Cimino, R.; Schäfers, F.: Soft X-Ray Reflectivity and Photoelectron Yield of Technical Materials: Experimental Input for Instability Simulations in High Intensity Accelerators. In: Proceedings of IPAC 2014, Dresden, GermanyDresden, 2014. - ISBN 978-3-95450-132-8, p. 2335-2337
Abstract:
High luminosity particle accelerators can suffer from serious performance drop or limitations due to interaction of the synchrotron radiation produced by the accelerator itself with the accelerator walls. Such interaction may produce a number of photoelectrons, that can either seed electron cloud related instabilities and/or interact anyway with the beam itself, potentially causing its deterioration. To correctly take these effects into account simulation codes depends on the realistic knowledge of Reflectivity and Photoelectron Yield of technical material. In this work we present relevant experimental data for some of the mostly used technical surfaces in accelerators.