Nondestructive testing in analytical chemistry
The first hard x-ray beamline at BESSY II has been installed by BAM and PTB at a superconducting 7 T wavelength shifter. The main optical elements of the beamline are a double-multilayer monochromator and a double-crystal monochromator. Depending on the application, the two devices are used separately or in-line. The main applications of the monochromatic radiation with photon energies up to 60 keV are x-ray fluorescence analysis, micro computed tomography, x-ray topography, detector calibration and reflectometry. Calculable undispersed radiation up to 200 keV is available for radiometric applications.List of publications
|Pressure Range||Check text below. For more details contact the station manager.|
|Detector||Color X-Ray Camera pnCCD, e2V Si-Li, Bruker X-Flash, CCD, optical microscope|
|Manipulators||Check text below. For more details contact the station manager.|
|Sample holder compatibility||Check text below. For more details contact the station manager.|
|Energy range||5-100 keV|
MethodsNEXAFS, myXRF, XRF, X-ray Tomography
The BAMline is specialized for nondestructive material characterization using different methods. Depending on the requirements the used beam size varies between 1.5 and 10000µm.
Following methods are available:
1) μ-XRF mapping in scanning mode.
Resolution depends on the used optics and can be selected between 1.5 and 200µm. Primary beam energy range is 5keV-65keV.
2) μ-XRF mapping with color x-ray camera CXC.
Fast one shot imaging with resolution between 10 and 50µm. Primary beam energy range is 5keV-35keV.
3) 3D XRF-Mapping.
In slicing, or x-ray sheet microscopy, the excitation of the sample is realized with a thin sheet-beam and the detection with the CXC. The stepwise movement of the sample allows getting the element distribution for each layer with one measurement. These layers can be combined to a full 3D data set for each element afterwards. Since the information is collected layer per layer, there is no need to apply reconstruction techniques, which can be the reason for artifacts in the results.
4) EXAFS and XANES. The acquisition of the energy-dependent absorption spectra on selected position at the sample is possible in fluorescence and absorption mode.
5) Computer Tomographie
6) Optical microscope is available for alignment purposes. The microscopy images can be saved at every measurement coordinate, so that the correlation between the measured data and the microscopy is rather simple.
Different scanning environments for different sample sizes (from several micrometer to 150mm) are available at the beamline. Rotational units are available as well.
There is no vacuum environment available at the beamline, but it is possible to mount sample environments or reactors in the experimental hutch.
Temperature in experimental hutch is controlled.
For Information about XRF please contact firstname.lastname@example.org. For EXAFS/XANES and CT email@example.com and for general information firstname.lastname@example.org or email@example.com .