Scientific Instruments 83 (2012), p. 10E533/1-3
doi: 10.1063/1.4738661

Hönicke, P.; Kayser, Y.; Beckhoff, B.; Müller, M.; Dousse, J.-Cl.; Hoszowska, J.; Nowak, S.H.: Characterization of ultra-shallow aluminum implants in silicon by grazing incidence and grazing emission X-ray fluorescence spectroscopy. , Journal of Analytical Atomic Spectrometry 27 (2012), p. 1432 - 1438
doi: 10.1039/c2ja10385k

Hoffmann, P.S.; Kosinova, M.I.; Flege, S.; Baake, O.; Pollakowski, B.; Trunova, V.A.; Klein, A.; Beckhoff, B.; Kuznetsov, F.A.; Ensinger, W.: Chemical interactions in the layered system BCxNy/Ni(Cu)/Si, produced by CVD at high temperature. , Analytical and Bioanalytical Chemistry 404 (2012), p. 479 - 487
doi: 10.1007/s00216-012-6177-2

Ferreira, D.D.M.; Jakobsen, A.C.; Christensen, F.E.; Shortt, B.; Krumrey, M.; Garnaes, J.; Simonsen, R.B.: Development and characterization of coatings on Silicon Pore Optics substrates for the ATHENA mission. , In: Tadayuki Takahashi, ... ed. [Ed.] : Space telescopes and instrumentation 2012: ultraviolet to gamma ray : 1 - 6 July 2012, Amsterdam, Netherlands . , 2012 (Proeedings of the SPIE ; 8443). - ISBN 978-0-8194-9144-2, p. 84435E/1-14
doi: 10.1117/12.927290

Wernecke, J.; Scholze, F.; Krumrey, M.: Direct structural characterisation of line gratings with grazing incidence small-angle x-ray scattering. , Review of Scientific Instruments 83 (2012), p. 103906/1-8
doi: 10.1063/1.4758283

Shi, L.; Nihtianov, S.N.; Scholze, F.; Nanver, L.K.: Electrical performance stability characterization of high-sensitivity Si-based EUV photodiodes in a harsh industrial application. , In: IEEE [Ed.] : IECON 2012 : 38th annual conference on IEEE Industrial Electronics Society; Montreal, Quebec, Canada, 25 - 28 October 2012; [proceedings] . Piscataway, NJ, 2012. - ISBN 978-1-4673-2421-2, p. 3952 - 3957
doi: 10.1109/IECON.2012.6389260

Seuthe, T.; Höfner, M.; Reinhardt, F.; Tsai, W.J.; Bonse, J.; Eberstein, M.; Eichler, H.J.; Grehn, M.: Femtosecond laser-induced modification of potassium-magnesium silicate glasses: An analysis of structural changes by near edge x-ray absorption spectroscopy. , Applied Physics Letters 100 (2012), p. 22410171-4
doi: 10.1063/1.4723718

Tanaka, T.; Kato, M.; Kurosawa, T.; Morishita, Y.; Saito, N.; Suzuki, I.H.; Krumrey, M.; Scholze, F.: First comparison of spectral responsivity in the soft x-ray region. , Metrologia 49 (2012), p. 501-506
doi: 10.1088/0026-1394/49/4/501

Unterumsberger, R.; Müller, M.; Beckhoff, B.; Hönicke, P.; Pollakowski, B.; Bjeoumikhova, S.: Focusing of soft X-ray radiation and characterization of the beam profile enabling X-ray emission spectrometry at nanolayered specimens. , Spectrochimica Acta B 78 (2012), p. 37 - 41
doi: 10.1016/j.sab.2012.10.001

Kolbe, M.; Hönicke, P.; Müller, M.; Beckhoff, B.: L-subshell fluorescence yields and Coster-Kronig transition probabilities with a reliable uncertainty budget for selected high- and medium-Z elements. , Physical Review A 86 (2012), p. 42512/1-9
doi: 10.1103/PhysRevA.86.042512

Buhr, H.; Büermann, L.; Gerlach, M.; Krumrey, M.; Rabus, H.: Measurement of the mass energy-absorption coefficient of air for x-rays in the range from 3 to 60 keV. , Physics in Medicine and Biology 57 (2012), p. 8231-8247
doi: 10.1088/0031-9155/57/24/8231

