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Photon School

On-site Trainings

Training 01

TD-DFT simulations of K-edge resonant inelastic X-ray scattering

TD-DFT simulations of K-edge resonant inelastic X-ray scattering

Vinícius Vaz da Cruz, Sebastian Eckert, Eric Mascarenhas

Training 02

Accessing deeply buried interfaces via Hard X-ray Photoelectron Spectroscopy

Accessing deeply buried interfaces via Hard X-ray Photoelectron Spectroscopy

Roberto Félix Duarte, Marcus Bär

Training 03

Revealing band structures of 2D materials using Angle-resolved photoemission (ARPES)

Revealing band structures of 2D materials using Angle-resolved photoemission (ARPES)

Maryam Sajedi, Maxim Krivenkov

Training 04

Exfoliation and X-ray imaging of 2D materials

Exfoliation and X-ray imaging of 2D materials

Alevtina Smekhova, Florian Kronast

Training 05

Tomoscopy: Time-resolved 3D imaging

Tomoscopy: Time-resolved 3D imaging

Paul Kamm and Francisco Garcia-Moreno

Training 06

Multiple Energy Anomalous X-ray Diffraction (MEAD) on quaternary semiconductors

Multiple Energy Anomalous X-ray Diffraction (MEAD) on quaternary semiconductors

Daniel Többens

Training 07

Monitoring buried interface formation using in-system laboratory- and synchrotron-based photoelectron spectroscopy

Monitoring buried interface formation using in-system laboratory- and synchrotron-based photoelectron spectroscopy

Johannes Frisch, Regan Wilks, Marcus Bär

Training 08

XANES in Standing Wave Geometry to study an interface between the W and Si Layer

XANES in Standing Wave Geometry to study an interface between the W and Si Layer

Ivo Zizak

Training 09

Resonant Inelastic X-ray Scattering (RIXS)

Resonant Inelastic X-ray Scattering (RIXS)

Chun-Yu Liu and Maximilian Kusch

Training 10

At-wavelength characterization of XUV diffraction gratings

At-wavelength characterization of XUV diffraction gratings

Andrey Sokolov and Analía Fernández Herrero

Training 11

MX beamlines

MX beamlines

Manfred S. Weiss & Uwe Mueller

Training 12

Characterization of layered systems using X-ray Reflectometry (XRR) and Grazing incidence X-ray fluorescence analysis (GIXRF)

Characterization of layered systems using X-ray Reflectometry (XRR) and Grazing incidence X-ray fluorescence analysis (GIXRF)

Phillipp Hönicke, Christian Gollwitzer

Training 13

MAXYMUS (MAgnetic X-raY Microscope with UHV Spectroscopy)

MAXYMUS (MAgnetic X-raY Microscope with UHV Spectroscopy)

Markus Weigand

Training 14

Investigation of magnetic materials for spintronics by X-ray magnetic circular dichroism at VEKMAG

Investigation of magnetic materials for spintronics by X-ray magnetic circular dichroism at VEKMAG

Florin Radu

Training 15

Coincidence Electron Spectroscopy for Chemical Analysis CoESCA at UE52-PGM

Coincidence Electron Spectroscopy for Chemical Analysis CoESCA at UE52-PGM

Swarnshikha Sinha and Danilo Kühn

Training 16

Investigation of different nanostructured samples using Small-Angle X-ray Scattering

Investigation of different nanostructured samples using Small-Angle X-ray Scattering

Eneli Monerjan & Armin Hoell