Business card Dr. Andreas Furchner
Research Focus and Expertise:
• Investigation of optical, structural, and transport properties of thin films and microscopic samples
• Determination of optical constants (dielectric tensor) of isotropic and anisotropic materials
• Development of polarimetric and spectroscopic measurement concepts
• Quantitative thin film analysis
• Optical modeling of complex multilayer structures
Methods:
• UV–Vis–NIR Imaging Ellipsometry (Hyperspectral Amplitude–Phase Imaging)
• Infrared Mueller-Matrix Polarimetry
• Infrared Laser Ellipsometry
• In Situ Infrared Spectroscopy (from s to ms to µs)