Lockau, D.; Hammerschmidt, M.; Haschke, J.; Blome, M.; Ruske, F.; Schmidt, F.; Rech, B.: A comparison of scattering and non-scattering anti-reflection designs for back contacted polycrystalline thin film silicon solar cells in superstrate configuration. In: Ralf B. Wehrspohn; Andreas Gombert [Eds.] : Photonics for Solar Energy Systems V, 14 - 16 April 2014, Brussels, Belgium. SPIE, 2014 (Proceedings of SPIE ; 9140). - ISBN 978-1-62841-088-4, p. 914006/1-14
A new generation of polycrystalline silicon thin film solar cells is currently being developed in laboratories, employing a combination of novel laser or electron beam based liquid phase crystallization (LPC) techniques and single side contacting systems. The lateral grain size of these polycrystalline cells is in the millimeter range at an absorber thickness of up to 10 μm. In this contribution we present a comparative simulation study of several 1D, 2D and 3D nano-optical designs for the substrate / illumination side interface to the several micrometer thick back contacted LPC silicon absorber material. The compared geometries comprise multilayer coatings, gratings with step and continuous profiles as well as combinations thereof. Using the transfer matrix method and a finite element method implementation to rigorously solve Maxwell’s equations, we discuss anti-reflection and scattering properties of the different front interface designs in view of the angular distribution of incident light.