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  Weber, A.; Mainz, R.; Schock, H.-W.: On the Sn loss from thin films of the material system Cu-Zn-Sn-S in high vacuum. Journal of Applied Physics 107 (2010), p. 013516/1-6

10.1063/1.3273495
Open Access Version

Abstract:
In this paper the Sn-loss from thin films of the material system Cu-Zn-Sn-S and the sub-systems Cu-Sn-S and Sn-S in high vacuum is investigated. A combination of in-situ X-ray diffractometry (XRD) and X-ray fluorescence (XRF) at a synchrotron light source allowed identifying phases which tend to decompose and evaporate a Sn-containing compound. On the basis of the XRF-results a quantification of the Sn-loss from the films during annealing experiments is presented. It can be shown that the evaporation rate from the different phases is decreasing according to the order SnS→Cu2SnS3→Cu4SnS4→Cu2ZnSnS4. The Phase SnS is assigned as the evaporating compound. The influence of an additional inert gas component on the Sn-loss and on the formation of Cu2ZnSnS4 thin films is discussed.