Pollakowski, B.; Hoffmann, P.; Kosinova, M.I.; Braake, O.; Trunova, V. A.; Unterumsberger, R.; Ensinger, W.; Beckhoff, B.: Nondestructive and nonpreparative chemical nanometrology of internal material interfaces at tunable high information depths. , Analytical Chemistry 85 (2012), p. 193 - 200
doi: 10.1021/ac3024872

Banici, R.A.; Cojocaru, G..; Ungureanu, R.G.; Dabu, R.; Ursescu, D.; Stiel, H.: Pump energy reduction for a high gain Ag X-ray laser using one long and two short pump pulses. , Optics Letters 37 (2012), p. 5130-5132
doi: 10.1364/OL.37.005130

Delabie, A.; Sioncke, S.; Rip, J.; van Elshocht, S.; Pourtois, G.; Mueller, M.; Beckhoff, B.; Pierloot, K.: Reaction mechanisms for atomic layer deposition of aluminum oxide on semiconductor substrates. , Journal of Vacuum Science & Technology A 30 (2012), p. 01A127/1-10
doi: 10.1116/1.3664090

Reinhardt, F.; Osán, J.; Török, S.; Pap, A.E.; Kolbe, M.; Beckhoff, B.: Reference-free quantification of particle-like surface contaminations by grazing incidence X-ray fluorescence analysis. , Journal of Analytical Atomic Spectrometry 27 (2012), p. 248 - 255
doi: 10.1039/C2JA10286B

Mueller, M.; Nutsch, A.; Altmann, R.; Borionetti, G.; Holz, T.; Mantler, C.; Hoenicke, P.; Kolbe, M.; Beckhoff, B.: Reliable quantification of inorganic contamination by TXRF. , Solid State Phenomena 187 (2012), p. 291-294
doi: 10.4028/www.scientific.net/SSP.187.291

Hoffmann, P.S.; Fainer, N.I.; Baake, O.; Kosinova, M.L.; Rumyantsev, Y.M.; Trunova, V.A.; Klein, A.; Pollakowski, B.; Beckhoff, B.; Ensinger, W.: Silicon carbonitride nanolayers — Synthesis and chemical characterization. , Thin Solid Films 520 (2012), p. 5906 - 5913
doi: 10.1016/j.tsf.2012.04.082

Bavdaz, M.; Wille, E.; Wallace, K.; Shortt, B.; Collon, M.; Ackermann, M.; Riekerink, M.O.; Haneveld, J.; van Baren, C.; Erhard, M.; Christensen, F.; Krumrey, M.; Burwitz, V.: Silicon Pore Optics Developments and Status. , In: Tadayuki Takahashi, ... ed. [Ed.] : Space telescopes and instrumentation 2012: ultraviolet to gamma ray : 1 - 6 July 2012, Amsterdam, Netherlands. , 2012 (Proeedings of the SPIE ; 8443). - ISBN 978-0-8194-9144-2, p. 844329/1-9
doi: 10.1117/12.926111

Shi, L.; Nihtianov, S.; Haspeslagh, L.; Scholze, F.; Gottwald, A.; Nanver, L.K.: Surface-Charge-Collection-Enhanced High-Sensitivity High-Stability Silicon Photodiodes for DUV and VUV Spectral Ranges. , IEEE Transactions on Electron Devices 59 (2012), p. 2888 - 2894
doi: 10.1109/TED.2012.2210225

Meli, F.; Klein, T.; Buhr, E.; Frase, C.G.; Gleber, G.; Krumrey, M.; Duta, A.; Duta, S.; Korpelainen, V.; Bellotti, R.; Picotto, G.B.; Boyd, R.D.; Cuenat, A.: Traceable size determination of nanoparticles, a comparison among European metrology institutes. , Measurement Science & Technology 23 (2012), p. 125005/1-15
doi: 10.1088/0957-0233/23/12/125005

2011

Andreas, B.; Azuma, Y.; Bartl, G.; Becker, P.; Bettin, H.; Borys, M.; Busch, I.; Gray, M.; Fuchs, P.; Fujii, K.; Fujimoto, H.; Kessler, E.; Krumrey, M.; Kuetgens, U.; Kuramoto, N.; Mana, G.; Manson, P.; Massa, E.; Mizushima, S.; Nicolaus, A.; Picard, A.; Pramann, A.; Rienitz, O.; Schiel, D.; Valkiers, S.; Waseda, A.: A determination of the Avogadro constant by counting the atoms in a 28Si crystal. , Physical Review Letters 106 (2011), p. 30801/1-4
doi: 10.1103/PhysRevLett.106.030801

