Programme

(As of 3rd March 2022 - subject to change)

Due to the ongoing pandemic situation and consequent restrictions, the workshop will be held ONLINE only. The new event format (digital) and the large number of excellent submissions have made it possible to put together a very special programme. In order to include as many submissions as possible in the programme, the event will now take place over four days (instead of three) till Friday 8^th April.

Important: All times are CEST times. Please check your local time here

Scientific Programme

Tuesday, 5th April

DAY 1 | Tuesday, 5th April

14:00 | Welcome

14:10 | Session 01 | Fabrication and finishing technology for X-ray mirrors

14:10 | Development of a monolithic Wolter-type mirror for stable hard X-ray focusing | Yasunori Senba (Spring-8)

14:30 | Fabrication of XFEL sub-10 nm focusing optics based on advanced Kirkpatrick-Baez mirrors | Jumpei Yamada (Spring-8)

14:50 | Three-dimensional shape measurement of monolithic Wolter mirror for soft X-ray | Takehiro Kume (Natsume Optical Cooperation

15:10 | Multilayer focusing mirrors for intense X-rays from SR and XFEL sources | Takahisa Koyama (Spring-8)

15:30 | Development of high-precision X-ray mirrors using deterministic fabrication techniques and stitching interferometry | Qiushi Huang (Tonji Univ.)

15:50 | Poster Session 01

16:50 | Session 02 | Metrology challenges for X-ray mirrors I

16:50 | MooNpics – European metrology collaboration in a large-scale round-robin test | Silja Schmidtchen (Europ. XFEL)

17:10 | In pursuit of fundamental limits in deflectometric form measurement: Current status and future challenges | Ralf Geckeler (PTB)

17:30 | Knowing the Limits - Surface Deviation in the Mid-Spatial-Frequency Range by Deflectometric Measurements | Ronald Kometer (Hofbauer Optik Mess- und Prüftechnik)

17:50 | Optimized design of the ALS LTP-2020 using geometrical and physical optics raytracing | Peter Takacs (SMS)

18:10 | Binary pseudo-random test standards for characterization of various metrology instruments over high to mid spatial frequencies | Keiko Munechika (HighRI Optics)

Wednesday, 6th April

DAY 2 | Wednesday, 6^th April

14:00 | Warm-up

14:10 | Session 03 | X-Ray optics for astronomy

14:10 | Electroformed X-ray Optics for Microscopy and Astronomy | Hidekazu Mimura (Univ. of Tokyo)

14:30 | BEaTriX, the new X-ray facility for PSF and Effective Area calibration of X-ray optics | Stefano Basso (INAF)

14:50 | Characterization of silicon pore optics for the ATHENA observatory at the X-ray parallel beam facility XPBF 2.0 | Michael Krumrey (PTB)

15:10 | Modelling diffractive effects in Silicon Pore Optics mirror modules for the ATHENA X-ray telescope | Daniele Spiga (INAF)

15:30 | Development in carbon-based coatings for X-ray astronomy | Giacomo Rivolta (INAF)

15:50 | Poster Session 02

16:50 | Session 04 | Metrology challenges for X-ray mirrors II

16:50 | PyXsurf: an open-source library for analysis of surface metrology data | Vincenzo Controneo (INAF)

17:10 | Study of acquisition strategies for sub-aperture stitching using Fizeau interferometry | Amparo Vivo (ESRF)

17:30 | Subaperture stitching algorithms for X-ray mirror metrology | Bharrath Reddi Adapa (ESRF)

17:50 | X-ray demonstration of real-time, sub-nanometre, closed-loop control of a bimorph deformable mirror using in-situ interferometric feedback | Ioana-Theodora Nistea (Diamond Light Source)

18:10 | The importance of retrace errors for high-quality Fizeau interferometry | Katherine Morrow (STFC)

Thursday, 7th April

DAY 3 | Thursday, 7^th April

14:00 | Warm-up

14:10 | Session 05 | Active and adaptive optics for X-ray applications

14:10 | Announcement of the Giovani Sostero Award

14:30 | Ion beam figuring of synchrotron mirrors at NSLS-II | Tiany Wang (BNL)

14:50 | Piezo-electric adaptive optics for synchrotron and FEL application | Joern Weber (Carl-Zeiss)

15:10 | Metrology for Active X-Ray Optics by Long Trace Profiler | Shangwei Lin (NSRRC)

15:30 | A design method of X-ray focusing mirrors capable of correcting arbitrary astigmatism | Yoko Takeo (Univ. of Tokyo)

15:50 | Poster Session 03

16:50 | Session 06 | Optics at new storage ring and free-electron laser sources

16:50 | On the inspection of optics for the MAX IV synchrotron radiation facility – experiences and conclusions | Frank Siewert (HZB)

17:10 | Metrology for “hybrid” reflection zone plates on spherical substrates | Alexei Erko (IAP)

17:30 | Accounting for Spatial Frequency Distribution in X-ray Mirror Surface Specifications | Francois Polack (Soleil)

17:50 | Design, specification, optical metrology and commissioning of a pre- KB mirror for zoom-tomography | Bernd Meyer (LNLS)

18:10 | The Advanced Photon Source New Slope Measuring System: Upgrades, Performance, and Results of Mirror Measurements | Lahsen Assoufid (APS)

Friday, 8th April

DAY 4 | Friday, 8^th April

14:00 | Warm-up

14:10 | Session 07 | In-situ metrology and wave front measurements

14:10 | At-wavelength wavefront evaluation of a Schwarzschild objective using a high numerical aperture wavefront sensor | Mabel Ruiz Lopez (DESY)

14:30 | X-ray mirrors metrology with Speckle Angular Measurement | Simone Moriconi (DIAMOND)

