Kot, M.; Das, C.; Henkel, K.; Wojciechowski, K.; Snaith, H.; Schmeisser, D.: Room temperature atomic layer deposited Al2O3 on CH3NH3PbI3 characterized by synchrotron-based X-ray photoelectron spectroscopy. Nuclear Instruments & Methods in Physics Research B 411 (2017), p. 49-52
10.1016/j.nimb.2017.01.082