Gottwald, A.; Richter, M.; Shaw, P.-S.; Li, Z.; Arp, U.: Bilateral NIST–PTB comparison of spectral responsivity in the VUV. , Metrologia 48 (2011), p. 2001/1-12
doi: 10.1088/0026-1394/48/1A/02001

Sokaras, D.; Kochur, A.G.; Müller, M.; Kolbe, M.; Beckhoff, B.; Mantler, M.; Zarkadas, Ch.; Andrianis, M.; Lagoyannis, A.; Karydas, A.G.: Cascade L-shell soft-x-ray emission as incident x-ray photons are tuned across the 1s ionization threshold. , Physical Review A 83 (2011), p. 52511/1-12
doi: 10.1103/PhysRevA.83.052511

Scholze, F.; Kato, A.; Laubis, C.: Characterization of nano-structured surfaces by EUV scatterometry. , Journal of Physics : Conference Series 311 (2011), p. 12006/1-7
doi: 10.1088/1742-6596/311/1/012006

Unterumsberger, R.; Pollakowski, B.; Müller, M.; Beckhoff, B.: Complementary Characterization of Buried Nanolayers by Quantitative X-ray Fluorescence Spectrometry under Conventional and Grazing Incidence Conditions. , Analytical Chemistry 83 (2011), p. 8623-8628
doi: 10.1021/ac202074s

Andreas, B.; Azuma, Y.; Bartl, G.; Becker, P.; Bettin, H.; Borys, M.; Busch, I.; Fuchs, P.; Fujii, K.; Fujimoto, H.; Kessler, E.; Krumrey, M.; Kuetgens, U.; Kuramoto, N.; Mana, G.; Massa, E.; Mizushima, S.; Nicolaus, A.; Picard, A.; Pramann, A.; Rienitz, O.; Schiel, D.; Valkiers, S.; Waseda, A.; Zakel, S.: Counting the atoms in a 28Si crystal for a new kilogram definition. , Metrologia 48 (2011), p. S1-13
doi: 10.1088/0026-1394/48/2/S01

Collon, M.J.; Günther, R.; Ackermann, M.; Partapsing, R.; Vacanti, G.; Beijersbergen, M.W.; Bavdaz, M.; Wallace, K.; Wille, E.; Riekerink, M.O.; Haneveld, J.; Koelewijn, A.; van Baren, C.; Müller, P.; Krumrey, M.; Freyberg, M.; Jakobsen, A.C.; Christensen, F.: Design, Fabrication, and Characterization of Silicon Pore Optics for ATHENA/IXO. , In: Stephen L. O'Dell ... [Ed.] : Optics for EUV, X-Ray, and Gamma-Ray Astronomy V : 23 - 25 August 2011, San Diego, California, United States. SPIE, 2011 (Proceedings of SPIE ; 8147). - ISBN 978-0-8194-8757-5, p. 81470D
doi: 10.1117/12.893418

Bavdaz, M.; Rando, N.; Wille, E.; Wallace, K.; Shortt, B.; Collon, M.; Van Baren, C.; Pareschi, G.; Christensen, F.; Krumrey, M.; Freyberg, M.: ESA-led ATHENA/IXO Optics Development Status. , In: Stephen L. O'Dell ... [Ed.] : Optics for EUV, X-Ray, and Gamma-Ray Astronomy V : 23 - 25 August 2011, San Diego, California, United States. SPIE, 2011 (Proceedings of SPIE ; 8147). - ISBN 978-0-8194-8757-5, p. 81470C/1-8
doi: 10.1117/12.893567

Scholze, F.; Kato, A.; Wernecke, J.; Krumrey, M.: EUV and X-ray scattering methods for CD and roughness measurement. , In: Wilhelm Maurer ... [Ed.] : Photomask Technology 2011 : 19 - 22 September 2011, Monterey, California, United States. , 2011 (Proceedings of SPIE ; 8166). - ISBN 978-0-8194-8791-9, p. 81661P/1-12
doi: 10.1117/12.896847

