• Roshchupkin, D.; Ortega, L.; Vadilonga, S.; Zizak, I.; Emelin, E.; Plotitcyna, O.; Thiaudiere, D.; Leitenberger, W.; Formoso, V.; Fettar, F.: X-ray diffraction on La3Ga5SiO14 crystal modulated by SAW near the K absorption edge of Ga. Applied Physics Letters 116 (2020), p. 174101/1-4

10.1063/5.0002388
Open Access Version (externer Anbieter)