Sun, Fu.; Markötter, H.; Dong, K.; Manke, I.; Hilger, A.; Kardjilov, N.; Banhart, J.: Investigation of failure mechanisms in silicon based half cells during the first cycle by micro X-ray tomography and radiography. Journal of Power Sources 321 (2016), p. 174-184
10.1016/j.jpowsour.2016.04.126
Open Access Version