Shi, L.; Nihtianov, S.; Scholze, F.; Gottwald, A.; Nanver, L.K.: High-sensitivity high-stability silicon photodiodes for DUV, VUV and EUV spectral ranges. , In: Oswald H. Siegmund [Ed.] : UV, X-Ray, and Gamma-Ray Space Instrumentation for Astronomy XVII. SPIE, 2011 (Proceedings of SPIE ; 8145). - ISBN 978-0-8194-8755-1, p. 81450N/1-9
doi: 10.1117/12.891865

Henn, M.-A.; Gross, H.; Scholze, F.; Elster, C.; Bär, M.: Improved geometry reconstruction and uncertainty evaluation for extreme ultraviolet (EUV) scatterometry based on maximum likelyhood estimation. , In: Bernd Bodermann ... [Ed.] : Modeling Aspects in Optical Metrology III : 23 - 24 May 2011, Munich, Germany. SPIE, 2011 (Proceedings of SPIE ; 8083). - ISBN 978-0-8194-8679-0, p. 80830N/1-10
doi: 10.1117/12.889479

Burger, S.; Zschiedrich, S.; Pomplun, J.; Schmidt, F.; Kato, A.; Laubis, C.; Scholze, F.: Investigation of 3D patterns on EUV masks by means of scatterometry and comparison to numerical simulation. , In: Wilhelm Maurer ... [Ed.] : Photomask Technology 2011 : 19 - 22 September 2011, Monterey, California, United States. , 2011 (Proceedings of SPIE ; 8166). - ISBN 978-0-8194-8791-9, p. 81661Q/1-8
doi: 10.1117/12.896839

Cuony, P.; Alexander, D.T.L.; Löfgren, L.; Krumrey, M.; Marending, M.; Despeisse, M.; Ballif, C.: Mixed phase silicon oxide layers for thin-film silicon solar cells. , In: B. Yan ... [Ed.] : Amorphous and polycrystalline thin-film silicon science and technology - 2011 : symposium held April 25 - 29, 2011, San Francisco, California, U.S.A.. Warrendale, Pa.: MRS, 2011 (Materials Research Society symposium proceedings ; 1321). - ISBN 978-1-60511-298-5, p. 349-354
doi: 10.1557/opl.2011.813

Mantouvalou, I.; Jung, R.; Tuemmler, J.; Legall, H.; Bidu, T.; Stiel, H.; Malzer, W.; Kanngiesser, B.; Sandner, W.: Note: Study of extreme ultraviolet and soft x-ray emission of metal targets produced by laser-plasma-interaction. , Review of Scientific Instruments 82 (2011), p. 066103/1-3
doi: 10.1063/1.3600069

Lobo, L.; Fernandez, B.; Pereiro, R.; Bordel, N.; Demenev, E.; Giubertoni, D.; Bersani, M.; Hönicke, P.; Beckhoff, B.; Sanz-Medel, A.: Quantitative depth profiling of boron and arsenic ultra low energy implants by pulsed rf-GD-ToFMS. , Journal of Analytical Atomic Spectrometry 26 (2011), p. 542-549
doi: 10.1039/c0ja00197j

Fleischmann, C.; Houssa, M.; Sioncke, S.; Beckhoff, B.; Müller, M.; Hönicke, P.; Meuris, M.; Temst, K.; Vantomme, A.: Self-Affine Surface Roughness of Chemically and Thermally Cleaned Ge(100) Surfaces. , Journal of The Electrochemical Society 158 (2011), p. H1090-H1096
doi: 10.1149/1.3624762

Arp, U.; Klein, R.; Li, Z.; Paustian, W.; Richter, M.; Shaw, P.S.; Thornagel, R.: Synchrotron radiation-based bilateral intercomparison of ultraviolet source calibrations. , Metrologia 48 (2011), p. 261 - 267
doi: 10.1088/0026-1394/48/5/004

Krumrey, M.; Gleber, G.; Scholze, F.; Wernecke, J.: Synchrotron radiation-based x-ray reflection and scattering techniques for dimensional nanometrology. , Measurement Science & Technology 22 (2011), p. 094032/1-6
doi: 10.1088/0957-0233/22/9/094032

Kato A., ; Scholze, F.: The effect of line roughness on the diffraction intensities in angular resolved scatterometry. , In: Bernd Bodermann ... [Ed.] : Modeling Aspects in Optical Metrology III,. Bellingham, Wash., 2011 (Proceedings of SPIE ; 8083). - ISBN 978-0-8194-8679-0, p. 80830K/1-8
doi: 10.1117/12.899016

