Trabant, C.; Pontius, N.; Schierle, E.; Weschke, E.; Kachel, T.; Springholz, G.; Holldack, K.; Föhlisch, A.; Schüßler-Langeheine, C.: Time and momentum resolved resonant magnetic x-ray diffraction on EuTe. EPJ Web of Conferences 41 (2013), p. 03014/1-3
10.1051/epjconf/20134103014

Abstract:
We used fs- and ps- resonant magnetic x-ray diffraction to probe the laser-induced changes to the magnetic profile in thin films of the antiferromagnetic semicon-ductor EuTe.