de Rooij-Lohmann, V.I.T.A.; Yakshin, A.E.; van de Kruijs, R.W.E.; Zoethout, E.; Kleyn, A.W.; Keim, E.G.; Gorgoi, M.; Schaefers, F.; Brongersma, H.H.; Bijkerk, F.: Enhanced diffusion upon amorphous-to-nanocrystalline phase transition in Mo/B4C/Si layered systems. Journal of Applied Physics 108 (2010), p. 014314
10.1063/1.3460107
Open Access Version (externer Anbieter)
Abstract:
The effect of an amorphous-to-nanocrystalline phase transition on the diffusion across an interface layer of subnanometer thickness has been investigated in real-time. The diffusion in the Mo/B4C/Si thin film structure studied was found to instantaneously enhance by an order of magnitude upon the formation of nanocrystals inducing the atomic-scale onset of grain boundary diffusion.