Granato, S.; Andritschke, R.; Elbs, J.; Meidinger, N.; Strüder, L.; Weidenspointner, G.; Krumrey, M.; Scholze, F.: The spectral redistribution function of eROSITA PNCCDs. , IEEE Transactions on Nuclear Science 122 (2011), p. N8-2/122-128
doi: 10.1109/NSSMIC.2011.6154464

Barthelmess, M.; Bajt, S.: Thermal and stress studies of normal incidence Mo/B4C multilayers for a 6.7 nm wavelength. , Applied Optics 50 (2011), p. 1610-1619
doi: 10.1364/AO.50.001610

Fleischmann, C.; Sioncke, S.; Couet, S.; Schouteden, K.; Beckhoff, B.; Müller, M.; Hönicke, P.; Kolbe, M.; Van Haesendonck, C.; Meuris, M.; Temst, K.; Vantomme, A.: Towards Passivation of Ge(100) Surfaces by Sulfur Adsorption from a (NH4)2S Solution: A Combined NEXAFS, STM and LEED Study. , Journal of The Electrochemical Society 158 (2011), p. H589-H594
doi: 10.1149/1.3566846

2010

Baake, O.; Hoffmann, P.S.; Kosinova, M.L.; Klein, A.; Pollakowski, B.; Beckhoff, B.; Fainer, N.I.; Trunova, V.A.; Ensinger, W.: Analytical characterization of BCxNy films generated by LPCVD with triethylamine borane. , Analytical and Bioanalytical Chemistry 398 (2010), p. 1077-1084
doi: 10.1007/s00216-010-3965-4

Laubis, C.; Kampe, A.; Buchholz, C.; Fischer, A.; Puls, J.; Stadelhoff, C.; Scholze, F.: Characterization of the polarization properties of PTB's EUV reflectometry system. , In: Bruno M. La Fontaine ... [Ed.] : Extreme ultraviolet (EUV) lithography : 22 - 25 February 2010, San Jose, California, United States. SPIE, 2010 (Proceedings of SPIE ; 7636). - ISBN 978-0-8194-8050-7, p. 76362R/1-11
doi: 10.1117/12.845098

Hönicke, P.; Beckhoff, B.; Kolbe, M.; Giubertoni, D.; van den Berg, J.; Pepponi, G.: Depth profile characterization of ultra shallow junction implants. , Analytical and Bioanalytical Chemistry 396 (2010), p. 2825-2832
doi: 10.1007/s00216-009-3266-y

Kato, A.; Scholze, F.: Effect of line roughness on the diffraction intensities in angular resolved scatterometry. , Applied Optics 49 (2010), p. 6102-6110
doi: 10.1364/AO.49.006102

Streeck, C.; Beckhoff, B.; Reinhardt, F.; Kolbe, M.; Kanngießer, B.; Kaufmann, C.A.; Schock, H.W.: Elemental depth profiling of Cu(In,Ga)Se2 thin films by reference-free grazing incidence X-ray fluorescence analysis. , Nuclear Instruments & Methods in Physics Research B 268 (2010), p. 277-281
doi: 10.1016/j.nimb.2009.09.051

Bridou, F.; Cuniot-Ponsard, M.; Desvignes, J.-M.; Richter, M.; Kroth, U.; Gottwald, A.: Experimental determination of optical constants of MgF2 and AlF3 thin films in the vacuum ultra-violet wavelength region (60-124 nm), and its application to optical designs. , Optics Communications 283 (2010), p. 1351-1358
doi: 10.1016/j.optcom.2009.11.062

Klein, R.; Thornagel, R.; Ulm, G.: From single photons to milliwatt radiant power - electron storage rings as radiation sources with a high dynamic range. , Metrologia 47 (2010), p. R33-R40
doi: 10.1088/0026-1394/47/5/R02

Pagels, M.; Reinhardt, F.; Pollakowski, B.; Roczen, M.; Becker, C.; Lips, K.; Rech, B.; Kanngießer, B.; Beckhoff, B.: GIXRF–NEXAFS investigations on buried ZnO/Si interfaces: A first insight in changes of chemical states due to annealing of the specimen. , Nuclear Instruments & Methods in Physics Research B 268 (2010), p. 370 - 373
doi: 10.1016/j.nimb.2009.09.009

