• Roodenko, K.; Aureau, D.; Yang, F.; Thissen, P.; Rappich, J.: Characterization of Thin Organic Films with Surface-Sensitive FTIR Spectroscopy. In: Karsten Hinrichs, Klaus-Jochen Eichhorn [Ed.] : Ellipsometry of Functional Organic Surfaces and FilmsCham: Springer, 2014 (Springer Series in Surface Sciences ; 52). - ISBN 978-3-642-40127-5, p. 305-324

10.1007/978-3-642-40128-2_15