• 
  Sadewasser, S.; Abou-Ras, D.; Azulay, D.; Baier, R.; Balberg, I.; Cahen, D.; Cohen, S.; Gartsman, K.; Ganesan, K.; Kavalakkatt, J.; Li, W.; Millo, O.; Rissom, Th.; Rosenwaks, Y.; Schock, H.-W.; Schwarzman, A.; Unold, T.: Nanometer-scale electronic and microstructural properties of grain boundaries in Cu(In,Ga)Se₂. Thin Solid Films 519 (2011), p. 7341-7346

10.1016/j.tsf.2010.12.227