Ries, M.; Feikes, J.; Schmid, P.; Wüstefeld, G.; Hoehl, A.: THz Bursting Thresholds Measured at the Metrology Light Source. In: Proceedings of IPAC 2012, New Orleans, Louisiana, USA, 2012. - ISBN 978-3-95450-115-1, p. WEPPR046/3030-3031
http://accelconf.web.cern.ch/accelconf/IPAC2012/papers/weppr046.pdf
Abstract:
At the Metrology Light Source (MLS) [1] owned by the Physikalisch-Technische Bundesanstalt (PTB) the bunch length can be varied by more than two orders of magnitude [2]. The bunch length manipulation is achieved by varying different machine parameters, such as RF-voltage amplitude up to 500 kV and the momentum compaction factor α over three orders of magnitude. The subject of this article is the measurement of THz bursting thresholds at the MLS for different bunch lengths.