14:50 | High-Precision At-Wavelength Metrology facility for XUV diffractive optics at BESSY-II | Andrey Sokolov (HZB)

15:10 | Optical constants in the EUV regime and the redesign of PTB’s soft X-ray beamline at BESSY II | Richard Ciesielski (PTB)

15:30 | Advanced X-ray wavefront sensing technology developments at the Advanced Photon Source | Zhi Qiao (APS)

15:50 | Poster Session 04

16:50 | Session 08 | Metrology challenges for X-ray mirrors III

16:50 | Diamond-VeNOM: a high-speed, double-autocollimator, slope profiler for characterising X-ray mirrors | Simon Alcock (Diamond)

17:10 | The stitching interferometry instrument of ALBA | Josep Nicolas (ALBA)

17:30 | Progress report on the development of stitching interferometry instrumentation at SOLEIL | Muriel Thomasset (Soleil)

17:50 | Recent development on optical metrology at NSLS-II | Lei Huang (BNL)

18:10 | The art of high-accuracy ex situ metrology for x-ray optics developed at the Advanced Light Source | Valeriy Yashchuk (LBNL)

Poster Sessions

Poster Sessions 01 (5th April) /03 (7th April)

Poster Sessions 01 (5th April) / 03 (7th April)
P01	Round-robin comparison and repolishing of a 3-lane ellipse X-ray mirror from the MooNpics collaboration between European light sources and X-ray optic manufacturers, Simon Alcock (Diamond Light Source)
P02	Mechanical bending of high performance x-ray mirrors, Konstantin Andrianov (Axilon)
P06	Active optics systems at the ALBA beamlines, Nahikari González (ALBA)
P08	The TPS 34 Metrology Laboratory and Bendable Mirror Measurement Long Trace Profiler Test, Ming-Ying Hsu (NSRRC)
P12	Development of an advanced LTP at the ALS: Operation and data acquisition with a two-carriage gantry system, Ian Lacey (LBNL, Advanced Light Source)
P13	Update on the grating manufacturing at HZB: high line density blazed and long aperture laminar gratings, Stephanie Lemke (Helmholtz-Zentrum Berlin)
P14	Measurement of the first pair of high accuracy K-B mirrors of HEPS by FSP, Ming Li (HEPS)
P18	Strategies for focus and position stability based on the beamline error response matrix, Josep Nicolas (ALBA)
P20	A Fizeau interferometry stitching system to characterize X-ray mirrors with sub-nanometre errors, Morilo Bazan da Silva (Diamond Light Source)
P21	Specifications of beamline optics towards next generation light sources - contamination free and figure errors of under 50 pm, Haruhiko Ohashi (JASRI SPring-8)
P24	Reflection Zone Plates on Curved Substrates, Jürgen Probst (IAP)
P27	Optical metrology for full characterization of mirror benders, Igors Sics (ALBA)
P30	Development and the optimization of X-ray optics-on-chip for nano-focusing synchrotron beamlines, Harm van der Velde (University of Twente)
P31	Ion beam figuring of synchrotron mirrors at NSLS-II, Tianyi Wang (BNL)
P32	Recent progress on the focusing long trace profiler at HEPS/BSRF, Fugui Yang (HEPS)

Poster Sessions 02 (6th April) /04 (8th April)

Poster Sessions 02 (6^th April) / 04 (8^th April)
P03	Optical coherence tomography using extreme ultraviolet sources as a tool for metrology of multilayer optics, Antony Jose Arikkatt (Military University of Technology, Warsaw)
P04	Coherence diagnostics for synchrotron beamlines using the Fourier-analysis method: Enabling systematic time-resolved 2D spatial-coherence studies, Kai Bagschik (DESY)
P05	Reflection Diffractive Elements for modern physics experiments at HZB, Alexander Firsov (Helmholtz-Zentrum Berlin)
P07	Ion Beam Figuring (IBF) of X-ray mirrors at Diamond Light Source, Matthew Hand (Diamond Light Source)
P09	Recent developments and applications of X-ray speckle-based techniques at the Diamond Light Source, Lingfei Hu (Diamond Light Source)
P10	The challenge of precise grating characterization using AFMs at HZB, Jeniffa Knedel (Helmholtz-Zentrum Berlin)
P11	Wavefront measurements for high heat road optics by using Talbot interferometer with calibrated gratings, Takahisa Koyama (JASRI SPring-8)
P15	A hybrid measurement scheme for nanometrology using soft X-rays, Leonhard Lohr (PTB)
P16	Single-shot wavefront characterisation employing ptychography at X-ray free-electron lasers, Masoud Mehrjoo (DESY)
P19	WOW, a quick wavefront propagation simulation tool for beamline design and specification, Josep Nicolas (ALBA)
P23	Latest results of pure ellipsoidal surfaces figure, Iulian Preda (Crystopt-X)
P25	Super-resolution image reconstruction for surface metrology of x-ray optics, Simon Rochester (Rochester Scientific, LLC)
P26	Design, fabrication, and testing of 2-mm-long X-ray mirrors for soft-X-ray nanofocusing, Takenori Shimamura (The University of Tokyo)
P28	Automated Design and Optimization of Transfocators, Peter Sondhauss (MAX-IV)
P29	Preparation and characterization of Mo/B4C bi- and multilayer mirrors, Michael Störmer (Helmholtz-Zentrum Hereon)
P33	In-situ measurement of thermal deformations of mirrors under undulator radiation using Fizeau interferometer, Hirokatsu Yumoto (JASRI SPring-8)

Book of Abstracts

Book of Abstracts
As of 03.04.2022 (subject to change)