Information from EBSD maps
Quantitative data on microstructural properties of polycrystalline thin-film stacks (Cu(In,Ga)Se2 solar cell).
At scales ranging from the centimeter to nanometer levels, obtaining information on:
- Local orientations and integral film texture
- Grain-size distributions
- Grain-boundary types from misorientations
- Grain-boundary plane distributions
Correlation of this information with electrical and optoelectronic properties of extended structural defects at microscopic levels.