• Bär, M.; Weinhardt, L.; Heske, C.: Soft X-ray and Electron Spectroscopy: A Unique "Tool Chest" to Characterize the Chemical and Electronic Properties of Surfaces and Interfaces. In: Advanced Characterization Techniques for Thin Film Solar Cells: Second EditionWeinheim: Wiley, 2016. - ISBN 978-3-527-41003-3, p. 501-522

10.1002/9783527699025.ch18