Information from EBSD maps

Quantitative data on microstructural properties of polycrystalline thin-film stacks (Cu(In,Ga)Se2 solar cell).

At scales ranging from the centimeter to nanometer levels, obtaining information on:

- Local orientations and integral film texture

- Grain-size distributions

- Grain-boundary types from misorientations

- Grain-boundary plane distributions

Correlation of this information with electrical and optoelectronic properties of extended structural defects at microscopic levels.