• Klaus, M.; Genzel, C.: Residual Stresses in Thin Films and Coated Tools: Challenges and Strategies for Their Nondestructive Analysis by X-ray Diffraction Methods. In: Peter Staron ... [Ed.] : Neutrons and Synchrotron Radiation in Engineering Materials Science : From Fundamentals to Applications: Second EditionWeinheim: Wiley, 2017. - ISBN 978-3-527-33592-3, p. 439-449

10.1002/9783527684489.ch24