Pepponi, G.; Giubertoni, D.; Bersani, M.; Meirer, F.; Ingerle, D.; Steinhauser, G.; Streli, C.; Hoenicke, P.; Beckhoff, B.: Grazing incidence x-ray fluorescence and secondary ion mass spectrometry combined approach for the characterization of ultrashallow arsenic distribution in silicon. , Journal of Vacuum Science & Technology B 28 (2010), p. C1C59-C1C64
doi: 10.1116/1.3292647

Krumrey, M.; Cibik, L.; Müller, P.: High-accuracy X-ray detector calibration based on cryogenic radiometry. , In: Garrett, R... [Ed.] : 10th International Conference on Synchrotron Radiation Instrumentation : Australian Synchrotron, . SPIE, 2010 (AIP conference proceedings ; 1234). - ISBN 978-0-7354-0782-4, p. 826 - 829
doi: 10.1063/1.3463341

Zwinkels, J.C.; Ikonen, E.; Fox, N.P.; Ulm, G.; Rastello, M.R.: Photometry, radiometry and 'the candela': evolution in the classical and quantum world. , Metrologia 47 (2010), p. R15-R32
doi: 10.1088/0026-1394/47/5/R01

Saito, N.; Juranic, P.N.; Kato, M.; Richter, M.; Sorokin, A.A.; Tiedke, K.; Jastrow, U.; Kroth, U.; Schöppe, H.; Nagasono, M.; Yabashi, M.; Tono, K.; Togashi, T.; Kimura, H.; Ohashi, H.; Ishikawa, T.: Radiometric comparison for measuring the absolute radiant power of a free-electron laser in the extreme ultraviolet. , Metrologia 47 (2010), p. 21-23
doi: 10.1088/0026-1394/47/1/003

Scholze, F.; Vest, R.; Saito, T.: Report on the CCPR Pilot Comparison: Spectral Responsivity 10 nm to 20 nm. , Metrologia 47 (2010), p. 2001/1-30
doi: 10.1088/0026-1394/47/1A/02001

Sokaras, D.; Muller, M.; Kolbe, M.; Beckhoff, B.; Zarkadas, C.; Karydas, A.G.: Resonant Raman scattering of polarized and unpolarized x-ray radiation from Mg, Al, and Si. , Physical Review A 81 (2010), p. 012703/1-9
doi: 10.1103/PhysRevA.81.012703

Collon, M.J.; Günther, R.; Ackermann, M.; Partapsing, R.; Vacanti, G.; Beijersbergen, M.W.; Bavdaz, M.; Wille, E.; Wallace, K.; Riekerink, M.O.; Lansdorp, B.; de Vrede, L.; van Baren, C.; Müller, P.; Krumrey, M.; Freyberg, M.: Silicon Pore X-ray Optics for IXO. , In: Monique Arnaud ... [Ed.] : Space Telescopes and Instrumentation 2010: Ultraviolet to Gamma Ray. SPIE, 2010 (Proceedings of SPIE ; 7732). - ISBN 978-0-8194-8222-8, p. 77321F
doi: 10.1117/12.858166

Gleber, G.; Cibik, L.; Haas, S.; Hoell, A.; Müller, P.; Krumrey, M.: Traceable size determination of PMMA nanoparticles based on Small Angle X-ray Scattering (SAXS). , Journal of Physics : Conference Series 247 (2010), p. 12027/1-6
doi: 10.1088/1742-6596/247/1/012027

Giubertoni, D.; Iacob, E.; Hoenicke, P.; Beckhoff, B.; Pepponi, G.; Gennaro, S.; Bersani, M.: Ultralow energy boron implants in silicon characterization by nonoxidizing secondary ion mass spectrometry analysis and soft x-ray grazing incidence x-ray fluorescence techniques. , Journal of Vacuum Science & Technology B 28 (2010), p. C1C84-C1C89
doi: 10.1116/1.3292638

Krumrey, M.; Cibik, L.; Müller, P.; Bavdaz, M.; Wille, E.; Ackermann, M.; Collon, M.J.: X-ray pencil beam facility for optics characterization. , In: Monique Arnaud ... [Ed.] : Space Telescopes and Instrumentation 2010: Ultraviolet to Gamma Ray. SPIE, 2010 (Proceedings of SPIE ; 7732). - ISBN 978-0-8194-8222-8, p. 77324O/1-8
doi: 10.1117/12.857335

PTB Laboratory at BESSY II